{"id":"https://openalex.org/W1987184084","doi":"https://doi.org/10.1109/newcas.2012.6328987","title":"Using LCSS algorithm for circuit level verification of analog designs","display_name":"Using LCSS algorithm for circuit level verification of analog designs","publication_year":2012,"publication_date":"2012-06-01","ids":{"openalex":"https://openalex.org/W1987184084","doi":"https://doi.org/10.1109/newcas.2012.6328987","mag":"1987184084"},"language":"en","primary_location":{"id":"doi:10.1109/newcas.2012.6328987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas.2012.6328987","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International NEWCAS Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051569720","display_name":"Rajeev Narayanan","orcid":null},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Rajeev Narayanan","raw_affiliation_strings":["Department of ECE, Concordia University, QUE, Canada","Dept. of ECE, Concordia University Montreal, Quebec, Canada"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Concordia University, QUE, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Dept. of ECE, Concordia University Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035836421","display_name":"Alaeddine Daghar","orcid":null},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Alaeddine Daghar","raw_affiliation_strings":["Department of ECE, Concordia University, QUE, Canada","Dept. of ECE, Concordia University Montreal, Quebec, Canada"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Concordia University, QUE, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Dept. of ECE, Concordia University Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019358937","display_name":"Mohamed H. Zaki","orcid":"https://orcid.org/0000-0002-2970-2423"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohamed Zaki","raw_affiliation_strings":["Department of ECE, Concordia University, QUE, Canada","Dept. of ECE, Concordia University Montreal, Quebec, Canada"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Concordia University, QUE, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Dept. of ECE, Concordia University Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007159598","display_name":"Sofi\u00e8ne Tahar","orcid":"https://orcid.org/0000-0002-5537-104X"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Sofiene Tahar","raw_affiliation_strings":["Department of ECE, Concordia University, QUE, Canada","Dept. of ECE, Concordia University Montreal, Quebec, Canada"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Concordia University, QUE, Canada","institution_ids":["https://openalex.org/I60158472"]},{"raw_affiliation_string":"Dept. of ECE, Concordia University Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I60158472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5051569720"],"corresponding_institution_ids":["https://openalex.org/I60158472"],"apc_list":null,"apc_paid":null,"fwci":0.26907904,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54799158,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"185","last_page":"188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7053892016410828},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6695585250854492},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6233681440353394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5410946011543274},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5182335376739502},{"id":"https://openalex.org/keywords/subsequence","display_name":"Subsequence","score":0.5071871280670166},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46947181224823},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.44929423928260803},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.4480368494987488},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.3571402430534363},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3366883397102356},{"id":"https://openalex.org/keywords/bounded-function","display_name":"Bounded function","score":0.2542199492454529},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.23015287518501282},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16640061140060425},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09240904450416565},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.09049537777900696},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07758399844169617}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7053892016410828},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6695585250854492},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6233681440353394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5410946011543274},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5182335376739502},{"id":"https://openalex.org/C137877099","wikidata":"https://www.wikidata.org/wiki/Q1332977","display_name":"Subsequence","level":3,"score":0.5071871280670166},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46947181224823},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.44929423928260803},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.4480368494987488},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3571402430534363},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3366883397102356},{"id":"https://openalex.org/C34388435","wikidata":"https://www.wikidata.org/wiki/Q2267362","display_name":"Bounded function","level":2,"score":0.2542199492454529},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.23015287518501282},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16640061140060425},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09240904450416565},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.09049537777900696},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07758399844169617},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/newcas.2012.6328987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/newcas.2012.6328987","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International NEWCAS Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W37827039","https://openalex.org/W632933265","https://openalex.org/W1914674302","https://openalex.org/W1972427123","https://openalex.org/W1975446127","https://openalex.org/W2104520397","https://openalex.org/W2125102200","https://openalex.org/W2132543899","https://openalex.org/W2167915846","https://openalex.org/W2491680125","https://openalex.org/W3145128584","https://openalex.org/W6722676908"],"related_works":["https://openalex.org/W2587909015","https://openalex.org/W2808212302","https://openalex.org/W2020386733","https://openalex.org/W2624489778","https://openalex.org/W2166959660","https://openalex.org/W2571954715","https://openalex.org/W2093731983","https://openalex.org/W2745127909","https://openalex.org/W2056383781","https://openalex.org/W2375192119"],"abstract_inverted_index":{"This":[0],"paper":[1],"relies":[2],"on":[3,75],"the":[4,12,30,55,88],"longest":[5,13],"closest":[6,58],"subsequence":[7,15],"(LCSS),":[8],"a":[9,63,76,82,98],"variant":[10],"of":[11,32,57,62,87,101],"common":[14],"(LCS),":[16],"to":[17,53,95],"account":[18,96],"for":[19,81,97],"process":[20,35],"variation":[21,36],"and":[22,34,46,49,93],"mismatch":[23,33],"in":[24,39],"analog":[25],"circuits.":[26],"At":[27],"circuit":[28,64,80],"level,":[29],"effect":[31],"that":[37],"results":[38],"offsets":[40],"is":[41,65,73],"analyzed":[42],"by":[43],"performing":[44],"parametric":[45],"statistical":[47],"techniques":[48],"then":[50],"applying":[51],"LCSS":[52],"estimate":[54],"probability":[56],"matching.":[59],"The":[60,71],"acceptance/rejection":[61],"done":[66],"using":[67],"bounded":[68],"hypothesis":[69],"testing.":[70],"approach":[72],"illustrated":[74],"Rambus":[77],"ring":[78],"oscillator":[79],"90nm":[83],"fabrication":[84],"process.":[85],"Advantages":[86],"proposed":[89],"methods":[90],"are":[91],"robustness":[92],"flexibility":[94],"wide":[99],"range":[100],"variations.":[102]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}