{"id":"https://openalex.org/W2293122549","doi":"https://doi.org/10.1109/nems.2015.7147494","title":"Properties and applications of carbon nanofibers for atomic force microscopy","display_name":"Properties and applications of carbon nanofibers for atomic force microscopy","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W2293122549","doi":"https://doi.org/10.1109/nems.2015.7147494","mag":"2293122549"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2015.7147494","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147494","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056834737","display_name":"Gemma Rius","orcid":"https://orcid.org/0000-0003-0552-1043"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Gemma Rius","raw_affiliation_strings":["Nagoya Institute of Technology, NITech Nagoya, Japan"],"affiliations":[{"raw_affiliation_string":"Nagoya Institute of Technology, NITech Nagoya, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034180401","display_name":"Soichiro Matsui","orcid":null},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Soichiro Matsui","raw_affiliation_strings":["Nagoya Institute of Technology, NITech Nagoya, Japan"],"affiliations":[{"raw_affiliation_string":"Nagoya Institute of Technology, NITech Nagoya, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012460651","display_name":"Masaki Tanemura","orcid":"https://orcid.org/0000-0001-8771-7888"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaki Tanemura","raw_affiliation_strings":["Nagoya Institute of Technology, NITech Nagoya, Japan"],"affiliations":[{"raw_affiliation_string":"Nagoya Institute of Technology, NITech Nagoya, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032882444","display_name":"Matteo Lorenzoni","orcid":"https://orcid.org/0000-0001-5287-8761"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Matteo Lorenzoni","raw_affiliation_strings":["IMB-CNM-CSIC, Institut de Microelectronica de Barcelona, Bellaterra, Spain francesc"],"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Institut de Microelectronica de Barcelona, Bellaterra, Spain francesc","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014958430","display_name":"Francesc P\u00e9rez\u2010Murano","orcid":"https://orcid.org/0000-0002-4647-8558"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francesc Perez-Murano","raw_affiliation_strings":["IMB-CNM-CSIC, Institut de Microelectronica de Barcelona, Bellaterra, Spain francesc"],"affiliations":[{"raw_affiliation_string":"IMB-CNM-CSIC, Institut de Microelectronica de Barcelona, Bellaterra, Spain francesc","institution_ids":["https://openalex.org/I4210160312"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5056834737"],"corresponding_institution_ids":["https://openalex.org/I197274945"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.14361906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"571","last_page":"574"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10913","display_name":"Molecular Junctions and Nanostructures","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7061176300048828},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.7036588191986084},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.6950961351394653},{"id":"https://openalex.org/keywords/scanning-ion-conductance-microscopy","display_name":"Scanning ion-conductance microscopy","score":0.6391997933387756},{"id":"https://openalex.org/keywords/lithography","display_name":"Lithography","score":0.6268061399459839},{"id":"https://openalex.org/keywords/conductive-atomic-force-microscopy","display_name":"Conductive atomic force microscopy","score":0.5204042196273804},{"id":"https://openalex.org/keywords/carbon-nanofiber","display_name":"Carbon nanofiber","score":0.5122308135032654},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.49465081095695496},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.49405649304389954},{"id":"https://openalex.org/keywords/nanolithography","display_name":"Nanolithography","score":0.4882700443267822},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4601844251155853},{"id":"https://openalex.org/keywords/scanning-capacitance-microscopy","display_name":"Scanning capacitance microscopy","score":0.4456852674484253},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4402911067008972},{"id":"https://openalex.org/keywords/nanometre","display_name":"Nanometre","score":0.4155064821243286},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.41489535570144653},{"id":"https://openalex.org/keywords/scanning-confocal-electron-microscopy","display_name":"Scanning confocal electron microscopy","score":0.36046552658081055},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33335697650909424},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.26082372665405273},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.13187941908836365}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7061176300048828},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.7036588191986084},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.6950961351394653},{"id":"https://openalex.org/C16777580","wikidata":"https://www.wikidata.org/wiki/Q7430068","display_name":"Scanning ion-conductance microscopy","level":4,"score":0.6391997933387756},{"id":"https://openalex.org/C204223013","wikidata":"https://www.wikidata.org/wiki/Q133036","display_name":"Lithography","level":2,"score":0.6268061399459839},{"id":"https://openalex.org/C206008964","wikidata":"https://www.wikidata.org/wiki/Q5159384","display_name":"Conductive atomic force microscopy","level":3,"score":0.5204042196273804},{"id":"https://openalex.org/C177367955","wikidata":"https://www.wikidata.org/wiki/Q4468924","display_name":"Carbon nanofiber","level":3,"score":0.5122308135032654},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.49465081095695496},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.49405649304389954},{"id":"https://openalex.org/C162117346","wikidata":"https://www.wikidata.org/wiki/Q1106386","display_name":"Nanolithography","level":4,"score":0.4882700443267822},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4601844251155853},{"id":"https://openalex.org/C99752389","wikidata":"https://www.wikidata.org/wiki/Q9337610","display_name":"Scanning capacitance microscopy","level":4,"score":0.4456852674484253},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4402911067008972},{"id":"https://openalex.org/C77066764","wikidata":"https://www.wikidata.org/wiki/Q178674","display_name":"Nanometre","level":2,"score":0.4155064821243286},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.41489535570144653},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.36046552658081055},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33335697650909424},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.26082372665405273},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.13187941908836365},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2015.7147494","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147494","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1963935003","https://openalex.org/W1965976693","https://openalex.org/W1983535781","https://openalex.org/W1993771788","https://openalex.org/W2002065129","https://openalex.org/W2035530266","https://openalex.org/W2046032184","https://openalex.org/W2050938834","https://openalex.org/W2057451129","https://openalex.org/W2088959322","https://openalex.org/W2094656325","https://openalex.org/W2109291718"],"related_works":["https://openalex.org/W1496401154","https://openalex.org/W99870850","https://openalex.org/W2014435277","https://openalex.org/W1646861040","https://openalex.org/W3143491025","https://openalex.org/W1486910393","https://openalex.org/W2616275348","https://openalex.org/W1861838190","https://openalex.org/W4379118176","https://openalex.org/W2061570401"],"abstract_inverted_index":{"Scanning":[0],"probe":[1,11,39,100],"techniques":[2],"such":[3],"as":[4,50],"atomic":[5],"force":[6],"microscopy":[7],"(AFM)":[8],"or":[9],"scanning":[10,99],"lithography":[12],"are":[13],"powerful":[14],"methods":[15],"for":[16,86],"the":[17,24,30,38,51,74,81,90,108],"investigation":[18],"and":[19,34,70],"modification":[20],"of":[21,37,54,67,89,98,110],"surfaces":[22],"at":[23],"nanometer":[25],"scale.":[26],"In":[27,79],"these":[28],"techniques,":[29],"tip":[31,52],"curvature":[32],"radius":[33],"aspect":[35],"ratio":[36],"play":[40],"a":[41,95],"crucial":[42],"role.":[43],"Here,":[44],"we":[45],"employ":[46],"carbon":[47],"nanofiber":[48],"(CNF)":[49],"apex":[53,83],"AFM":[55,75],"probes.":[56],"We":[57],"show":[58],"that":[59],"CNF-AFM":[60],"probes":[61],"provide":[62],"good":[63],"performance":[64],"in":[65,76,94],"terms":[66],"both":[68],"resolution":[69],"reliability":[71],"when":[72],"operating":[73],"dynamic":[77],"mode.":[78],"addition,":[80],"CNF":[82],"is":[84],"responsible":[85],"an":[87],"enhancement":[88],"field-induced":[91],"chemical":[92],"reaction":[93],"specific":[96],"form":[97],"lithography,":[101],"local":[102],"anodic":[103],"oxidation":[104],"(LAO),":[105],"which":[106],"allows":[107],"fabrication":[109],"silicon":[111],"oxide":[112],"(SiOx)":[113],"patterns":[114],"with":[115],"sub-10":[116],"nm":[117],"resolution.":[118]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}