{"id":"https://openalex.org/W4238294798","doi":"https://doi.org/10.1109/nocs.2018.8512162","title":"Abetting Planned Obsolescence by Aging 3D Networks-on-Chip","display_name":"Abetting Planned Obsolescence by Aging 3D Networks-on-Chip","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W4238294798","doi":"https://doi.org/10.1109/nocs.2018.8512162"},"language":"en","primary_location":{"id":"doi:10.1109/nocs.2018.8512162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nocs.2018.8512162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Twelfth IEEE/ACM International Symposium on Networks-on-Chip (NOCS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100657679","display_name":"Sourav Das","orcid":"https://orcid.org/0000-0002-7404-8133"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sourav Das","raw_affiliation_strings":["School of EECS, Washington State University, Pullman, WA"],"affiliations":[{"raw_affiliation_string":"School of EECS, Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066320524","display_name":"Kanad Basu","orcid":"https://orcid.org/0000-0002-6431-7512"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kanad Basu","raw_affiliation_strings":["Department of ECE, New York University, Brooklyn, NY"],"affiliations":[{"raw_affiliation_string":"Department of ECE, New York University, Brooklyn, NY","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055445718","display_name":"Janardhan Rao Doppa","orcid":"https://orcid.org/0000-0002-3848-5301"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janardhan Rao Doppa","raw_affiliation_strings":["School of EECS, Washington State University, Pullman, WA"],"affiliations":[{"raw_affiliation_string":"School of EECS, Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078441163","display_name":"Partha Pratim Pande","orcid":"https://orcid.org/0000-0002-5930-8531"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Partha Pratim Pande","raw_affiliation_strings":["School of EECS, Washington State University, Pullman, WA"],"affiliations":[{"raw_affiliation_string":"School of EECS, Washington State University, Pullman, WA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059648257","display_name":"Ramesh Karri","orcid":"https://orcid.org/0000-0001-7989-5617"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Karri","raw_affiliation_strings":["Department of ECE, New York University, Brooklyn, NY"],"affiliations":[{"raw_affiliation_string":"Department of ECE, New York University, Brooklyn, NY","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of ECE, Duke University, Durham, NC"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100657679"],"corresponding_institution_ids":["https://openalex.org/I72951846"],"apc_list":null,"apc_paid":null,"fwci":1.78693003,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.83119423,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/original-equipment-manufacturer","display_name":"Original equipment manufacturer","score":0.7480833530426025},{"id":"https://openalex.org/keywords/obsolescence","display_name":"Obsolescence","score":0.6739698052406311},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6517627835273743},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6054099798202515},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5190063714981079},{"id":"https://openalex.org/keywords/overheating","display_name":"Overheating (electricity)","score":0.4938562512397766},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4255439341068268},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3880539834499359},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.27307283878326416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18422845005989075},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14953511953353882},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.137180358171463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11256885528564453}],"concepts":[{"id":"https://openalex.org/C68694590","wikidata":"https://www.wikidata.org/wiki/Q267558","display_name":"Original equipment manufacturer","level":2,"score":0.7480833530426025},{"id":"https://openalex.org/C30795975","wikidata":"https://www.wikidata.org/wiki/Q282744","display_name":"Obsolescence","level":2,"score":0.6739698052406311},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6517627835273743},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6054099798202515},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5190063714981079},{"id":"https://openalex.org/C2778284599","wikidata":"https://www.wikidata.org/wiki/Q25340000","display_name":"Overheating (electricity)","level":2,"score":0.4938562512397766},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4255439341068268},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3880539834499359},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.27307283878326416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18422845005989075},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14953511953353882},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.137180358171463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11256885528564453},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nocs.2018.8512162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nocs.2018.8512162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Twelfth IEEE/ACM International Symposium on Networks-on-Chip (NOCS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W35708471","https://openalex.org/W1487438029","https://openalex.org/W1998011536","https://openalex.org/W2013415268","https://openalex.org/W2015917466","https://openalex.org/W2025718175","https://openalex.org/W2026891388","https://openalex.org/W2061739602","https://openalex.org/W2071691160","https://openalex.org/W2083314129","https://openalex.org/W2099746875","https://openalex.org/W2099917528","https://openalex.org/W2104114347","https://openalex.org/W2106075707","https://openalex.org/W2112836034","https://openalex.org/W2122757690","https://openalex.org/W2123489707","https://openalex.org/W2133292006","https://openalex.org/W2140855716","https://openalex.org/W2145198096","https://openalex.org/W2154517054","https://openalex.org/W2161998562","https://openalex.org/W2170333286","https://openalex.org/W2170509098","https://openalex.org/W2396345169","https://openalex.org/W2507246620","https://openalex.org/W2530446454","https://openalex.org/W2613841645","https://openalex.org/W2620004233","https://openalex.org/W2963565222","https://openalex.org/W4238549726","https://openalex.org/W4247267706","https://openalex.org/W6629196096"],"related_works":["https://openalex.org/W4285293690","https://openalex.org/W3124382960","https://openalex.org/W1590264876","https://openalex.org/W1570681957","https://openalex.org/W3131858951","https://openalex.org/W2090970427","https://openalex.org/W3125496616","https://openalex.org/W2787744881","https://openalex.org/W3125372081","https://openalex.org/W2018755015"],"abstract_inverted_index":{"We":[0,48,73],"set":[1],"up":[2],"a":[3,29,81,91],"security":[4],"analysis":[5],"framework":[6],"by":[7,16,104],"aging":[8],"the":[9,17,25,40,44,68,99,102,108],"Network-on-Chip":[10],"(NoC)":[11],"to":[12,42,46,56,70,90],"study":[13],"planned":[14],"obsolescence":[15,34],"original":[18],"equipment":[19],"manufacturer":[20],"(OEM).":[21],"An":[22],"NoC":[23,41,69,103],"is":[24],"communication":[26],"backbone":[27],"in":[28,39,63,67,111],"manycore":[30],"System-on-Chip":[31],"(SoC).":[32],"Planned":[33],"may":[35],"adopt":[36],"any":[37],"vulnerability":[38],"cause":[43],"SoC":[45],"fail.":[47],"show":[49],"how":[50],"an":[51],"OEM":[52],"can":[53,97],"craft":[54],"workloads":[55,77],"generate":[57],"electromigration-induced":[58],"stress":[59],"and":[60,78],"crosstalk":[61],"noise":[62],"TSV-based":[64],"vertical":[65,95],"links":[66,96],"hasten":[71],"failure.":[72],"analyzed":[74],"three":[75],"malicious":[76],"confirm":[79],"that":[80,84],"crafted":[82],"workload":[83],"injects":[85],"3-10%":[86],"more":[87],"traffic":[88],"on":[89],"few":[92],"selected":[93],"critical":[94],"shorten":[98],"lifetime":[100],"of":[101],"11%-25%":[105],"averaged":[106],"over":[107],"benchmarks":[109],"considered":[110],"this":[112],"work.":[113]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}