{"id":"https://openalex.org/W2077143820","doi":"https://doi.org/10.1109/norchp.2012.6403144","title":"An accurate fault location method based on configuration bitstream analysis","display_name":"An accurate fault location method based on configuration bitstream analysis","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2077143820","doi":"https://doi.org/10.1109/norchp.2012.6403144","mag":"2077143820"},"language":"en","primary_location":{"id":"doi:10.1109/norchp.2012.6403144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/norchp.2012.6403144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"NORCHIP 2012","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Zhou Jing","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhou Jing","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Liu Zengrong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Zengrong","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chen Lei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Lei","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101750084","display_name":"Shuo Wang","orcid":"https://orcid.org/0009-0001-0768-7920"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Shuo","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103636162","display_name":"Zhiping Wen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen Zhiping","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chen Xun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Xun","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114357299","display_name":"Qi Chang","orcid":"https://orcid.org/0009-0009-1009-6425"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Chang","raw_affiliation_strings":["FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","FPGA Department, Beijing Microelectronics Technology Institution, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"FPGA Department, Beijing Microelectronics Technology Institution, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210089056"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8468557000160217},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7666174173355103},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6742509603500366},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.671693742275238},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6601864695549011},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6598383188247681},{"id":"https://openalex.org/keywords/bitstream","display_name":"Bitstream","score":0.5882180333137512},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5464989542961121},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45832574367523193},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.40355607867240906},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.28260648250579834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20101067423820496},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12873998284339905},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.10303092002868652},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.06873342394828796},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0632978081703186}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8468557000160217},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7666174173355103},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6742509603500366},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.671693742275238},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6601864695549011},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6598383188247681},{"id":"https://openalex.org/C136695289","wikidata":"https://www.wikidata.org/wiki/Q415568","display_name":"Bitstream","level":3,"score":0.5882180333137512},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5464989542961121},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45832574367523193},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.40355607867240906},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.28260648250579834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20101067423820496},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12873998284339905},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.10303092002868652},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.06873342394828796},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0632978081703186},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/norchp.2012.6403144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/norchp.2012.6403144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"NORCHIP 2012","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2114503349","https://openalex.org/W2131221147","https://openalex.org/W2139165387","https://openalex.org/W2142654748","https://openalex.org/W6679591603","https://openalex.org/W6680768249"],"related_works":["https://openalex.org/W4319430423","https://openalex.org/W4390224957","https://openalex.org/W4323831234","https://openalex.org/W2544043553","https://openalex.org/W2121309702","https://openalex.org/W1982685694","https://openalex.org/W49599899","https://openalex.org/W4311839959","https://openalex.org/W3217774925","https://openalex.org/W2040087757"],"abstract_inverted_index":{"As":[0,34],"SRAM-based":[1],"FPGAs":[2,142],"are":[3,8,88],"increasingly":[4],"being":[5],"used;":[6],"there":[7],"more":[9,11],"and":[10,57,132,136],"researches":[12],"on":[13,79],"the":[14,21,54,58,91,96,106,113,127,133,139],"SEU":[15,47,55,130],"effects":[16,22,56,131],"of":[17,23,27,53,102,129,141],"FPGA.":[18],"To":[19],"emulate":[20],"SEUs,":[24],"a":[25,61],"variety":[26],"fault":[28,35,64,92],"injection":[29,36,93],"techniques":[30],"have":[31],"been":[32],"studied.":[33],"process":[37],"is":[38,67,82],"black":[39],"box":[40],"testing":[41],"method,":[42],"it":[43],"helps":[44],"little":[45],"to":[46,84,105],"mechanism":[48],"study.":[49],"For":[50],"further":[51],"study":[52,128],"mitigation":[59,134],"techniques,":[60,135],"novel":[62],"accurate":[63],"location":[65,101,116],"method":[66,81],"studied":[68],"in":[69,95],"this":[70,80,123],"paper.":[71],"The":[72,99],"Accurate":[73],"Fault":[74],"Location":[75],"System":[76],"(AFLS)":[77],"based":[78],"developed":[83],"locate":[85],"faults,":[86],"which":[87],"detected":[89],"by":[90,111],"system,":[94],"FPGA":[97,118],"resources.":[98],"precise":[100],"resource":[103,119],"corresponding":[104],"faults":[107],"will":[108,125],"be":[109],"obtained":[110],"converting":[112],"configuration":[114],"bit":[115],"into":[117],"physical":[120],"location.":[121],"Using":[122],"system":[124],"help":[126],"then":[137],"encourage":[138],"utilization":[140],"for":[143],"space-based":[144],"applications.":[145]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}