{"id":"https://openalex.org/W2067021544","doi":"https://doi.org/10.1109/norchip.2014.7004730","title":"An new approach to reliable FSRs lDesign","display_name":"An new approach to reliable FSRs lDesign","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2067021544","doi":"https://doi.org/10.1109/norchip.2014.7004730","mag":"2067021544"},"language":"en","primary_location":{"id":"doi:10.1109/norchip.2014.7004730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/norchip.2014.7004730","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 NORCHIP","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101445285","display_name":"Ming Liu","orcid":"https://orcid.org/0000-0002-8872-2854"},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Ming Liu","raw_affiliation_strings":["School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden","[School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden","institution_ids":["https://openalex.org/I86987016"]},{"raw_affiliation_string":"[School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden]","institution_ids":["https://openalex.org/I86987016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011438358","display_name":"Elena Dubrova","orcid":"https://orcid.org/0000-0001-7382-9408"},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Elena Dubrova","raw_affiliation_strings":["School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden","[School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden","institution_ids":["https://openalex.org/I86987016"]},{"raw_affiliation_string":"[School of Information and Communication Technology, Royal Institute of Technology (KTH), Stockholm, Sweden]","institution_ids":["https://openalex.org/I86987016"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I86987016"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6410109996795654},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6335444450378418},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5008628368377686},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4713843762874603},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4704781174659729},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4462939202785492},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.43413305282592773},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.4338584840297699},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4261767566204071},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42469555139541626},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3565278649330139},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3558026850223541},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.2692548632621765},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2597053647041321},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.20448166131973267},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.18691271543502808},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.172944575548172}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6410109996795654},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6335444450378418},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5008628368377686},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4713843762874603},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4704781174659729},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4462939202785492},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.43413305282592773},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.4338584840297699},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4261767566204071},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42469555139541626},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3565278649330139},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3558026850223541},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.2692548632621765},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2597053647041321},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.20448166131973267},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.18691271543502808},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.172944575548172},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/norchip.2014.7004730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/norchip.2014.7004730","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 NORCHIP","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4099999964237213,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2015233893","https://openalex.org/W2033346530","https://openalex.org/W2040555723","https://openalex.org/W2048776886","https://openalex.org/W2120034842","https://openalex.org/W2120185818","https://openalex.org/W2132098696","https://openalex.org/W2141060521","https://openalex.org/W2151961246","https://openalex.org/W2169213530","https://openalex.org/W2234313581","https://openalex.org/W4253091331","https://openalex.org/W6689462833"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2603119174","https://openalex.org/W3206195470","https://openalex.org/W2491217195","https://openalex.org/W2046926633","https://openalex.org/W2164971790"],"abstract_inverted_index":{"Since":[0],"the":[1,8,17,27,33,40,66,73,116,120],"invention":[2],"of":[3,11,13,20,22,36,42,48,65,69,75,119],"integrated":[4],"circuits":[5],"in":[6,30,61,90],"1950s,":[7],"great":[9],"budget":[10],"reliability":[12],"semiconductors":[14],"have":[15],"prompted":[16],"60":[18],"years":[19],"glory":[21],"electrical":[23],"industry.":[24],"However,":[25],"as":[26,54],"technology":[28],"shrinks":[29],"recent":[31],"years,":[32],"continuing":[34],"rising":[35],"circuit":[37,76],"density":[38],"and":[39,51,58,98],"reduction":[41,74],"device":[43],"sizes":[44],"cause":[45],"a":[46,83],"lot":[47],"new":[49,84],"constrains":[50],"problems,":[52],"such":[53],"high":[55],"power":[56],"consumption":[57],"leakage":[59],"currents":[60],"nano-meter":[62],"designs.":[63],"One":[64],"serious":[67],"consequences":[68],"these":[70],"changes":[71],"is":[72,104,123],"reliability.":[77],"In":[78],"this":[79],"paper,":[80],"we":[81],"introduce":[82],"method":[85,103],"for":[86,112,131],"correcting":[87],"transient":[88],"faults":[89],"Feedback":[91],"Shift":[92],"Registers":[93],"(FSRs)":[94],"based":[95],"on":[96],"duplication":[97],"parity":[99],"checking.":[100],"The":[101,125],"presented":[102,126],"more":[105],"reliable":[106],"than":[107],"Triple":[108],"Model":[109],"Redundancy":[110],"(TMR)":[111],"large":[113,134],"FSRs,":[114,135],"while":[115],"area":[117],"overhead":[118],"two":[121],"approaches":[122],"comparable.":[124],"approach":[127],"might":[128],"be":[129],"important":[130],"applications":[132],"using":[133],"e.g.":[136],"cryptography.":[137]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}