{"id":"https://openalex.org/W2566743442","doi":"https://doi.org/10.1109/nems.2016.7758239","title":"A high-speed image super-resolution algorithm based on sparse representation for MEMS defect detection","display_name":"A high-speed image super-resolution algorithm based on sparse representation for MEMS defect detection","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2566743442","doi":"https://doi.org/10.1109/nems.2016.7758239","mag":"2566743442"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2016.7758239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2016.7758239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101905310","display_name":"Xiuyuan Li","orcid":"https://orcid.org/0009-0009-6259-5533"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiuyuan Li","raw_affiliation_strings":["StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China"],"affiliations":[{"raw_affiliation_string":"StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027278481","display_name":"Yulong Zhao","orcid":"https://orcid.org/0000-0002-9615-4623"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yulong Zhao","raw_affiliation_strings":["StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China"],"affiliations":[{"raw_affiliation_string":"StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101970939","display_name":"Tengjiang Hu","orcid":"https://orcid.org/0000-0003-0516-9537"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tengjiang Hu","raw_affiliation_strings":["StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China"],"affiliations":[{"raw_affiliation_string":"StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100665639","display_name":"Qi Zhang","orcid":"https://orcid.org/0000-0003-0709-3273"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Zhang","raw_affiliation_strings":["Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, China"],"affiliations":[{"raw_affiliation_string":"Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101492286","display_name":"Yingxue Li","orcid":"https://orcid.org/0000-0002-1709-810X"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingxue Li","raw_affiliation_strings":["StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China"],"affiliations":[{"raw_affiliation_string":"StateKey Laboratory for Mechanical Manufacturing System, Xi'an Jiaotong University, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101905310"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.14907614,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/economic-shortage","display_name":"Economic shortage","score":0.7110609412193298},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6824398040771484},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6268389225006104},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.6220979690551758},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.6151411533355713},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.6061321496963501},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5622314214706421},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.5594567060470581},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.5259742140769958},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.5090438723564148},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.48113003373146057},{"id":"https://openalex.org/keywords/high-resolution","display_name":"High resolution","score":0.46083906292915344},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4351613521575928},{"id":"https://openalex.org/keywords/superresolution","display_name":"Superresolution","score":0.4151734411716461},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4079761505126953},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07989469170570374}],"concepts":[{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.7110609412193298},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6824398040771484},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6268389225006104},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.6220979690551758},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.6151411533355713},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.6061321496963501},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5622314214706421},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5594567060470581},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.5259742140769958},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5090438723564148},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.48113003373146057},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.46083906292915344},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4351613521575928},{"id":"https://openalex.org/C141239990","wikidata":"https://www.wikidata.org/wiki/Q957423","display_name":"Superresolution","level":3,"score":0.4151734411716461},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4079761505126953},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07989469170570374},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C2778137410","wikidata":"https://www.wikidata.org/wiki/Q2732820","display_name":"Government (linguistics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2016.7758239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2016.7758239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1556245071","https://openalex.org/W1791560514","https://openalex.org/W2002020012","https://openalex.org/W2068699225","https://openalex.org/W2091250708","https://openalex.org/W2097074225","https://openalex.org/W2137290314","https://openalex.org/W2149760002","https://openalex.org/W2161516371","https://openalex.org/W2163935418","https://openalex.org/W2165939075","https://openalex.org/W2388897336"],"related_works":["https://openalex.org/W2272290532","https://openalex.org/W2120483398","https://openalex.org/W1530711136","https://openalex.org/W1763916368","https://openalex.org/W2319192085","https://openalex.org/W2391127530","https://openalex.org/W2045074154","https://openalex.org/W3004000015","https://openalex.org/W2559771220","https://openalex.org/W4387300017"],"abstract_inverted_index":{"A":[0],"novel":[1],"high-":[2],"speed":[3],"image":[4,35,52],"super-resolution":[5,21,50],"algorithm":[6,86,103],"based":[7],"on":[8],"sparse":[9],"representation":[10],"for":[11,107],"MEMS":[12,80,108],"defect":[13,109],"detection":[14],"is":[15,104],"proposed":[16,102],"in":[17],"this":[18,46],"paper.":[19],"Traditional":[20],"algorithms":[22],"adopt":[23],"a":[24],"single":[25],"dictionary":[26,74],"to":[27,39],"represent":[28],"images,":[29],"which":[30],"cannot":[31],"differentiate":[32],"varieties":[33],"of":[34,48,64,78,90],"blocks":[36,53],"and":[37,62,71],"leads":[38],"slow":[40],"processing":[41,97],"speed.":[42],"Aiming":[43],"at":[44],"overcoming":[45],"shortage":[47],"traditional":[49],"algorithms,":[51],"are":[54],"divided":[55],"into":[56],"different":[57,79],"categories":[58,66],"by":[59],"local":[60],"features":[61],"each":[63],"these":[65],"possesses":[67],"the":[68,84,101],"corresponding":[69],"high":[70],"low":[72],"resolution":[73],"pairs.":[75],"Experimental":[76],"results":[77],"defects":[81],"show":[82],"that":[83,100],"improved":[85],"can":[87],"obtain":[88],"images":[89],"little":[91],"lower":[92],"quality":[93],"with":[94],"much":[95],"less":[96],"time,":[98],"indicating":[99],"more":[105],"suitable":[106],"detection.":[110]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}