{"id":"https://openalex.org/W2742340127","doi":"https://doi.org/10.1109/newcas.2017.8010180","title":"A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor","display_name":"A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor","publication_year":2017,"publication_date":"2017-06-01","ids":{"openalex":"https://openalex.org/W2742340127","doi":"https://doi.org/10.1109/newcas.2017.8010180","mag":"2742340127"},"language":"en","primary_location":{"id":"doi:10.1109/newcas.2017.8010180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas.2017.8010180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/1801.03449","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028836492","display_name":"Swaraj Bandhu Mahato","orcid":"https://orcid.org/0000-0002-1677-6474"},"institutions":[{"id":"https://openalex.org/I4210121240","display_name":"Institute of Astronomy","ror":"https://ror.org/01whksa54","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210121240"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Swaraj Mahato","raw_affiliation_strings":["Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium","institution_ids":["https://openalex.org/I4210121240"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112082116","display_name":"J De Ridder","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121240","display_name":"Institute of Astronomy","ror":"https://ror.org/01whksa54","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210121240"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"J. De Ridder","raw_affiliation_strings":["Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium","institution_ids":["https://openalex.org/I4210121240"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035134691","display_name":"Guy Meynants","orcid":"https://orcid.org/0000-0001-5167-8151"},"institutions":[{"id":"https://openalex.org/I4210092681","display_name":"Antwerp Management School","ror":"https://ror.org/00hm4a331","country_code":"BE","type":"education","lineage":["https://openalex.org/I149213910","https://openalex.org/I4210092681"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Guy Meynants","raw_affiliation_strings":["AMS, Coveliersstraat 15, Antwerpen, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AMS, Coveliersstraat 15, Antwerpen, Belgium","institution_ids":["https://openalex.org/I4210092681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019676955","display_name":"Gert Raskin","orcid":"https://orcid.org/0000-0002-1323-9788"},"institutions":[{"id":"https://openalex.org/I4210121240","display_name":"Institute of Astronomy","ror":"https://ror.org/01whksa54","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210121240"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Gert Raskin","raw_affiliation_strings":["Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Astronomy, Celestijnenlaan 200D, Leuven, Belgium","institution_ids":["https://openalex.org/I4210121240"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066643989","display_name":"H. Van Winckel","orcid":"https://orcid.org/0000-0001-5158-9327"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"H. Van Winckel","raw_affiliation_strings":["Katholieke Universiteit Leuven, Leuven, Flanders, BE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Katholieke Universiteit Leuven, Leuven, Flanders, BE","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1377,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72785691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"361","last_page":"364"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.8553966283798218},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.7181413173675537},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7121312618255615},{"id":"https://openalex.org/keywords/collimated-light","display_name":"Collimated light","score":0.6483837366104126},{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.6454735398292542},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.5604742169380188},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.5437381267547607},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5143778920173645},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.49306151270866394},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.45677676796913147},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.4375481903553009},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3958275318145752},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.39204949140548706},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3861870765686035},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3298233151435852},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.21507930755615234},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21012043952941895},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.15621009469032288},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13536614179611206},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.1013546884059906},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1006256639957428}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.8553966283798218},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.7181413173675537},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7121312618255615},{"id":"https://openalex.org/C34445779","wikidata":"https://www.wikidata.org/wiki/Q1571347","display_name":"Collimated light","level":3,"score":0.6483837366104126},{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.6454735398292542},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.5604742169380188},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.5437381267547607},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5143778920173645},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.49306151270866394},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.45677676796913147},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.4375481903553009},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3958275318145752},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.39204949140548706},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3861870765686035},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3298233151435852},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.21507930755615234},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21012043952941895},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.15621009469032288},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13536614179611206},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.1013546884059906},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1006256639957428},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/newcas.2017.8010180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas.2017.8010180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:1801.03449","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1801.03449","pdf_url":"https://arxiv.org/pdf/1801.03449","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:1801.03449","is_oa":true,"landing_page_url":"http://arxiv.org/abs/1801.03449","pdf_url":"https://arxiv.org/pdf/1801.03449","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2042377974","https://openalex.org/W2061094816","https://openalex.org/W2074212693","https://openalex.org/W2074527701","https://openalex.org/W2156178937","https://openalex.org/W2157388221"],"related_works":["https://openalex.org/W2093392189","https://openalex.org/W1984055937","https://openalex.org/W4385770201","https://openalex.org/W1974004953","https://openalex.org/W2072796508","https://openalex.org/W2099015120","https://openalex.org/W810815649","https://openalex.org/W2594681224","https://openalex.org/W1964634575","https://openalex.org/W2937506944"],"abstract_inverted_index":{"To":[0],"understand":[1],"the":[2,9,15,35,38,42,47,50,55,58,85,127,134,142],"scientific":[3],"imaging":[4,86],"capability,":[5],"one":[6],"must":[7],"characterize":[8],"intra-pixel":[10],"sensitivity":[11,52],"variation":[12,53],"(IPSV)":[13],"of":[14,34,41,49,57,62,73,141],"CMOS":[16,66],"image":[17,67],"sensor.":[18],"Extracting":[19],"an":[20,25],"IPSV":[21,60,128],"map":[22,61,129],"contributes":[23],"to":[24,31,109,125,137],"improved":[26],"detector":[27],"calibration":[28],"that":[29,149],"allows":[30,150],"eliminate":[32],"some":[33],"uncertainty":[36],"in":[37,96,107,145],"spatial":[39],"response":[40,112],"system.":[43],"This":[44],"paper":[45],"reports":[46],"measurement":[48,78],"sub-pixel":[51],"and":[54,103],"extraction":[56],"2D":[59],"a":[63,70,81,89,97,100,122,138,146,152],"front-side":[64],"illuminated":[65],"sensor":[68],"with":[69,88],"pixel":[71,102,148],"pitch":[72],"6":[74],"\u00b5m.":[75],"Our":[76],"optical":[77],"setup":[79],"focuses":[80],"collimated":[82],"beam":[83],"onto":[84],"surface":[87],"microscope":[90],"objective.":[91],"The":[92],"spot":[93],"was":[94],"scanned":[95],"raster":[98],"over":[99],"single":[101,147],"its":[104,111],"immediate":[105],"neighbors":[106],"order":[108],"probe":[110],"at":[113],"selected":[114],"(sub-pixel)":[115],"positions.":[116],"In":[117],"this":[118],"work":[119],"we":[120],"introduced":[121],"novel":[123],"technique":[124],"extract":[126],"by":[130],"fitting":[131],"(forward":[132],"modeling)":[133],"measured":[135],"data":[136],"mathematical":[139],"model":[140],"image,":[143],"generated":[144],"for":[151],"spatially":[153],"varying":[154],"sensitivity.":[155]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":3}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}