{"id":"https://openalex.org/W2130922779","doi":"https://doi.org/10.1109/olt.2002.1030178","title":"Fault tolerance evaluation using two software based fault injection methods","display_name":"Fault tolerance evaluation using two software based fault injection methods","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2130922779","doi":"https://doi.org/10.1109/olt.2002.1030178","mag":"2130922779"},"language":"en","primary_location":{"id":"doi:10.1109/olt.2002.1030178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2002.1030178","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001793958","display_name":"Astrit Ademaj","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"A. Ademaj","raw_affiliation_strings":["Real-Time Systems Group, University of Technology, Vienna, Vienna, Austria","[Real-Time Syst. Group, Vienna Univ. of Technol., Austria]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Real-Time Systems Group, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"[Real-Time Syst. Group, Vienna Univ. of Technol., Austria]","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069398109","display_name":"P. Grillinger","orcid":null},"institutions":[{"id":"https://openalex.org/I92715842","display_name":"University of West Bohemia in Pilsen","ror":"https://ror.org/040t43x18","country_code":"CZ","type":"education","lineage":["https://openalex.org/I92715842"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"P. Grillinger","raw_affiliation_strings":["Department of Computer Science, University of West Bohemia, Pilsen, Czech Republic","Dept. of Comput. Sci., Univ. of West Bohemia, Pilsen, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of West Bohemia, Pilsen, Czech Republic","institution_ids":["https://openalex.org/I92715842"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Univ. of West Bohemia, Pilsen, Czech Republic","institution_ids":["https://openalex.org/I92715842"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085614225","display_name":"Pavel Herout","orcid":null},"institutions":[{"id":"https://openalex.org/I92715842","display_name":"University of West Bohemia in Pilsen","ror":"https://ror.org/040t43x18","country_code":"CZ","type":"education","lineage":["https://openalex.org/I92715842"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"P. Herout","raw_affiliation_strings":["Department of Computer Science, University of West Bohemia, Pilsen, Czech Republic","Dept. of Comput. Sci., Univ. of West Bohemia, Pilsen, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of West Bohemia, Pilsen, Czech Republic","institution_ids":["https://openalex.org/I92715842"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Univ. of West Bohemia, Pilsen, Czech Republic","institution_ids":["https://openalex.org/I92715842"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048999829","display_name":"J. Hlavi\u010dka","orcid":null},"institutions":[{"id":"https://openalex.org/I44504214","display_name":"Czech Technical University in Prague","ror":"https://ror.org/03kqpb082","country_code":"CZ","type":"education","lineage":["https://openalex.org/I44504214"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"J. Hlavicka","raw_affiliation_strings":["Department of Computer Science, Czech Technical University, Prague, Czech Republic","Dept of Computer Science, Czech Technical Univ, Prague, Czech Republic#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Czech Technical University, Prague, Czech Republic","institution_ids":["https://openalex.org/I44504214"]},{"raw_affiliation_string":"Dept of Computer Science, Czech Technical Univ, Prague, Czech Republic#TAB#","institution_ids":["https://openalex.org/I44504214"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4799,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.89464302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"21","last_page":"25"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.9365770816802979},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7271326780319214},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6495134830474854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6150977611541748},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5649446249008179},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.550687849521637},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5258867144584656},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.497710257768631},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.49157819151878357},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49099257588386536},{"id":"https://openalex.org/keywords/protocol","display_name":"Protocol (science)","score":0.4711562395095825},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36076170206069946},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.310844361782074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20901209115982056},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.15155348181724548},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12514519691467285},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.10137230157852173},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06464537978172302}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.9365770816802979},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7271326780319214},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6495134830474854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6150977611541748},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5649446249008179},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.550687849521637},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5258867144584656},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.497710257768631},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.49157819151878357},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49099257588386536},{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.4711562395095825},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36076170206069946},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.310844361782074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20901209115982056},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.15155348181724548},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12514519691467285},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10137230157852173},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06464537978172302},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/olt.2002.1030178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/olt.2002.1030178","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1488202922","https://openalex.org/W2048379626","https://openalex.org/W2079267582","https://openalex.org/W2124164102","https://openalex.org/W2146275793","https://openalex.org/W2230218160","https://openalex.org/W2503643606","https://openalex.org/W6689200484"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W2185394135","https://openalex.org/W2121043529","https://openalex.org/W2082366402","https://openalex.org/W2742111403","https://openalex.org/W2083209667","https://openalex.org/W2355966237","https://openalex.org/W2032374522"],"abstract_inverted_index":{"A":[0],"silicon":[1],"independent":[2],"C-Based":[3],"model":[4,18,38,73,96],"of":[5,29,39,47,63,79,130,135,145],"the":[6,12,22,36,40,45,50,54,60,64,71,76,80,91,94,100,105,117,133,136,146],"TTP/C":[7,41,81],"protocol":[8,42],"was":[9,139],"implemented":[10,66],"within":[11],"EU-founded":[13],"project":[14],"FIT.":[15],"The":[16,26,121],"C-based":[17],"is":[19,32],"integrated":[20],"in":[21,44,49,70,75,89],"C-Sim":[23],"simulation":[24,37,72,95],"environment.":[25],"main":[27],"objective":[28],"this":[30],"work":[31],"to":[33,141],"verify":[34],"whether":[35],"behaves":[43],"presence":[46],"faults":[48],"same":[51,101,106],"way":[52],"as":[53],"existing":[55],"hardware":[56,77,92,142],"prototype":[57],"implementation.":[58],"Thus,":[59],"experimental":[61],"results":[62,138],"software":[65],"fault":[67,107,114,118],"injection":[68,87,108,112,119],"applied":[69],"and":[74,93,104,116],"implementation":[78,144],"network":[82],"have":[83],"been":[84],"compared.":[85],"Fault":[86],"experiments":[88],"both":[90],"are":[97],"performed":[98],"using":[99],"configuration":[102],"setup,":[103],"input":[109],"parameters":[110],"(fault":[111],"location,":[113],"type":[115],"time).":[120],"end":[122],"result":[123],"comparison":[124],"has":[125],"shown":[126],"a":[127],"complete":[128],"conformance":[129],"96.30%,":[131],"while":[132],"cause":[134],"different":[137],"due":[140],"specific":[143],"built-in-self-test":[147],"error":[148],"detection":[149],"mechanisms.":[150]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}