{"id":"https://openalex.org/W4402572455","doi":"https://doi.org/10.1109/newcas58973.2024.10666369","title":"Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests","display_name":"Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests","publication_year":2024,"publication_date":"2024-06-16","ids":{"openalex":"https://openalex.org/W4402572455","doi":"https://doi.org/10.1109/newcas58973.2024.10666369"},"language":"en","primary_location":{"id":"doi:10.1109/newcas58973.2024.10666369","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas58973.2024.10666369","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.univ-grenoble-alpes.fr/hal-04734831v1/file/2024-NEWCAS_2.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011968474","display_name":"Olivier Occello","orcid":null},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"O. Occello","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048794392","display_name":"M. Margalef-Rovira","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Margalef-Rovira","raw_affiliation_strings":["TR&D, STMicroelectronics,Crolles,France"],"affiliations":[{"raw_affiliation_string":"TR&D, STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085204712","display_name":"Manuel J. Barrag\u00e1n","orcid":"https://orcid.org/0000-0003-0187-604X"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Barragan","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081645961","display_name":"C. Durand","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Durand","raw_affiliation_strings":["TR&D, STMicroelectronics,Crolles,France"],"affiliations":[{"raw_affiliation_string":"TR&D, STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107287940","display_name":"Ayman Rhellab","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]},{"id":"https://openalex.org/I7454413","display_name":"\u00c9cole Centrale de Lille","ror":"https://ror.org/01x441g73","country_code":"FR","type":"education","lineage":["https://openalex.org/I7454413"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Rhellab","raw_affiliation_strings":["Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520"],"affiliations":[{"raw_affiliation_string":"Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I7454413","https://openalex.org/I1294671590","https://openalex.org/I4210123471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044650603","display_name":"Lo\u0131\u0308c Vincent","orcid":"https://orcid.org/0000-0001-6340-9645"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087336","display_name":"Centre Interuniversitaire de MicroElectronique et Nanotechnologies","ror":"https://ror.org/000tdrn36","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I4210087336","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Vincent","raw_affiliation_strings":["Univ. Grenoble Alpes, Grenoble INP, CIME Nanotech,Grenoble,France,38000"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, Grenoble INP, CIME Nanotech,Grenoble,France,38000","institution_ids":["https://openalex.org/I4210087336","https://openalex.org/I899635006","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013651772","display_name":"Jordan Corsi","orcid":"https://orcid.org/0000-0003-1840-7506"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. Corsi","raw_affiliation_strings":["TR&D, STMicroelectronics,Crolles,France"],"affiliations":[{"raw_affiliation_string":"TR&D, STMicroelectronics,Crolles,France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106430211","display_name":"Sylvie L\u00e9pilliet","orcid":null},"institutions":[{"id":"https://openalex.org/I7454413","display_name":"\u00c9cole Centrale de Lille","ror":"https://ror.org/01x441g73","country_code":"FR","type":"education","lineage":["https://openalex.org/I7454413"]},{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Lepilliet","raw_affiliation_strings":["Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520"],"affiliations":[{"raw_affiliation_string":"Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I7454413","https://openalex.org/I1294671590","https://openalex.org/I4210123471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002629568","display_name":"G. Ducournau","orcid":null},"institutions":[{"id":"https://openalex.org/I7454413","display_name":"\u00c9cole Centrale de Lille","ror":"https://ror.org/01x441g73","country_code":"FR","type":"education","lineage":["https://openalex.org/I7454413"]},{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]},{"id":"https://openalex.org/I4210124567","display_name":"Teem Photonics (France)","ror":"https://ror.org/02t80dd48","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210124567"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Ducournau","raw_affiliation_strings":["Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520","PHOTONIQUE THZ - IEMN - Photonique THz - IEMN (Groupe Photonique THz - IEMN UMR8520 - (Terahertz Photonics) - France)"],"affiliations":[{"raw_affiliation_string":"Univ. Lille, CNRS, Centrale Lille, UMR,IEMN,France,8520","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I7454413","https://openalex.org/I1294671590","https://openalex.org/I4210123471"]},{"raw_affiliation_string":"PHOTONIQUE THZ - IEMN - Photonique THz - IEMN (Groupe Photonique THz - IEMN UMR8520 - (Terahertz Photonics) - France)","institution_ids":["https://openalex.org/I4210124567","https://openalex.org/I4210123471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026379358","display_name":"Philippe Ferrari","orcid":"https://orcid.org/0000-0002-2803-4830"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Ferrari","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,38000","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5011968474"],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13164469,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"79","last_page":"83"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6279077529907227},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6217324733734131},{"id":"https://openalex.org/keywords/wafer-testing","display_name":"Wafer testing","score":0.5600736141204834},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.48999252915382385},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4835048019886017},{"id":"https://openalex.org/keywords/zero","display_name":"Zero (linguistics)","score":0.4734753370285034},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43906915187835693},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4386562705039978},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4269496202468872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4029451608657837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3731732964515686},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3270137906074524},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26419687271118164}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6279077529907227},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6217324733734131},{"id":"https://openalex.org/C44445679","wikidata":"https://www.wikidata.org/wiki/Q2538844","display_name":"Wafer testing","level":3,"score":0.5600736141204834},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.48999252915382385},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4835048019886017},{"id":"https://openalex.org/C2780813799","wikidata":"https://www.wikidata.org/wiki/Q3274237","display_name":"Zero (linguistics)","level":2,"score":0.4734753370285034},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43906915187835693},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4386562705039978},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4269496202468872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4029451608657837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3731732964515686},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3270137906074524},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26419687271118164},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/newcas58973.2024.10666369","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas58973.2024.10666369","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-04734831v1","is_oa":true,"landing_page_url":"https://hal.univ-grenoble-alpes.fr/hal-04734831","pdf_url":"https://hal.univ-grenoble-alpes.fr/hal-04734831v1/file/2024-NEWCAS_2.pdf","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun 2024, Sherbrooke, Canada. pp.79 - 83, ⟨10.1109/newcas58973.2024.10666369⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-04734831v1","is_oa":true,"landing_page_url":"https://hal.univ-grenoble-alpes.fr/hal-04734831","pdf_url":"https://hal.univ-grenoble-alpes.fr/hal-04734831v1/file/2024-NEWCAS_2.pdf","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun 2024, Sherbrooke, Canada. pp.79 - 83, ⟨10.1109/newcas58973.2024.10666369⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4402572455.pdf","grobid_xml":"https://content.openalex.org/works/W4402572455.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W1977771380","https://openalex.org/W1988733033","https://openalex.org/W2075890078","https://openalex.org/W2082540249","https://openalex.org/W2098549513","https://openalex.org/W2136491990","https://openalex.org/W2365984593","https://openalex.org/W2807039547","https://openalex.org/W3024800269","https://openalex.org/W3038743613","https://openalex.org/W3100128535","https://openalex.org/W4387717479"],"related_works":["https://openalex.org/W2112424816","https://openalex.org/W2054845823","https://openalex.org/W2540312267","https://openalex.org/W2070188681","https://openalex.org/W2367528910","https://openalex.org/W2156694894","https://openalex.org/W2031579205","https://openalex.org/W4229506424","https://openalex.org/W2593225652","https://openalex.org/W2032885366"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,58,64,71],"nonintrusive":[4],"integrated":[5,18,38],"test":[6,53],"methodology":[7],"based":[8],"on":[9,70],"machine":[10],"learning":[11],"for":[12,83],"predicting":[13,84],"the":[14,40,78,81,85,90],"performance":[15],"of":[16,23,73,80,89],"millimeter-wave":[17],"circuits":[19],"solely":[20],"from":[21,92],"measurements":[22],"Parametric":[24,93],"Test":[25,94],"sensor":[26],"signatures":[27,95],"(quasi-static":[28],"and":[29,37,46,50,87,103],"automated":[30],"wafer-level":[31],"measurements).":[32],"These":[33],"sensors":[34],"are":[35,47],"designed":[36],"by":[39],"foundry":[41],"to":[42,57],"monitor":[43],"process":[44],"variations":[45],"inherently":[48],"non-intrusive":[49],"generic.":[51],"The":[52],"method":[54,82],"was":[55],"applied":[56],"25":[59],"GHz":[60],"Low-Noise":[61],"Amplifier":[62],"in":[63],"55-nm":[65],"BiCMOS":[66],"technology.":[67],"Experimental":[68],"results":[69],"set":[72],"57":[74],"fabricated":[75],"devices":[76],"demonstrate":[77],"ability":[79],"gain":[86],"NF":[88],"LNA":[91],"with":[96],"an":[97],"RMS":[98],"error":[99],"below":[100],"0.07":[101],"dB":[102],"0.014":[104],"dB,":[105],"respectively.":[106]},"counts_by_year":[],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}