{"id":"https://openalex.org/W2146311933","doi":"https://doi.org/10.1109/prdc.2004.1276583","title":"Evaluation of fault-tolerant designs implemented on SRAM-based FPGAs","display_name":"Evaluation of fault-tolerant designs implemented on SRAM-based FPGAs","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2146311933","doi":"https://doi.org/10.1109/prdc.2004.1276583","mag":"2146311933"},"language":"en","primary_location":{"id":"doi:10.1109/prdc.2004.1276583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prdc.2004.1276583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE Pacific Rim International Symposium on Dependable Computing, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088069234","display_name":"Hossein Asadi","orcid":"https://orcid.org/0000-0002-0264-3865"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"G. Asadi","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Iran","Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065918596","display_name":"Seyed Ghassem Miremadi","orcid":"https://orcid.org/0000-0003-4347-4380"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"S.G. Miremadi","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Iran","Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000749075","display_name":"Hamid R. Zarandi","orcid":"https://orcid.org/0000-0003-1385-4171"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"H.R. Zarandi","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Iran","Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005928293","display_name":"Alireza Ejlali","orcid":"https://orcid.org/0000-0002-5661-3629"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"A. Ejlali","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Iran","Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5088069234"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":3.6208,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.93025284,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"17","issue":null,"first_page":"327","last_page":"332"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9061182737350464},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8200801610946655},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8046271800994873},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7640089988708496},{"id":"https://openalex.org/keywords/bitstream","display_name":"Bitstream","score":0.7218887805938721},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6828412413597107},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.645632803440094},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6444781422615051},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5899950265884399},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4874918460845947},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4210028648376465},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3397061228752136},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.32024866342544556},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.22343331575393677},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.20608431100845337},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18467989563941956},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1693444550037384},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.14619553089141846},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.07378092408180237}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9061182737350464},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8200801610946655},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8046271800994873},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7640089988708496},{"id":"https://openalex.org/C136695289","wikidata":"https://www.wikidata.org/wiki/Q415568","display_name":"Bitstream","level":3,"score":0.7218887805938721},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6828412413597107},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.645632803440094},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6444781422615051},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5899950265884399},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4874918460845947},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4210028648376465},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3397061228752136},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.32024866342544556},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.22343331575393677},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.20608431100845337},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18467989563941956},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1693444550037384},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.14619553089141846},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.07378092408180237},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/prdc.2004.1276583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prdc.2004.1276583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE Pacific Rim International Symposium on Dependable Computing, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W127379535","https://openalex.org/W337644979","https://openalex.org/W1504339380","https://openalex.org/W1527573830","https://openalex.org/W1541483005","https://openalex.org/W1912583643","https://openalex.org/W1916533169","https://openalex.org/W2098473740","https://openalex.org/W2098513789","https://openalex.org/W2101298207","https://openalex.org/W2116097016","https://openalex.org/W2120860555","https://openalex.org/W2124618076","https://openalex.org/W2137337804","https://openalex.org/W2137697489","https://openalex.org/W2149583371","https://openalex.org/W2159677757","https://openalex.org/W2162546785","https://openalex.org/W3006277082","https://openalex.org/W4235799760","https://openalex.org/W4256464439","https://openalex.org/W4285719527","https://openalex.org/W6605246039","https://openalex.org/W6611550588","https://openalex.org/W6630010957","https://openalex.org/W6631631897","https://openalex.org/W6774131779"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W1500230652","https://openalex.org/W627911969","https://openalex.org/W3208260600","https://openalex.org/W1553526993"],"abstract_inverted_index":{"The":[0,41,77],"technology":[1],"of":[2,31,86,97],"SRAM-based":[3,36],"devices":[4],"is":[5,45],"sensible":[6],"to":[7,72,83,89,93],"single":[8],"event":[9],"upsets":[10],"(SEUs)":[11],"that":[12,80],"may":[13],"be":[14],"induced":[15],"mainly":[16],"by":[17,47],"high":[18],"energy":[19],"heavy":[20],"ions":[21],"and":[22,65],"neutrons.":[23],"We":[24],"present":[25],"a":[26],"framework":[27],"for":[28],"the":[29,52,63,66,75,90,94,98],"evaluation":[30],"fault-tolerant":[32],"designs":[33],"implemented":[34],"on":[35],"FPGAs":[37],"using":[38,54],"emulated":[39,49],"SEUs.":[40],"SEU":[42],"injection":[43],"process":[44],"performed":[46],"inserting":[48],"SEUs":[50,87],"in":[51],"device":[53,91],"its":[55],"configuration":[56],"bitstream":[57],"file.":[58],"An":[59],"Altera":[60],"FPGA,":[61],"i.e.":[62],"Flex10K200,":[64],"ITC'99":[67],"benchmark":[68],"circuits":[69],"are":[70],"used":[71],"experimentally":[73],"evaluate":[74],"method.":[76],"results":[78],"show":[79],"between":[81],"32":[82],"45":[84],"percent":[85],"injected":[88],"propagate":[92],"output":[95],"terminals":[96],"device.":[99]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}