{"id":"https://openalex.org/W3048848133","doi":"https://doi.org/10.1109/ojcas.2020.3016017","title":"Deterministic Noise Analysis for Single-Stage Amplifiers by Extension of Indefinite Admittance Matrix","display_name":"Deterministic Noise Analysis for Single-Stage Amplifiers by Extension of Indefinite Admittance Matrix","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3048848133","doi":"https://doi.org/10.1109/ojcas.2020.3016017","mag":"3048848133"},"language":"en","primary_location":{"id":"doi:10.1109/ojcas.2020.3016017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2020.3016017","pdf_url":"https://ieeexplore.ieee.org/ielx7/8784029/8816702/09165788.pdf","source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/8784029/8816702/09165788.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086212713","display_name":"Vijender Kumar Sharma","orcid":"https://orcid.org/0000-0001-6375-0237"},"institutions":[{"id":"https://openalex.org/I9579091","display_name":"Indian Institute of Technology Mandi","ror":"https://ror.org/05r9r2f34","country_code":"IN","type":"education","lineage":["https://openalex.org/I9579091"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vijender Kumar Sharma","raw_affiliation_strings":["School of Computing and Electrical Engineering, Indian Institute of Technology Mandi, Mandi, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing and Electrical Engineering, Indian Institute of Technology Mandi, Mandi, India","institution_ids":["https://openalex.org/I9579091"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083364512","display_name":"Jai Narayan Tripathi","orcid":"https://orcid.org/0000-0001-9109-2948"},"institutions":[{"id":"https://openalex.org/I154549908","display_name":"Indian Institute of Technology Jodhpur","ror":"https://ror.org/03yacj906","country_code":"IN","type":"education","lineage":["https://openalex.org/I154549908"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jai Narayan Tripathi","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Jodhpur, Jodhpur, India"],"raw_orcid":"https://orcid.org/0000-0001-9109-2948","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Jodhpur, Jodhpur, India","institution_ids":["https://openalex.org/I154549908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070274082","display_name":"Hitesh Shrimali","orcid":"https://orcid.org/0000-0003-2776-1005"},"institutions":[{"id":"https://openalex.org/I9579091","display_name":"Indian Institute of Technology Mandi","ror":"https://ror.org/05r9r2f34","country_code":"IN","type":"education","lineage":["https://openalex.org/I9579091"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hitesh Shrimali","raw_affiliation_strings":["School of Computing and Electrical Engineering, Indian Institute of Technology Mandi, Mandi, India"],"raw_orcid":"https://orcid.org/0000-0003-2776-1005","affiliations":[{"raw_affiliation_string":"School of Computing and Electrical Engineering, Indian Institute of Technology Mandi, Mandi, India","institution_ids":["https://openalex.org/I9579091"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1750,"currency":"USD","value_usd":1750},"apc_paid":{"value":1750,"currency":"USD","value_usd":1750},"fwci":0.5047,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64106884,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"124","last_page":"139"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.8179696798324585},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.7400308847427368},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5856193900108337},{"id":"https://openalex.org/keywords/stage","display_name":"Stage (stratigraphy)","score":0.5781199932098389},{"id":"https://openalex.org/keywords/admittance-parameters","display_name":"Admittance parameters","score":0.5670726299285889},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.4996645450592041},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4560428261756897},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3753853142261505},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3609420955181122},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34926044940948486},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3451932370662689},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2655622959136963},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24724796414375305},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.23346123099327087},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.17312461137771606},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.14645510911941528},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07650566101074219},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07177266478538513},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.06392088532447815}],"concepts":[{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.8179696798324585},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.7400308847427368},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5856193900108337},{"id":"https://openalex.org/C146357865","wikidata":"https://www.wikidata.org/wiki/Q1123245","display_name":"Stage (stratigraphy)","level":2,"score":0.5781199932098389},{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.5670726299285889},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.4996645450592041},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4560428261756897},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3753853142261505},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3609420955181122},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34926044940948486},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3451932370662689},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2655622959136963},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24724796414375305},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.23346123099327087},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.17312461137771606},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.14645510911941528},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07650566101074219},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07177266478538513},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.06392088532447815},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ojcas.2020.3016017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2020.3016017","pdf_url":"https://ieeexplore.ieee.org/ielx7/8784029/8816702/09165788.pdf","source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:de5d4cf4c92240a69038db8ee0779ec5","is_oa":true,"landing_page_url":"https://doaj.org/article/de5d4cf4c92240a69038db8ee0779ec5","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Open Journal of Circuits and Systems, Vol 1, Pp 124-139 (2020)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/ojcas.2020.3016017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ojcas.2020.3016017","pdf_url":"https://ieeexplore.ieee.org/ielx7/8784029/8816702/09165788.pdf","source":{"id":"https://openalex.org/S4210192473","display_name":"IEEE Open Journal of Circuits and Systems","issn_l":"2644-1225","issn":["2644-1225"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Open Journal of Circuits and Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1049622166","display_name":null,"funder_award_id":"MEITY-PHD-1120","funder_id":"https://openalex.org/F4320325255","funder_display_name":"Ministry of Electronics and Information technology"},{"id":"https://openalex.org/G6636233220","display_name":null,"funder_award_id":"IITM/DIC-YFRF/HS/243","funder_id":"https://openalex.org/F4320325255","funder_display_name":"Ministry of Electronics and Information technology"},{"id":"https://openalex.org/G8844396719","display_name":null,"funder_award_id":"IITM/DeitY-MLA/ASO/93","funder_id":"https://openalex.org/F4320325255","funder_display_name":"Ministry of Electronics and Information technology"}],"funders":[{"id":"https://openalex.org/F4320321071","display_name":"Department of Electronics and Information Technology, Ministry of Communications and Information Technology","ror":"https://ror.org/02z31cn83"},{"id":"https://openalex.org/F4320322211","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49"},{"id":"https://openalex.org/F4320325255","display_name":"Ministry of Electronics and Information technology","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3048848133.pdf","grobid_xml":"https://content.openalex.org/works/W3048848133.grobid-xml"},"referenced_works_count":67,"referenced_works":["https://openalex.org/W135277111","https://openalex.org/W1525626016","https://openalex.org/W1712574918","https://openalex.org/W1960185979","https://openalex.org/W1980995849","https://openalex.org/W1987137801","https://openalex.org/W2003175917","https://openalex.org/W2010210731","https://openalex.org/W2010696803","https://openalex.org/W2017507966","https://openalex.org/W2023831114","https://openalex.org/W2034498767","https://openalex.org/W2048514579","https://openalex.org/W2056509764","https://openalex.org/W2060800001","https://openalex.org/W2067189296","https://openalex.org/W2080514786","https://openalex.org/W2084237314","https://openalex.org/W2084465386","https://openalex.org/W2086629796","https://openalex.org/W2088788514","https://openalex.org/W2095114068","https://openalex.org/W2097913753","https://openalex.org/W2100997047","https://openalex.org/W2101723010","https://openalex.org/W2102124566","https://openalex.org/W2110836823","https://openalex.org/W2112369634","https://openalex.org/W2116739712","https://openalex.org/W2117377214","https://openalex.org/W2124032024","https://openalex.org/W2131104173","https://openalex.org/W2134173566","https://openalex.org/W2137548125","https://openalex.org/W2139030761","https://openalex.org/W2140896444","https://openalex.org/W2156323558","https://openalex.org/W2156803169","https://openalex.org/W2160055399","https://openalex.org/W2161277239","https://openalex.org/W2162861151","https://openalex.org/W2164540960","https://openalex.org/W2166289080","https://openalex.org/W2248038145","https://openalex.org/W2476833035","https://openalex.org/W2491825829","https://openalex.org/W2587567940","https://openalex.org/W2629157711","https://openalex.org/W2756692278","https://openalex.org/W2895676248","https://openalex.org/W2897955682","https://openalex.org/W2910611566","https://openalex.org/W2912968289","https://openalex.org/W2921617861","https://openalex.org/W2942072122","https://openalex.org/W2942538519","https://openalex.org/W2943018702","https://openalex.org/W2948735543","https://openalex.org/W2965358847","https://openalex.org/W2966610610","https://openalex.org/W3003878850","https://openalex.org/W3146574664","https://openalex.org/W4244196098","https://openalex.org/W4246538414","https://openalex.org/W4301201207","https://openalex.org/W6672842986","https://openalex.org/W6845822818"],"related_works":["https://openalex.org/W2563111511","https://openalex.org/W2913402129","https://openalex.org/W2161728531","https://openalex.org/W2044195815","https://openalex.org/W2057151759","https://openalex.org/W2368309484","https://openalex.org/W2066729819","https://openalex.org/W2460740512","https://openalex.org/W2163540231","https://openalex.org/W2049226255"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"two":[3,122],"methods,":[4],"the":[5,13,17,28,45,51,54,75,97,103,132,138,143,150],"block":[6],"approach":[7],"indefinite":[8,29],"admittance":[9,30],"matrix":[10],"(BA-IAM)":[11],"and":[12,58,68,87,90,94,114],"estimation-by-inspection,":[14],"to":[15,37,73,172],"analyse":[16],"effects":[18],"of":[19,53,78,109],"deterministic":[20],"noise":[21,60],"on":[22],"single-stage,":[23],"single-ended":[24],"amplifiers":[25],"by":[26,137],"extending":[27],"matrix.":[31],"The":[32,117,165],"proposed":[33,98,166],"methods":[34,99,106,123,167],"are":[35,71,100],"used":[36,47],"develop":[38],"a":[39],"generalised":[40],"two-port":[41],"network":[42],"analysis":[43],"for":[44,148],"commonly":[46],"amplifier":[48],"topologies,":[49],"in":[50,107,153],"presence":[52],"supply,":[55],"ground,":[56],"bulk,":[57],"input":[59],"sources.":[61],"Various":[62],"illustrative":[63],"case":[64],"studies":[65],"(common-source,":[66],"common-gate,":[67],"push-pull":[69],"amplifiers)":[70],"considered":[72],"validate":[74],"analytical":[76],"method":[77],"different":[79],"CMOS":[80,154],"technology":[81],"nodes":[82],"(180":[83],"nm,":[84,86],"110":[85],"28":[88],"nm)":[89],"foundries":[91],"(Lfoundry,":[92],"UMC,":[93],"TSMC).":[95],"Both":[96],"compared":[101,130],"with":[102,131,162],"relevant":[104],"existing":[105],"terms":[108],"mean":[110],"percentage":[111],"error":[112],"(MPE),":[113],"computational":[115],"complexity.":[116],"mathematically":[118],"derived":[119],"expressions":[120],"using":[121],"show":[124,159],"less":[125],"than":[126],"4%":[127],"MPE":[128],"when":[129],"schematic":[133,163],"simulation":[134],"results,":[135],"obtained":[136],"SPICE":[139],"based":[140],"simulations.":[141,164],"Also,":[142],"post-layout":[144],"simulations":[145],"(PLS)":[146],"results":[147],"all":[149],"examples":[151],"(designed":[152],"180":[155],"nm":[156],"Lfoundry":[157],"technology)":[158],"excellent":[160],"matching":[161],"can":[168],"be":[169],"further":[170],"applicable":[171],"antennas,":[173],"complex":[174],"circuits,":[175,177],"digital":[176],"etc.":[178]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}