{"id":"https://openalex.org/W2296688795","doi":"https://doi.org/10.1109/nems.2015.7147504","title":"A gold nano-dot modified silicon tip apex for scanning Kelvin probe microscopy","display_name":"A gold nano-dot modified silicon tip apex for scanning Kelvin probe microscopy","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W2296688795","doi":"https://doi.org/10.1109/nems.2015.7147504","mag":"2296688795"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2015.7147504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077555872","display_name":"Chun-Ting Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Ting Lin","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080326136","display_name":"Ching-Hao Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I162838928","display_name":"National Chung Hsing University","ror":"https://ror.org/05vn3ca78","country_code":"TW","type":"education","lineage":["https://openalex.org/I162838928"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Hao Chen","raw_affiliation_strings":["Institute of Nanoscience, National Chung Hsing University, Taichung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Nanoscience, National Chung Hsing University, Taichung, Taiwan","institution_ids":["https://openalex.org/I162838928"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112099544","display_name":"Chien-Ting Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Ting Wu","raw_affiliation_strings":["National Nano Device Laboratories, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nano Device Laboratories, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110146116","display_name":"Chien\u2010Nan Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Nan Hsiao","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007701238","display_name":"Ming\u2010Hua Shiao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Hua Shiao","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103363300","display_name":"Mao-Nan Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I162838928","display_name":"National Chung Hsing University","ror":"https://ror.org/05vn3ca78","country_code":"TW","type":"education","lineage":["https://openalex.org/I162838928"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Mao-Nan Chang","raw_affiliation_strings":["Department of Physics, National Chung Hsing University, Taichung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, National Chung Hsing University, Taichung, Taiwan","institution_ids":["https://openalex.org/I162838928"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31480617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"613","last_page":"616"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10913","display_name":"Molecular Junctions and Nanostructures","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7280036211013794},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.7221823334693909},{"id":"https://openalex.org/keywords/apex","display_name":"Apex (geometry)","score":0.5834664106369019},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.5344386100769043},{"id":"https://openalex.org/keywords/nanodot","display_name":"Nanodot","score":0.513556957244873},{"id":"https://openalex.org/keywords/kelvin-probe-force-microscope","display_name":"Kelvin probe force microscope","score":0.48133882880210876},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.4624965190887451},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.452815443277359},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3347034752368927},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.32970231771469116},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.22027906775474548},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1836252212524414},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.15857309103012085}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7280036211013794},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7221823334693909},{"id":"https://openalex.org/C67139541","wikidata":"https://www.wikidata.org/wiki/Q2858200","display_name":"Apex (geometry)","level":2,"score":0.5834664106369019},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5344386100769043},{"id":"https://openalex.org/C66344492","wikidata":"https://www.wikidata.org/wiki/Q6964032","display_name":"Nanodot","level":2,"score":0.513556957244873},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.48133882880210876},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4624965190887451},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.452815443277359},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3347034752368927},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.32970231771469116},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.22027906775474548},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1836252212524414},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15857309103012085},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105702510","wikidata":"https://www.wikidata.org/wiki/Q514","display_name":"Anatomy","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2015.7147504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1968880008","https://openalex.org/W1974736562","https://openalex.org/W1982531293","https://openalex.org/W1982892856","https://openalex.org/W1989514997","https://openalex.org/W1991611913","https://openalex.org/W2000090551","https://openalex.org/W2010864731","https://openalex.org/W2016502903","https://openalex.org/W2020814722","https://openalex.org/W2027805695","https://openalex.org/W2036411543","https://openalex.org/W2069684780","https://openalex.org/W2098864517","https://openalex.org/W2163230530","https://openalex.org/W2166807223","https://openalex.org/W2170771181","https://openalex.org/W2318888929"],"related_works":["https://openalex.org/W4200324093","https://openalex.org/W2003916959","https://openalex.org/W2560730398","https://openalex.org/W2111378700","https://openalex.org/W2019847825","https://openalex.org/W2080278763","https://openalex.org/W2390775309","https://openalex.org/W166664737","https://openalex.org/W4250065749","https://openalex.org/W2003759371"],"abstract_inverted_index":{"In":[0,80],"this":[1],"paper,":[2],"a":[3,11,61,73,81,84,105,112],"gold":[4],"nano-dot":[5],"(Au-ND)":[6],"is":[7,32,70,121],"successfully":[8,48],"prepared":[9],"on":[10],"silicon":[12,37],"tip":[13,42,52,58,118],"apex":[14,43,53,59],"for":[15],"scanning":[16,138],"Kelvin":[17],"probe":[18,139],"microscopy":[19,140],"(SKPM)":[20],"applications.":[21],"An":[22],"extra":[23],"facile":[24,108],"localized":[25],"fluoride":[26],"assisted":[27],"Galvanic":[28],"replacement":[29],"reaction":[30],"(LFAGRR)":[31],"proposed":[33],"to":[34,110,129,132],"replace":[35],"the":[36,41,56,98,133],"(Si)":[38],"atoms":[39],"at":[40],"with":[44,86],"Au":[45],"ones.":[46],"We":[47],"fabricated":[49,93],"Au-ND":[50,85],"coated":[51],"by":[54,72],"tapping":[55],"Si":[57],"against":[60],"thin":[62],"layer":[63],"of":[64,135],"electrolyte":[65],"containing":[66],"HAuCl4and":[67],"HF,":[68],"which":[69],"supported":[71],"commercial":[74],"anodic":[75],"aluminum":[76],"oxide":[77],"(AAO)":[78],"slice.":[79],"typical":[82],"process,":[83],"approximate":[87],"30":[88,95],"nm":[89],"in":[90,97],"diameter":[91],"was":[92],"within":[94],"seconds":[96],"ambient":[99],"condition.":[100],"Our":[101],"preliminary":[102],"results":[103],"demonstrated":[104],"cost-effective":[106],"and":[107],"process":[109],"prepare":[111],"noble":[113],"metal-nanodot":[114],"(metal-ND)":[115],"modified":[116],"AFM":[117],"apex.":[119],"It":[120],"expected":[122],"that":[123],"current":[124],"technology":[125],"has":[126],"high":[127],"potential":[128],"be":[130],"applied":[131],"applications":[134],"field":[136],"sensitive":[137],"(FS-SPM).":[141]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}