{"id":"https://openalex.org/W2067335159","doi":"https://doi.org/10.1109/nems.2014.6908767","title":"Reduction of machining motion error of an aspheric surface coordinate measuring machine by a new error compensation method","display_name":"Reduction of machining motion error of an aspheric surface coordinate measuring machine by a new error compensation method","publication_year":2014,"publication_date":"2014-04-01","ids":{"openalex":"https://openalex.org/W2067335159","doi":"https://doi.org/10.1109/nems.2014.6908767","mag":"2067335159"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2014.6908767","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2014.6908767","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101762898","display_name":"Xiang Wei","orcid":"https://orcid.org/0000-0003-0838-8583"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiang Wei","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451207","display_name":"Bing Li","orcid":"https://orcid.org/0000-0001-6909-4752"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Li","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008278755","display_name":"Lijiao Jia","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijiao Jia","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033373769","display_name":"Zhuangde Jiang","orcid":"https://orcid.org/0000-0001-5557-2653"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuangde Jiang","raw_affiliation_strings":["Xi'an Jiaotong University, Xi'an, Shaanxi, CN","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"Xi'an Jiaotong University, Xi'an, Shaanxi, CN","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100333485","display_name":"Lei Chen","orcid":"https://orcid.org/0000-0002-6066-0831"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Chen","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101762898"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1532994,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":null,"first_page":"93","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11245","display_name":"Advanced Numerical Analysis Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.7194271087646484},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.7085330486297607},{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.6786421537399292},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.648061215877533},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6081014275550842},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5904051661491394},{"id":"https://openalex.org/keywords/coordinate-measuring-machine","display_name":"Coordinate-measuring machine","score":0.5812563896179199},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5405948758125305},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.5349302291870117},{"id":"https://openalex.org/keywords/machine-tool","display_name":"Machine tool","score":0.5094769597053528},{"id":"https://openalex.org/keywords/laser-tracker","display_name":"Laser tracker","score":0.49262481927871704},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.48139452934265137},{"id":"https://openalex.org/keywords/motion","display_name":"Motion (physics)","score":0.4702666699886322},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.44090813398361206},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42225149273872375},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.31577926874160767},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.22038519382476807},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19899040460586548},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1492862105369568},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14188051223754883},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13456320762634277},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08552172780036926}],"concepts":[{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.7194271087646484},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.7085330486297607},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.6786421537399292},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.648061215877533},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6081014275550842},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5904051661491394},{"id":"https://openalex.org/C2777511293","wikidata":"https://www.wikidata.org/wiki/Q1426871","display_name":"Coordinate-measuring machine","level":2,"score":0.5812563896179199},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5405948758125305},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.5349302291870117},{"id":"https://openalex.org/C5941749","wikidata":"https://www.wikidata.org/wiki/Q19768","display_name":"Machine tool","level":2,"score":0.5094769597053528},{"id":"https://openalex.org/C43210895","wikidata":"https://www.wikidata.org/wiki/Q2447583","display_name":"Laser tracker","level":3,"score":0.49262481927871704},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.48139452934265137},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.4702666699886322},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.44090813398361206},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42225149273872375},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31577926874160767},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.22038519382476807},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19899040460586548},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1492862105369568},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14188051223754883},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13456320762634277},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08552172780036926},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2014.6908767","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2014.6908767","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2010540773","https://openalex.org/W2036251009","https://openalex.org/W2358206152","https://openalex.org/W2377480713","https://openalex.org/W4232090023"],"related_works":["https://openalex.org/W2353665242","https://openalex.org/W2989708805","https://openalex.org/W2647614668","https://openalex.org/W2893654558","https://openalex.org/W4391756265","https://openalex.org/W2291962036","https://openalex.org/W2086659844","https://openalex.org/W1983167535","https://openalex.org/W2524245141","https://openalex.org/W2378252573"],"abstract_inverted_index":{"This":[0],"paper":[1],"suggests":[2],"a":[3,13],"new":[4,47,71],"method":[5,76,81],"to":[6,22],"reduce":[7],"the":[8,19,24,32,46,49,57,67,74,78,87],"machine":[9],"motion":[10],"errors":[11,59],"of":[12,27,31,45],"2-dimension":[14],"aspheric":[15],"surface":[16],"measuring.":[17],"Using":[18],"laser":[20],"interferometer":[21],"measure":[23],"site":[25,58],"error":[26,36,43],"each":[28],"point":[29],"instead":[30],"position":[33],"error,":[34],"straightness":[35],"and":[37,39,52,77],"yaw":[38],"pitch":[40],"error.":[41],"Through":[42],"compensation":[44],"method,":[48],"simulation":[50],"results":[51],"verification":[53],"experiments":[54],"showed":[55],"that":[56],"agree":[60],"well":[61],"within":[62],"less":[63],"than":[64],"5\u03bcm":[65],"in":[66,84,86],"whole":[68],"space.":[69],"The":[70],"mathematical":[72],"model,":[73],"calibration":[75],"data":[79],"analysis":[80],"are":[82],"described":[83],"detail":[85],"paper.":[88]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}