{"id":"https://openalex.org/W2979685650","doi":"https://doi.org/10.1109/patmos.2019.8862075","title":"A Calibration Procedure for Sensor Based Adaptive Voltage Scaling Approaches","display_name":"A Calibration Procedure for Sensor Based Adaptive Voltage Scaling Approaches","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2979685650","doi":"https://doi.org/10.1109/patmos.2019.8862075","mag":"2979685650"},"language":"en","primary_location":{"id":"doi:10.1109/patmos.2019.8862075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2019.8862075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 29th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019154355","display_name":"Christoph Niemann","orcid":"https://orcid.org/0000-0001-9371-1087"},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Christoph Niemann","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039365824","display_name":"Munawar Ali","orcid":null},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Munawar Ali","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046462274","display_name":"Jakob Heller","orcid":null},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jakob Heller","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103173327","display_name":"Dirk Timmermann","orcid":"https://orcid.org/0000-0001-9267-9695"},"institutions":[{"id":"https://openalex.org/I4665924","display_name":"University of Rostock","ror":"https://ror.org/03zdwsf69","country_code":"DE","type":"education","lineage":["https://openalex.org/I4665924"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dirk Timmermann","raw_affiliation_strings":["Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Microelectronics and Computer Engineering, University of Rostock, Rostock, Germany","institution_ids":["https://openalex.org/I4665924"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5019154355"],"corresponding_institution_ids":["https://openalex.org/I4665924"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.47032183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"33","issue":null,"first_page":"81","last_page":"86"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7222411036491394},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.6840216517448425},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5799891948699951},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5764679312705994},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.49816107749938965},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4236792325973511},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.4208764135837555},{"id":"https://openalex.org/keywords/data-flow-diagram","display_name":"Data flow diagram","score":0.4167138934135437},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38169345259666443},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.37712371349334717},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.360124409198761},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.34043294191360474},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33081334829330444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13220524787902832},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12339374423027039},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07904481887817383}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7222411036491394},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.6840216517448425},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5799891948699951},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5764679312705994},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.49816107749938965},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4236792325973511},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.4208764135837555},{"id":"https://openalex.org/C489000","wikidata":"https://www.wikidata.org/wiki/Q747385","display_name":"Data flow diagram","level":2,"score":0.4167138934135437},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38169345259666443},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.37712371349334717},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.360124409198761},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34043294191360474},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33081334829330444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13220524787902832},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12339374423027039},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07904481887817383},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/patmos.2019.8862075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2019.8862075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 29th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W566978853","https://openalex.org/W1976532354","https://openalex.org/W2098762322","https://openalex.org/W2114458110","https://openalex.org/W2146743319","https://openalex.org/W2168768336","https://openalex.org/W2289368293","https://openalex.org/W2289420272","https://openalex.org/W2769605138","https://openalex.org/W2793637056","https://openalex.org/W2905500442","https://openalex.org/W4236432903","https://openalex.org/W4248112633","https://openalex.org/W6676958804","https://openalex.org/W6684239207"],"related_works":["https://openalex.org/W4254637722","https://openalex.org/W2980401999","https://openalex.org/W4283025278","https://openalex.org/W3016483420","https://openalex.org/W1854591799","https://openalex.org/W2800543810","https://openalex.org/W2122674270","https://openalex.org/W1528221867","https://openalex.org/W1969049073","https://openalex.org/W4365793791"],"abstract_inverted_index":{"Nowadays,":[0],"VLSI":[1],"systems":[2],"suffer":[3],"from":[4],"increasing":[5],"impacts":[6],"of":[7,51,69,78,93,136],"aging":[8],"and":[9,99,124],"variability.":[10],"Traditionally,":[11],"this":[12,48,103],"is":[13,115],"treated":[14],"by":[15,49],"applying":[16],"extensive":[17],"guard":[18,22,34],"bands.":[19,35],"As":[20],"those":[21],"bands":[23],"are":[24,30,40],"chosen":[25],"at":[26],"design":[27],"time,":[28],"they":[29,39],"necessarily":[31],"worst":[32],"case":[33],"Thus,":[36],"most":[37],"often":[38],"too":[41],"pessimistic.":[42],"Current":[43],"research":[44],"tries":[45],"to":[46,75,106],"mitigate":[47],"means":[50],"in-situ":[52],"performance":[53],"measurement":[54],"based":[55],"Adaptive":[56],"Voltage":[57],"Scaling":[58],"(AVS).":[59],"AVS":[60],"typically":[61],"relies":[62],"on":[63,127],"assumptions":[64],"regarding":[65],"the":[66,70,76],"timing":[67],"behavior":[68,77],"application":[71,100],"logic":[72],"in":[73],"relation":[74],"a":[79,95],"specific":[80],"canary":[81],"or":[82],"sensor":[83],"logic.":[84],"Most":[85],"published":[86],"approaches":[87],"use":[88],"manually":[89],"gained":[90],"empirical":[91],"data":[92],"just":[94],"few":[96],"test":[97,125],"chips":[98],"designs":[101],"for":[102],"purpose.":[104],"However,":[105],"practically":[107],"apply":[108],"these":[109],"techniques,":[110],"an":[111,120,132],"automatic":[112],"calibration":[113,122],"flow":[114,123],"needed.":[116],"We":[117,130],"propose":[118],"such":[119],"automated":[121],"it":[126],"multiple":[128],"FPGAs.":[129],"achieve":[131],"average":[133],"power":[134],"saving":[135],"67%.":[137]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}