{"id":"https://openalex.org/W2343971715","doi":"https://doi.org/10.1109/nvmts.2015.7457431","title":"Nonvolatile radiation hardened DICE latch","display_name":"Nonvolatile radiation hardened DICE latch","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W2343971715","doi":"https://doi.org/10.1109/nvmts.2015.7457431","mag":"2343971715"},"language":"en","primary_location":{"id":"doi:10.1109/nvmts.2015.7457431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nvmts.2015.7457431","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 15th Non-Volatile Memory Technology Symposium (NVMTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071453704","display_name":"Tingting Pang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tingting Pang","raw_affiliation_strings":["Spintronics Interdisciplinary Center, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Spintronics Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100381646","display_name":"Wang Kang","orcid":"https://orcid.org/0000-0002-3169-6034"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Kang","raw_affiliation_strings":["School of Computer Science and Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101773796","display_name":"Ran Yi","orcid":"https://orcid.org/0000-0002-2512-1066"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Ran","raw_affiliation_strings":["Spintronics Interdisciplinary Center, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Spintronics Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018693228","display_name":"Youguang Zhang","orcid":"https://orcid.org/0009-0008-0928-4210"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youguang Zhang","raw_affiliation_strings":["Spintronics Interdisciplinary Center, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Spintronics Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109299440","display_name":"Weifeng Lv","orcid":"https://orcid.org/0000-0002-7061-9509"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weifeng Lv","raw_affiliation_strings":["School of Computer Science and Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100381646","display_name":"Wang Kang","orcid":"https://orcid.org/0000-0002-3169-6034"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Spintronics Interdisciplinary Center, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Spintronics Interdisciplinary Center, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5071453704"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.2008,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.625171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"6","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dice","display_name":"Dice","score":0.9289330244064331},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.6512530446052551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5413737893104553},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4745943248271942},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46459364891052246},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.4435347616672516},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.44338271021842957},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4412805438041687},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43311840295791626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.323405385017395},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.31713271141052246},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23276421427726746},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2044430673122406},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10069787502288818},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09086176753044128}],"concepts":[{"id":"https://openalex.org/C22029948","wikidata":"https://www.wikidata.org/wiki/Q45089","display_name":"Dice","level":2,"score":0.9289330244064331},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.6512530446052551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5413737893104553},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4745943248271942},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46459364891052246},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.4435347616672516},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.44338271021842957},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4412805438041687},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43311840295791626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.323405385017395},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31713271141052246},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23276421427726746},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2044430673122406},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10069787502288818},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09086176753044128},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nvmts.2015.7457431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nvmts.2015.7457431","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 15th Non-Volatile Memory Technology Symposium (NVMTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1980433502","https://openalex.org/W1985330137","https://openalex.org/W1985478976","https://openalex.org/W1988431200","https://openalex.org/W2003243790","https://openalex.org/W2025173691","https://openalex.org/W2031539925","https://openalex.org/W2050431855","https://openalex.org/W2083945164","https://openalex.org/W2089244748","https://openalex.org/W2105401464","https://openalex.org/W2110276925","https://openalex.org/W2134327605","https://openalex.org/W2138111642","https://openalex.org/W2141068710","https://openalex.org/W2156728623","https://openalex.org/W2219963777","https://openalex.org/W2318838415","https://openalex.org/W6683132901"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2123934961","https://openalex.org/W2765704306","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W2086616086","https://openalex.org/W1490775144","https://openalex.org/W2099245758","https://openalex.org/W2100150400"],"abstract_inverted_index":{"Spintronic-based":[0],"integrated":[1],"circuits":[2,36],"have":[3],"been":[4,94],"widely":[5],"considered":[6],"as":[7,69,114],"potential":[8,165],"candidates":[9],"for":[10,96,166,172],"space":[11],"application,":[12],"due":[13],"to":[14,29,40,45,59,66,120,135,192],"the":[15,87,129,160,194,199],"fact":[16],"that":[17],"their":[18,33],"core":[19],"devices":[20],"(e.g.":[21],"magnetic":[22,155],"tunnel":[23,156],"junction,":[24],"MTJ)":[25],"are":[26,37,57,83,190],"intrinsic":[27],"insensitive":[28],"radiation":[30,41,49,97],"effects.":[31,42],"However,":[32],"CMOS":[34],"peripheral":[35],"still":[38],"vulnerable":[39],"In":[43,127,142],"order":[44],"solve":[46],"this":[47,143],"problem,":[48],"hardening":[50,98],"techniques":[51],"(by":[52],"process":[53,64],"or":[54],"by":[55,63,78,152],"design)":[56],"supposed":[58],"be":[60,67,132],"developed.":[61],"Hardening":[62],"turns":[65],"impractical,":[68],"it":[70,111,115],"is":[71,102,112],"relatively":[72,103],"expensive":[73],"and":[74,183,196],"inefficient,":[75],"whereas":[76],"solutions":[77],"design":[79,181],"at":[80],"circuit":[81],"level":[82],"currently":[84],"preferred.":[85],"Specifically,":[86],"dual":[88,118],"interlocked":[89],"storage":[90],"cell":[91],"(DICE)":[92],"has":[93],"proposed":[95,200],"design.":[99],"The":[100],"DICE":[101,130,149],"robust":[104],"against":[105,168],"single":[106],"event":[107],"upset":[108],"(SEU),":[109],"but":[110],"power-inefficiency":[113],"uses":[116],"a":[117,147,184],"structure":[119],"store":[121],"only":[122],"one":[123],"bit":[124],"of":[125,198],"data.":[126],"addition,":[128],"should":[131],"always":[133],"power-on":[134],"retain":[136],"data,":[137],"consuming":[138],"much":[139],"static":[140],"power.":[141],"paper,":[144],"we":[145],"propose":[146],"nonvolatile":[148],"latch":[150],"(NV-DICE),":[151],"integrating":[153],"two":[154],"junctions":[157],"(MTJs)":[158],"into":[159],"cell,":[161],"which":[162],"exhibits":[163],"great":[164],"protecting":[167],"SEU":[169],"with":[170],"nonvolatility":[171],"low":[173],"power":[174],"consumption.":[175],"By":[176],"utilizing":[177],"STMicroelectronics":[178],"40":[179],"nm":[180],"kit":[182],"compact":[185],"MTJ":[186],"model,":[187],"hybrid":[188],"simulations":[189],"performed":[191],"demonstrate":[193],"functionality":[195],"performance":[197],"NV-DICE.":[201]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-05-21T09:19:25.381259","created_date":"2025-10-10T00:00:00"}