{"id":"https://openalex.org/W2287190870","doi":"https://doi.org/10.1109/nems.2015.7147398","title":"Electrical bistable properties of ZnO nanoparticles thin film prepared by electrostatic spray deposition technique","display_name":"Electrical bistable properties of ZnO nanoparticles thin film prepared by electrostatic spray deposition technique","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W2287190870","doi":"https://doi.org/10.1109/nems.2015.7147398","mag":"2287190870"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2015.7147398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147398","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050441080","display_name":"Natpasit Chaithanatkun","orcid":null},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":true,"raw_author_name":"Natpasit Chaithanatkun","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066787774","display_name":"Direklit Chantarawong","orcid":null},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Direklit Chantarawong","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063955372","display_name":"Potiyan Songkeaw","orcid":null},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Potiyan Songkeaw","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036814678","display_name":"Korakot Onlaor","orcid":"https://orcid.org/0000-0001-5534-4992"},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Korakot Onlaor","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061975310","display_name":"Thutiyaporn Thiwawong","orcid":"https://orcid.org/0000-0001-9302-0585"},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Thutiyaporn Thiwawong","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081410238","display_name":"Benchapol Tunhoo","orcid":"https://orcid.org/0000-0003-4277-7670"},"institutions":[{"id":"https://openalex.org/I91538806","display_name":"King Mongkut's Institute of Technology Ladkrabang","ror":"https://ror.org/055mf0v62","country_code":"TH","type":"education","lineage":["https://openalex.org/I91538806"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Benchapol Tunhoo","raw_affiliation_strings":["Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand"],"affiliations":[{"raw_affiliation_string":"Nanotec-KMITL Excellence Center on Nanoelectronic Devices, Bangkok, Thailand","institution_ids":["https://openalex.org/I91538806"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5050441080"],"corresponding_institution_ids":["https://openalex.org/I91538806"],"apc_list":null,"apc_paid":null,"fwci":0.1417,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48669948,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"152","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8066725730895996},{"id":"https://openalex.org/keywords/bistability","display_name":"Bistability","score":0.7503266334533691},{"id":"https://openalex.org/keywords/indium-tin-oxide","display_name":"Indium tin oxide","score":0.7024585008621216},{"id":"https://openalex.org/keywords/nanoparticle","display_name":"Nanoparticle","score":0.6983967423439026},{"id":"https://openalex.org/keywords/deposition","display_name":"Deposition (geology)","score":0.6898290514945984},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.6280628442764282},{"id":"https://openalex.org/keywords/chemical-engineering","display_name":"Chemical engineering","score":0.5314181447029114},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.5074014067649841},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.48055699467658997},{"id":"https://openalex.org/keywords/diffraction","display_name":"Diffraction","score":0.4328191876411438},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4007118046283722},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3233296275138855},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16777145862579346},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15252169966697693},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.0973447859287262}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8066725730895996},{"id":"https://openalex.org/C97292510","wikidata":"https://www.wikidata.org/wiki/Q2304620","display_name":"Bistability","level":2,"score":0.7503266334533691},{"id":"https://openalex.org/C32737372","wikidata":"https://www.wikidata.org/wiki/Q417718","display_name":"Indium tin oxide","level":3,"score":0.7024585008621216},{"id":"https://openalex.org/C155672457","wikidata":"https://www.wikidata.org/wiki/Q61231","display_name":"Nanoparticle","level":2,"score":0.6983967423439026},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.6898290514945984},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6280628442764282},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.5314181447029114},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5074014067649841},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.48055699467658997},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.4328191876411438},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4007118046283722},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3233296275138855},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16777145862579346},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15252169966697693},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0973447859287262},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2015.7147398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2015.7147398","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1544177252","https://openalex.org/W1988044740","https://openalex.org/W1989954101","https://openalex.org/W1990666881","https://openalex.org/W2007681943","https://openalex.org/W2021267616","https://openalex.org/W2035793625","https://openalex.org/W2049483182","https://openalex.org/W2051227778","https://openalex.org/W2063117591","https://openalex.org/W2072823822","https://openalex.org/W2093253283","https://openalex.org/W2103297412","https://openalex.org/W2140140060","https://openalex.org/W2327574679","https://openalex.org/W2555912131"],"related_works":["https://openalex.org/W4224217224","https://openalex.org/W3118640947","https://openalex.org/W1964519618","https://openalex.org/W4388308731","https://openalex.org/W1969697984","https://openalex.org/W3048730783","https://openalex.org/W1992416820","https://openalex.org/W3094197880","https://openalex.org/W2183786486","https://openalex.org/W2028771680"],"abstract_inverted_index":{"Thin":[0],"films":[1,33,55],"of":[2,30,48,54,62,79],"zinc":[3],"oxide":[4],"nanoparticles":[5],"(ZnO":[6],"NPs)":[7],"for":[8],"bistable":[9,67,81],"device":[10,82],"was":[11,56,83],"prepared":[12],"by":[13,72,85],"electrostatic":[14],"spray":[15],"deposition":[16,50,63],"technique":[17],"based":[18],"on":[19,52,65],"an":[20],"indium-tin":[21],"oxide/ZnO":[22],"NPs/aluminum":[23],"(ITO/ZnO":[24],"NPs":[25,32],"/Al)":[26],"structure.":[27],"The":[28,46,76],"characterizations":[29],"ZnO":[31],"were":[34],"performed":[35,71],"using":[36],"X-ray":[37],"diffraction":[38],"(XRD),":[39],"field":[40],"emission":[41],"scanning":[42],"electron":[43],"microscopy":[44],"(FE-SEM).":[45],"influence":[47],"the":[49,60,66,80],"time":[51,64],"properties":[53,68],"also":[57],"investigated.":[58],"Moreover,":[59],"effect":[61],"can":[69],"be":[70],"current-voltage":[73],"(I-V)":[74],"measurements.":[75],"conduction":[77],"mechanism":[78],"analyzed":[84],"theoretical":[86],"model.":[87]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}