{"id":"https://openalex.org/W2170655185","doi":"https://doi.org/10.1109/olt.2003.1214367","title":"An analog checker with input-relative tolerance for duplicate signals","display_name":"An analog checker with input-relative tolerance for duplicate signals","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W2170655185","doi":"https://doi.org/10.1109/olt.2003.1214367","mag":"2170655185"},"language":"en","primary_location":{"id":"doi:10.1109/olt.2003.1214367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2003.1214367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H.-G.D. Stratigopoulos","raw_affiliation_strings":["Electrical Engineering Department, Yale University, New Heaven, CT, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Makris","raw_affiliation_strings":["Electrical Engineering Department, Yale University, New Heaven, CT, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091734149"],"corresponding_institution_ids":["https://openalex.org/I32971472"],"apc_list":null,"apc_paid":null,"fwci":1.0532,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77932924,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"54","last_page":"58"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8003522157669067},{"id":"https://openalex.org/keywords/false-positive-paradox","display_name":"False positive paradox","score":0.694222092628479},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.46945828199386597},{"id":"https://openalex.org/keywords/contrast","display_name":"Contrast (vision)","score":0.4308062195777893},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35882312059402466},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2520885467529297}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8003522157669067},{"id":"https://openalex.org/C64869954","wikidata":"https://www.wikidata.org/wiki/Q1859747","display_name":"False positive paradox","level":2,"score":0.694222092628479},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.46945828199386597},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.4308062195777893},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35882312059402466},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2520885467529297},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/olt.2003.1214367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2003.1214367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1555400249","https://openalex.org/W1599946049","https://openalex.org/W1672697766","https://openalex.org/W1997902048","https://openalex.org/W2034604568","https://openalex.org/W2044868715","https://openalex.org/W2114380251","https://openalex.org/W2115946481","https://openalex.org/W2121844340","https://openalex.org/W2129748997","https://openalex.org/W2148018719","https://openalex.org/W2161134518","https://openalex.org/W6637304351"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1557094818","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2183246718","https://openalex.org/W2099261052","https://openalex.org/W3209204065","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109"],"abstract_inverted_index":{"We":[0,52],"discuss":[1],"the":[2,31,46,64,92,97],"design":[3],"of":[4,30,48,66,91],"a":[5,16,38,79],"novel":[6],"analog":[7],"checker":[8,33,57,99],"that":[9,35,41],"monitors":[10],"two":[11],"duplicate":[12],"signals":[13],"and":[14,70,113],"provides":[15],"digital":[17],"error":[18,62],"indication":[19],"when":[20,55,96],"their":[21],"absolute":[22],"difference":[23],"is":[24,34,42,58,73,100],"unacceptably":[25],"large.":[26],"The":[27],"key":[28],"feature":[29],"proposed":[32,98],"it":[36,106],"establishes":[37],"test":[39,81,104],"criterion":[40,82],"dynamically":[43],"adapted":[44],"to":[45,87],"magnitude":[47],"its":[49],"input":[50],"signals.":[51],"demonstrate":[53],"that,":[54],"this":[56],"utilized":[59],"in":[60,109],"concurrent":[61],"detection,":[63],"probability":[65],"both":[67,110],"false":[68,71],"negatives":[69],"positives":[72],"diminished.":[74],"In":[75],"contrast,":[76],"checkers":[77],"implementing":[78],"static":[80],"may":[83],"only":[84],"be":[85],"tuned":[86],"achieve":[88],"efficiently":[89],"one":[90],"aforementioned":[93],"objectives.":[94],"Likewise,":[95],"employed":[101],"for":[102],"off-line":[103],"purposes,":[105],"results":[107],"simultaneously":[108],"high":[111,114],"yield":[112],"fault":[115],"coverage.":[116]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}