{"id":"https://openalex.org/W2773120953","doi":"https://doi.org/10.1109/nvmts.2017.8171308","title":"Measuring and analyzing Random Telegraph Noise in Nanoscale Devices: The case of resistive random access memories","display_name":"Measuring and analyzing Random Telegraph Noise in Nanoscale Devices: The case of resistive random access memories","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2773120953","doi":"https://doi.org/10.1109/nvmts.2017.8171308","mag":"2773120953"},"language":"en","primary_location":{"id":"doi:10.1109/nvmts.2017.8171308","is_oa":false,"landing_page_url":"http://doi.org/10.1109/nvmts.2017.8171308","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 17th Non-Volatile Memory Technology Symposium (NVMTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11380/1175096","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021479723","display_name":"Francesco Maria Puglisi","orcid":"https://orcid.org/0000-0001-6178-2614"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Francesco Maria Puglisi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5021479723"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2815,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60468669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"14","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8415265083312988},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6912291646003723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6156719923019409},{"id":"https://openalex.org/keywords/random-access","display_name":"Random access","score":0.5067811608314514},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4805748462677002},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4515879452228546},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44411173462867737},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.43277260661125183},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.4141787886619568},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3302960991859436},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2172035276889801},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20105311274528503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20036554336547852},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.1639522910118103},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09520995616912842}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8415265083312988},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6912291646003723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6156719923019409},{"id":"https://openalex.org/C101722063","wikidata":"https://www.wikidata.org/wiki/Q218825","display_name":"Random access","level":2,"score":0.5067811608314514},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4805748462677002},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4515879452228546},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44411173462867737},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.43277260661125183},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.4141787886619568},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3302960991859436},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2172035276889801},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20105311274528503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20036554336547852},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.1639522910118103},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09520995616912842},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/nvmts.2017.8171308","is_oa":false,"landing_page_url":"http://doi.org/10.1109/nvmts.2017.8171308","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 17th Non-Volatile Memory Technology Symposium (NVMTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1175096","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/1175096","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1175096","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/1175096","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"score":0.4000000059604645,"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1542981317","https://openalex.org/W1571862906","https://openalex.org/W1578516737","https://openalex.org/W1848422164","https://openalex.org/W1852090592","https://openalex.org/W1971000062","https://openalex.org/W1977765713","https://openalex.org/W1989057700","https://openalex.org/W1998422519","https://openalex.org/W2001309624","https://openalex.org/W2008147998","https://openalex.org/W2015936244","https://openalex.org/W2016926674","https://openalex.org/W2018332778","https://openalex.org/W2021090162","https://openalex.org/W2022946938","https://openalex.org/W2025516544","https://openalex.org/W2035374584","https://openalex.org/W2036656598","https://openalex.org/W2039426183","https://openalex.org/W2044941608","https://openalex.org/W2051209243","https://openalex.org/W2058204393","https://openalex.org/W2069415920","https://openalex.org/W2077030723","https://openalex.org/W2077665252","https://openalex.org/W2087747543","https://openalex.org/W2091718101","https://openalex.org/W2092493067","https://openalex.org/W2094634280","https://openalex.org/W2105408739","https://openalex.org/W2121425010","https://openalex.org/W2157180100","https://openalex.org/W2163026485","https://openalex.org/W2171805054","https://openalex.org/W2315149045","https://openalex.org/W2345292896","https://openalex.org/W2420237597","https://openalex.org/W2421397265","https://openalex.org/W2466567749","https://openalex.org/W2499103029","https://openalex.org/W2527328379","https://openalex.org/W2533013863","https://openalex.org/W2538381921","https://openalex.org/W2558809659","https://openalex.org/W2583597941","https://openalex.org/W3203992401","https://openalex.org/W6638837933","https://openalex.org/W6644946621","https://openalex.org/W6656594533"],"related_works":["https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W4396815615","https://openalex.org/W3161624601","https://openalex.org/W2078381924","https://openalex.org/W4206468571","https://openalex.org/W2199653281"],"abstract_inverted_index":{"In":[0],"this":[1,124],"paper,":[2],"we":[3,56],"discuss":[4,57],"some":[5],"of":[6,85,91,118],"the":[7,86,101,105,115,119],"measurement":[8,44],"and":[9,29,49,64],"analysis":[10,36,47,90],"techniques":[11,66],"for":[12],"Random":[13],"Telegraph":[14],"Noise":[15],"(RTN).":[16],"Due":[17],"to":[18,59,67,80,104],"its":[19],"detrimental":[20],"impact":[21],"on":[22],"devices,":[23],"RTN":[24,35,62,92,107],"mechanism":[25,102],"must":[26],"be":[27],"investigated":[28],"integrated":[30],"into":[31],"device":[32],"models.":[33],"However,":[34],"requires":[37],"a":[38],"self-consistent":[39],"framework":[40],"in":[41,94,109,123],"which":[42,77],"automated":[43],"techniques,":[45],"data":[46,70],"procedures,":[48],"physics-based":[50],"modeling":[51],"are":[52],"blended":[53],"together.":[54],"Here":[55],"guidelines":[58],"perform":[60,68],"corrrect":[61],"measurements,":[63],"statistical":[65,89],"advanced":[69],"analysis.":[71],"This":[72],"allows":[73,99],"getting":[74],"reliable":[75],"results,":[76],"can":[78],"lead":[79],"an":[81],"unbiased":[82],"physical":[83,116],"interpretation":[84],"phenomenon.":[87,125],"The":[88],"measured":[93],"hafnium":[95],"oxide":[96],"RRAM":[97],"devices":[98],"revealing":[100],"leading":[103],"wide":[106],"fluctuations":[108],"high-resistive":[110],"state,":[111],"as":[112,114],"well":[113],"properties":[117],"defect":[120],"species":[121],"involved":[122]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}