{"id":"https://openalex.org/W4285013947","doi":"https://doi.org/10.1109/prime55000.2022.9816760","title":"Interface Circuit for Low-Resistance Sensors Based on Noise Cancelling Technique","display_name":"Interface Circuit for Low-Resistance Sensors Based on Noise Cancelling Technique","publication_year":2022,"publication_date":"2022-06-12","ids":{"openalex":"https://openalex.org/W4285013947","doi":"https://doi.org/10.1109/prime55000.2022.9816760"},"language":"en","primary_location":{"id":"doi:10.1109/prime55000.2022.9816760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prime55000.2022.9816760","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075545823","display_name":"M. M. Abdevand","orcid":"https://orcid.org/0000-0002-2687-7594"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"M. M. Abdevand","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052172930","display_name":"D. Livornesi","orcid":"https://orcid.org/0000-0002-5030-8471"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Livornesi","raw_affiliation_strings":["STMicroelectronics,Analog and MEMS Group,Cornaredo,(MI),Italy","Analog and MEMS Group, STMicroelectronics, Cornaredo, (MI), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Analog and MEMS Group,Cornaredo,(MI),Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Analog and MEMS Group, STMicroelectronics, Cornaredo, (MI), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031912800","display_name":"A. E. Vergani","orcid":"https://orcid.org/0000-0002-3839-6739"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. E. Vergani","raw_affiliation_strings":["STMicroelectronics,Analog and MEMS Group,Cornaredo,(MI),Italy","Analog and MEMS Group, STMicroelectronics, Cornaredo, (MI), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Analog and MEMS Group,Cornaredo,(MI),Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"Analog and MEMS Group, STMicroelectronics, Cornaredo, (MI), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012770413","display_name":"P. Malcovati","orcid":"https://orcid.org/0000-0001-6514-9672"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Malcovati","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002715573","display_name":"Edoardo Bonizzoni","orcid":"https://orcid.org/0000-0002-8398-8506"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Bonizzoni","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5075545823"],"corresponding_institution_ids":["https://openalex.org/I25217355"],"apc_list":null,"apc_paid":null,"fwci":0.2763,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55150828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"61","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wheatstone-bridge","display_name":"Wheatstone bridge","score":0.8872965574264526},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6610268354415894},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6488232612609863},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5501896142959595},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5482814311981201},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4974196255207062},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.4849529564380646},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4799266457557678},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.46116015315055847},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4505388140678406},{"id":"https://openalex.org/keywords/y-factor","display_name":"Y-factor","score":0.4472530484199524},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.43165624141693115},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4068279266357422},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3418641686439514},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.3361199200153351},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2976483702659607},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.29251259565353394},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.26201027631759644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25027287006378174},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.14796289801597595},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11941993236541748}],"concepts":[{"id":"https://openalex.org/C104713690","wikidata":"https://www.wikidata.org/wiki/Q245133","display_name":"Wheatstone bridge","level":4,"score":0.8872965574264526},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6610268354415894},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6488232612609863},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5501896142959595},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5482814311981201},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4974196255207062},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.4849529564380646},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4799266457557678},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.46116015315055847},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4505388140678406},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.4472530484199524},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.43165624141693115},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4068279266357422},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3418641686439514},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.3361199200153351},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2976483702659607},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.29251259565353394},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.26201027631759644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25027287006378174},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.14796289801597595},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11941993236541748},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/prime55000.2022.9816760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prime55000.2022.9816760","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1990843671","https://openalex.org/W2735726187","https://openalex.org/W2917938926","https://openalex.org/W3011843299","https://openalex.org/W3014427319","https://openalex.org/W3127152245","https://openalex.org/W3205950106","https://openalex.org/W4206463869"],"related_works":["https://openalex.org/W4245335152","https://openalex.org/W2094320468","https://openalex.org/W26094903","https://openalex.org/W2168347882","https://openalex.org/W2131708976","https://openalex.org/W2602060748","https://openalex.org/W1620558978","https://openalex.org/W2575719298","https://openalex.org/W4206413680","https://openalex.org/W4364322693"],"abstract_inverted_index":{"A":[0],"resistive":[1],"sensor":[2,21],"is":[3,34],"conventionally":[4],"biased":[5],"by":[6],"a":[7,11,15,19,55,71,80],"voltage":[8],"divider":[9],"or":[10],"Wheatstone":[12],"bridge.":[13],"Applying":[14],"precise":[16],"bias":[17,57,76,93],"on":[18,54],"low-resistance":[20,51],"with":[22,59],"these":[23],"conventional":[24],"approaches,":[25],"however,":[26],"necessarily":[27],"requires":[28],"calibration":[29],"of":[30,74,91,104],"the":[31,75,92,96,102],"components,":[32],"which":[33,62,84],"time-consuming":[35],"and":[36],"costly":[37],"for":[38,50],"mass":[39],"production.":[40],"In":[41,68],"this":[42],"paper,":[43],"we":[44,78],"propose":[45],"an":[46],"analog":[47],"front-end":[48],"circuit":[49,58],"sensors,":[52],"based":[53],"closed-loop":[56],"high-impedance":[60],"output,":[61],"does":[63],"not":[64],"require":[65],"any":[66],"calibration.":[67],"addition,":[69],"after":[70],"comprehensive":[72],"analysis":[73],"noise,":[77],"introduce":[79],"noise":[81,94],"canceling":[82],"technique,":[83],"allows":[85],"more":[86],"than":[87],"25":[88],"dB":[89],"reduction":[90],"in":[95,101],"complete":[97],"interface":[98],"circuit,":[99],"even":[100],"presence":[103],"gain":[105],"mismatches":[106],"as":[107,109],"large":[108],"5%.":[110]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}