{"id":"https://openalex.org/W2581508264","doi":"https://doi.org/10.1109/patmos.2016.7833422","title":"Multi-scale electrothermal simulation and modelling of resistive random access memory devices","display_name":"Multi-scale electrothermal simulation and modelling of resistive random access memory devices","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2581508264","doi":"https://doi.org/10.1109/patmos.2016.7833422","mag":"2581508264"},"language":"en","primary_location":{"id":"doi:10.1109/patmos.2016.7833422","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2016.7833422","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055868013","display_name":"Toufik Sadi","orcid":"https://orcid.org/0000-0003-1451-5163"},"institutions":[{"id":"https://openalex.org/I7882870","display_name":"University of Glasgow","ror":"https://ror.org/00vtgdb53","country_code":"GB","type":"education","lineage":["https://openalex.org/I7882870"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Toufik Sadi","raw_affiliation_strings":["School of Engineering, University of Glasgow, Glasgow, UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Glasgow, Glasgow, UK","institution_ids":["https://openalex.org/I7882870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100402262","display_name":"Liping Wang","orcid":"https://orcid.org/0000-0002-6412-266X"},"institutions":[{"id":"https://openalex.org/I4210118883","display_name":"Gold Standard Simulations (United Kingdom)","ror":"https://ror.org/02qaw7v88","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210118883"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Liping Wang","raw_affiliation_strings":["Gold Standard Simulations Ltd (now part of Synopsys), Glasgow, UK"],"affiliations":[{"raw_affiliation_string":"Gold Standard Simulations Ltd (now part of Synopsys), Glasgow, UK","institution_ids":["https://openalex.org/I4210118883"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016091223","display_name":"Asen Asenov","orcid":"https://orcid.org/0000-0002-9567-6366"},"institutions":[{"id":"https://openalex.org/I7882870","display_name":"University of Glasgow","ror":"https://ror.org/00vtgdb53","country_code":"GB","type":"education","lineage":["https://openalex.org/I7882870"]},{"id":"https://openalex.org/I4210118883","display_name":"Gold Standard Simulations (United Kingdom)","ror":"https://ror.org/02qaw7v88","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210118883"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Asen Asenov","raw_affiliation_strings":["Gold Standard Simulations Ltd (now part of Synopsys), Glasgow, UK","School of Engineering, University of Glasgow, Glasgow, UK"],"affiliations":[{"raw_affiliation_string":"Gold Standard Simulations Ltd (now part of Synopsys), Glasgow, UK","institution_ids":["https://openalex.org/I4210118883"]},{"raw_affiliation_string":"School of Engineering, University of Glasgow, Glasgow, UK","institution_ids":["https://openalex.org/I7882870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5055868013"],"corresponding_institution_ids":["https://openalex.org/I7882870"],"apc_list":null,"apc_paid":null,"fwci":0.56,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.73154104,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"107","issue":null,"first_page":"33","last_page":"37"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9158549308776855},{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.634510338306427},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.5773240923881531},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5772358775138855},{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.5110052824020386},{"id":"https://openalex.org/keywords/three-dimensional-integrated-circuit","display_name":"Three-dimensional integrated circuit","score":0.4899531900882721},{"id":"https://openalex.org/keywords/random-access","display_name":"Random access","score":0.4591822326183319},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.4457128345966339},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4261196255683899},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.41278141736984253},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37361401319503784},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.335254967212677},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.33373624086380005},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2997305393218994},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2943064570426941},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.26763448119163513},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2392929494380951},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.16201341152191162},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14659348130226135},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09513619542121887}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9158549308776855},{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.634510338306427},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.5773240923881531},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5772358775138855},{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.5110052824020386},{"id":"https://openalex.org/C59088047","wikidata":"https://www.wikidata.org/wiki/Q229370","display_name":"Three-dimensional integrated circuit","level":3,"score":0.4899531900882721},{"id":"https://openalex.org/C101722063","wikidata":"https://www.wikidata.org/wiki/Q218825","display_name":"Random access","level":2,"score":0.4591822326183319},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.4457128345966339},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4261196255683899},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.41278141736984253},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37361401319503784},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.335254967212677},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.33373624086380005},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2997305393218994},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2943064570426941},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.26763448119163513},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2392929494380951},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.16201341152191162},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14659348130226135},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09513619542121887},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/patmos.2016.7833422","is_oa":false,"landing_page_url":"https://doi.org/10.1109/patmos.2016.7833422","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.gla.ac.uk:138161","is_oa":false,"landing_page_url":"http://eprints.gla.ac.uk/138161/","pdf_url":null,"source":{"id":"https://openalex.org/S4210235606","display_name":"ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam)","issn_l":"2622-8912","issn":["2622-8912","2622-8920"],"is_oa":false,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"mag:2752588376","is_oa":false,"landing_page_url":"http://jglobal.jst.go.jp/en/public/20090422/201702236947713150","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5699999928474426}],"awards":[{"id":"https://openalex.org/G7185826813","display_name":null,"funder_award_id":"EP/K016776/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W57505794","https://openalex.org/W1596513647","https://openalex.org/W1654986713","https://openalex.org/W1862155492","https://openalex.org/W1912808619","https://openalex.org/W1977765713","https://openalex.org/W1979587945","https://openalex.org/W1998746609","https://openalex.org/W2015088745","https://openalex.org/W2016922062","https://openalex.org/W2030834420","https://openalex.org/W2032805392","https://openalex.org/W2038459401","https://openalex.org/W2045197688","https://openalex.org/W2061027089","https://openalex.org/W2064455533","https://openalex.org/W2071341304","https://openalex.org/W2086007999","https://openalex.org/W2094325813","https://openalex.org/W2108792250","https://openalex.org/W2112181056","https://openalex.org/W2132836196","https://openalex.org/W2148438235","https://openalex.org/W2162651880","https://openalex.org/W2322088411","https://openalex.org/W3103408907","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W3005999147","https://openalex.org/W3164474614","https://openalex.org/W2171130799","https://openalex.org/W2005875039","https://openalex.org/W3173413269","https://openalex.org/W2015477599","https://openalex.org/W2548135880","https://openalex.org/W2144085790","https://openalex.org/W3177379469","https://openalex.org/W1568378063"],"abstract_inverted_index":{"Resistive":[0],"random-access":[1],"memories":[2,43],"(RRAMs)":[3],"operate":[4],"with":[5,92,142],"low":[6,9],"power":[7],"dissipation,":[8],"cost-per-bit,":[10],"and":[11,14,41,47,84,107,127,155,163,176],"high":[12],"endurance,":[13],"are":[15],"suitable":[16],"for":[17,31,131],"integration":[18],"in":[19,22,62,75,123],"crossbar":[20],"arrays":[21],"3D":[23,137,184],"chips.":[24],"These":[25],"attributes":[26],"make":[27],"RRAM":[28,64,79],"devices":[29],"well-suited":[30],"a":[32,52],"variety":[33],"of":[34,55,152,173,183],"applications":[35],"ranging":[36],"from":[37],"novel":[38],"processor":[39],"architectures":[40],"high-density":[42],"to":[44,58,120,158,169,178,187],"neuromorphic":[45],"computing":[46],"neural":[48],"networks.":[49],"We":[50,66,112],"employ":[51],"unique":[53,85],"suite":[54],"simulation":[56],"tools":[57],"study":[59],"resistance":[60],"switching":[61,122,191],"oxide-based":[63],"structures.":[65],"use":[67],"Si-rich":[68],"silica":[69],"(SiOx)":[70],"RRAMs":[71,99],"as":[72],"an":[73,82,114],"example":[74],"this":[76],"study.":[77],"Silica-based":[78],"technology":[80],"provides":[81],"additional":[83],"advantage;":[86],"it":[87],"could":[88],"be":[89],"easily":[90],"integrated":[91],"silicon":[93],"microelectronics.":[94],"Existing":[95],"modeling":[96,110],"work":[97],"on":[98,103,180],"has":[100],"relied":[101],"heavily":[102],"classical":[104],"phenomenological":[105],"methods":[106],"two-dimensional":[108],"(2D)":[109],"tools.":[111],"apply":[113],"advanced":[115],"multi-scale":[116],"three-dimensional":[117],"(3D)":[118],"simulator":[119,138,166],"investigate":[121],"these":[124],"promising":[125],"devices,":[126],"highlight":[128],"their":[129],"potential":[130],"low-power":[132],"applications.":[133],"Our":[134],"physics-based":[135],"electrothermal":[136],"is":[139,167],"very":[140],"well-calibrated":[141],"experimental":[143],"data,":[144],"coupling":[145],"self-consistently":[146],"stochastic":[147],"kinetic":[148],"Monte":[149],"Carlo":[150],"descriptions":[151],"oxygen":[153],"ion":[154],"electron":[156],"transport,":[157],"the":[159,171,181,190],"local":[160],"electric":[161],"fields":[162],"temperature.":[164],"The":[165],"used":[168],"demonstrate":[170],"impact":[172],"self-heating":[174],"effects":[175],"also":[177],"emphasize":[179],"necessity":[182],"physical":[185],"modelling":[186],"predict":[188],"correctly":[189],"phenomenon.":[192]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}