{"id":"https://openalex.org/W2892326188","doi":"https://doi.org/10.1109/patmos.2018.8464156","title":"Optical and Electrical Simulations of Radiation-Hard Photodiode in 0.35\u03bcM High-Voltage CMOS Technology","display_name":"Optical and Electrical Simulations of Radiation-Hard Photodiode in 0.35\u03bcM High-Voltage CMOS Technology","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2892326188","doi":"https://doi.org/10.1109/patmos.2018.8464156","mag":"2892326188"},"language":"en","primary_location":{"id":"doi:10.1109/patmos.2018.8464156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2018.8464156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://cds.cern.ch/record/2713621/files/PATMOS_paper_Filip_Segmanovic_final.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046689242","display_name":"Filip \u0160egmanovi\u0107","orcid":"https://orcid.org/0000-0001-8145-2727"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Filip Segmanovic","raw_affiliation_strings":["Device R&D ams AG Unterpremstatten, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device R&D ams AG Unterpremstatten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102817405","display_name":"Frederic Roger","orcid":"https://orcid.org/0000-0002-0746-3249"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Frederic Roger","raw_affiliation_strings":["Device R&D ams AG Unterpremstatten, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device R&D ams AG Unterpremstatten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046520353","display_name":"Gerald Meinhard","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Gerald Meinhard","raw_affiliation_strings":["Device R&D ams AG Unterpremstatten, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device R&D ams AG Unterpremstatten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084010995","display_name":"Ingrid Jonak-Auer","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Ingrid Jonak-Auer","raw_affiliation_strings":["Device R&D ams AG Unterpremstatten, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device R&D ams AG Unterpremstatten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061642935","display_name":"Tomislav Suligoj","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tomislav Suligoj","raw_affiliation_strings":["Device R&D ams AG Unterpremstatten, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device R&D ams AG Unterpremstatten, Austria","institution_ids":["https://openalex.org/I154481106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154481106"],"apc_list":null,"apc_paid":null,"fwci":0.3896,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49250913,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"57","issue":null,"first_page":"92","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.9215421676635742},{"id":"https://openalex.org/keywords/responsivity","display_name":"Responsivity","score":0.8374840021133423},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6379167437553406},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.6220643520355225},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.548809289932251},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.5115071535110474},{"id":"https://openalex.org/keywords/optical-radiation","display_name":"Optical radiation","score":0.4760420322418213},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.4748968183994293},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.467301607131958},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4218241572380066},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.41121017932891846},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3311305046081543},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.265000581741333}],"concepts":[{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.9215421676635742},{"id":"https://openalex.org/C178889773","wikidata":"https://www.wikidata.org/wiki/Q7316011","display_name":"Responsivity","level":3,"score":0.8374840021133423},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6379167437553406},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.6220643520355225},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.548809289932251},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.5115071535110474},{"id":"https://openalex.org/C113362759","wikidata":"https://www.wikidata.org/wiki/Q7098889","display_name":"Optical radiation","level":3,"score":0.4760420322418213},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.4748968183994293},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.467301607131958},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4218241572380066},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.41121017932891846},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3311305046081543},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.265000581741333},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/patmos.2018.8464156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2018.8464156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"},{"id":"pmh:oai:inspirehep.net:1784180","is_oa":true,"landing_page_url":"http://cds.cern.ch/record/2713621","pdf_url":"http://cds.cern.ch/record/2713621/files/PATMOS_paper_Filip_Segmanovic_final.pdf","source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null}],"best_oa_location":{"id":"pmh:oai:inspirehep.net:1784180","is_oa":true,"landing_page_url":"http://cds.cern.ch/record/2713621","pdf_url":"http://cds.cern.ch/record/2713621/files/PATMOS_paper_Filip_Segmanovic_final.pdf","source":{"id":"https://openalex.org/S4306402195","display_name":"CERN Document Server (European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":null},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6299999952316284}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332999","display_name":"Horizon 2020 Framework Programme","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320335254","display_name":"Horizon 2020","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2892326188.pdf","grobid_xml":"https://content.openalex.org/works/W2892326188.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1535492258","https://openalex.org/W1989009547","https://openalex.org/W2085728166","https://openalex.org/W2090180513","https://openalex.org/W2136958003","https://openalex.org/W2159519451","https://openalex.org/W2163017991","https://openalex.org/W2237644471","https://openalex.org/W2490765418","https://openalex.org/W2547127818","https://openalex.org/W4252741098","https://openalex.org/W6632089864","https://openalex.org/W6673137743","https://openalex.org/W6683351338","https://openalex.org/W7035634031"],"related_works":["https://openalex.org/W3134287205","https://openalex.org/W2103801052","https://openalex.org/W2157140816","https://openalex.org/W4307903441","https://openalex.org/W2117895811","https://openalex.org/W2014971480","https://openalex.org/W2103926977","https://openalex.org/W1541186055","https://openalex.org/W2088456955","https://openalex.org/W2752471724"],"abstract_inverted_index":{"Many":[0],"imaging":[1],"applications,":[2,7],"like":[3,48],"medical":[4],"or":[5,52],"space":[6],"require":[8],"radiation-hard":[9,32],"sensors.":[10],"Generally,":[11],"during":[12],"radiation,":[13],"many":[14],"different":[15,41],"defects":[16],"are":[17,79],"created,":[18],"depending":[19],"on":[20],"the":[21,24,38,53,57,64,67,84,91],"type":[22],"of":[23,30,40,66,83,90],"radiation.":[25],"With":[26],"TCAD":[27],"software,":[28],"cross-section":[29],"a":[31,60,72],"photodiode":[33,92],"was":[34,44],"simulated,":[35],"and":[36,81,87],"afterwards":[37],"impact":[39],"physical":[42,77],"parameters":[43,47,78],"simulated.":[45],"Physical":[46],"epitaxial":[49],"layer":[50],"thickness":[51],"trap":[54],"density":[55],"in":[56],"bulk,":[58],"play":[59],"huge":[61],"role":[62],"towards":[63],"responsivity":[65,86],"photodiode.":[68],"This":[69],"paper":[70],"presents":[71],"variation":[73],"experiment,":[74],"where":[75],"relevant":[76],"varied":[80],"analysis":[82],"spectral":[85],"dark":[88],"current":[89],"is":[93],"discussed.":[94]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}