{"id":"https://openalex.org/W7156323917","doi":"https://doi.org/10.1109/ojcas.2026.3670665","title":"9.4 \u03bc W 285 Samples/s Capacitance to Digital Converter for Large Area Active EWOD Arrays in Thin-Film Transistor Technology","display_name":"9.4 \u03bc W 285 Samples/s Capacitance to Digital Converter for Large Area Active EWOD Arrays in Thin-Film Transistor Technology","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7156323917","doi":"https://doi.org/10.1109/ojcas.2026.3670665"},"language":"en","primary_location":{"id":"doi:10.1109/ojcas.2026.3670665","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2026.3670665","pdf_url":null,"source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/ojcas.2026.3670665","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060655304","display_name":"Mauricio Velazquez Lopez","orcid":"https://orcid.org/0000-0002-5271-9434"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Mauricio Velazquez Lopez","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":"https://orcid.org/0000-0002-5271-9434","affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5123958465","display_name":"Nikolas Papadopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nikolas Papadopoulos","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":"https://orcid.org/0000-0001-7584-6009","affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104189371","display_name":"Fran\u00e7ois Berghmans","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Francois Berghmans","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044710002","display_name":"Kris Myny","orcid":"https://orcid.org/0000-0002-5230-495X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kris Myny","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":"https://orcid.org/0000-0002-5230-495X","affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.32660083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"7","issue":null,"first_page":"173","last_page":"183"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.7369999885559082,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.7369999885559082,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.07190000265836716,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.024399999529123306,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5952000021934509},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5062999725341797},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.3765999972820282},{"id":"https://openalex.org/keywords/static-induction-transistor","display_name":"Static induction transistor","score":0.3537999987602234},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.3434000015258789}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5952000021934509},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5728999972343445},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5062999725341797},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4952000081539154},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46619999408721924},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38359999656677246},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.3765999972820282},{"id":"https://openalex.org/C158470141","wikidata":"https://www.wikidata.org/wiki/Q7604169","display_name":"Static induction transistor","level":5,"score":0.3537999987602234},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.3434000015258789},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.30630001425743103},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2685999870300293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.257099986076355}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/ojcas.2026.3670665","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2026.3670665","pdf_url":null,"source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/787305","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/787305","pdf_url":null,"source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE Open Journal of Circuits and Systems, vol. 7, (173-183)","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:a18f82597a814bd2ae3e2b0686e40555","is_oa":true,"landing_page_url":"https://doaj.org/article/a18f82597a814bd2ae3e2b0686e40555","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Open Journal of Circuits and Systems, Vol 7, Pp 173-183 (2026)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/ojcas.2026.3670665","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2026.3670665","pdf_url":null,"source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7645519375801086}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1833587907","https://openalex.org/W1974168856","https://openalex.org/W1987919377","https://openalex.org/W2066568075","https://openalex.org/W2067873275","https://openalex.org/W2086187432","https://openalex.org/W2605362217","https://openalex.org/W2780756707","https://openalex.org/W2782650274","https://openalex.org/W2804812090","https://openalex.org/W3040782824","https://openalex.org/W3098600211","https://openalex.org/W3116323930","https://openalex.org/W3134434932","https://openalex.org/W3165489059","https://openalex.org/W3186521441","https://openalex.org/W4280488898","https://openalex.org/W4282968836","https://openalex.org/W4283687485","https://openalex.org/W4319320267","https://openalex.org/W4360930721","https://openalex.org/W4366247953","https://openalex.org/W4392202382","https://openalex.org/W4392206127","https://openalex.org/W4393188114","https://openalex.org/W4396242925","https://openalex.org/W4400943845","https://openalex.org/W4411724769"],"related_works":[],"abstract_inverted_index":{"This":[0],"work":[1],"introduces":[2],"a":[3,98,106,121,140],"low-power,":[4],"linear-in-log":[5],"capacitance":[6,37,46,79,83],"sensing":[7],"circuit":[8,68,91],"tailored":[9],"for":[10],"large-area":[11],"electrowetting-on-dielectric":[12],"(EWOD)":[13],"arrays":[14],"utilizing":[15],"thin-film":[16],"transistor":[17],"(TFT)":[18],"technology.":[19,156],"By":[20],"leveraging":[21],"the":[22,27,29,43,55,67,95,118,151],"intrinsic":[23],"time":[24],"constants":[25],"of":[26],"circuit,":[28],"proposed":[30],"approach":[31],"achieves":[32],"enhanced":[33],"sensitivity":[34,145],"at":[35,105],"low":[36],"levels,":[38,80],"effectively":[39],"addressing":[40],"scenarios":[41],"where":[42],"EWOD":[44],"electrode":[45],"is":[47],"on":[48],"par":[49],"with":[50,131],"parasitic":[51],"capacitances":[52],"present":[53],"in":[54,143,154],"system.":[56],"Fabricated":[57],"using":[58],"a$4.5~\\mu":[59],"$m":[60],"Low":[61],"Temperature":[62],"Polysilicon":[63],"(LTPS)":[64],"TFT":[65,155],"process,":[66],"demonstrates":[69],"up":[70],"to":[71,75,150],"6-bit":[72],"resolution,":[73,144],"corresponding":[74],"63":[76],"distinct":[77],"measured":[78],"and":[81,114,146],"measures":[82],"variations":[84],"as":[85,87],"small":[86],"61.3":[88],"fF.":[89],"Two":[90],"variants":[92],"are":[93],"presented:":[94],"first,":[96],"employing":[97],"one-transistor\u2013one-resistor":[99],"(1T1R)":[100],"input":[101,125],"stage,":[102,126],"which":[103],"operates":[104],"peak/mean":[107],"power":[108,147],"consumption":[109],"of$16~\\mu":[110],"$W":[111,113,128,130],"/$3.0~\\mu":[112],"occupies$324\\times":[115],"324~\\mu":[116],"$m2;":[117],"second,":[119],"incorporating":[120],"current":[122,152],"mirror":[123],"(CM)":[124],"consumes$35~\\mu":[127],"/$9.4~\\mu":[129],"an":[132],"area":[133],"of$317\\times":[134],"506~\\mu":[135],"$m2.":[136],"Both":[137],"implementations":[138],"mark":[139],"significant":[141],"improvement":[142],"efficiency":[148],"compared":[149],"state-of-the-art":[153]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2026-04-28T00:00:00"}