{"id":"https://openalex.org/W2099375344","doi":"https://doi.org/10.1109/nems.2012.6196729","title":"Pyramidal nanowire tip for atomic force microscopy and thermal imaging","display_name":"Pyramidal nanowire tip for atomic force microscopy and thermal imaging","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W2099375344","doi":"https://doi.org/10.1109/nems.2012.6196729","mag":"2099375344"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2012.6196729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2012.6196729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012382404","display_name":"Narges Burouni","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Narges Burouni","raw_affiliation_strings":["Transducer Science and Technology, Department of Electrical Engineering, Mathematics and Computer Science, MESA Research Institute, University of Twente, Netherlands","Transducer Science and Technology, Department of Electrical Engineering, Mathematics and Computer Science, University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Transducer Science and Technology, Department of Electrical Engineering, Mathematics and Computer Science, MESA Research Institute, University of Twente, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Transducer Science and Technology, Department of Electrical Engineering, Mathematics and Computer Science, University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053401940","display_name":"Edin Sarajlic","orcid":"https://orcid.org/0000-0002-6184-3234"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Edin Sarajlic","raw_affiliation_strings":["Universiteit Twente, Enschede, Overijssel, NL","Smarttip, NETHERLANDS"],"affiliations":[{"raw_affiliation_string":"Universiteit Twente, Enschede, Overijssel, NL","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Smarttip, NETHERLANDS","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072978650","display_name":"Martin Herman Siekman","orcid":"https://orcid.org/0000-0003-0749-574X"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Martin Siekman","raw_affiliation_strings":["Universiteit Twente, Enschede, Overijssel, NL","Univ of Twente (Netherlands)"],"affiliations":[{"raw_affiliation_string":"Universiteit Twente, Enschede, Overijssel, NL","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ of Twente (Netherlands)","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043830254","display_name":"L\u00e9on Abelmann","orcid":"https://orcid.org/0000-0002-9733-1230"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Leon Abelmann","raw_affiliation_strings":["Universiteit Twente, Enschede, Overijssel, NL","Univ of Twente (Netherlands)"],"affiliations":[{"raw_affiliation_string":"Universiteit Twente, Enschede, Overijssel, NL","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ of Twente (Netherlands)","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006143543","display_name":"Niels R. Tas","orcid":"https://orcid.org/0000-0001-7541-4345"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Niels Tas","raw_affiliation_strings":["Universiteit Twente, Enschede, Overijssel, NL","Univ of Twente (Netherlands)"],"affiliations":[{"raw_affiliation_string":"Universiteit Twente, Enschede, Overijssel, NL","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Univ of Twente (Netherlands)","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5012382404"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":0.6363,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.70423955,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"28","issue":null,"first_page":"86","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanowire","display_name":"Nanowire","score":0.7917776703834534},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.646446704864502},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.6077186465263367},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6059361100196838},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5211398601531982},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.44574418663978577},{"id":"https://openalex.org/keywords/magnetic-force-microscope","display_name":"Magnetic force microscope","score":0.4277298152446747},{"id":"https://openalex.org/keywords/atomic-force-acoustic-microscopy","display_name":"Atomic force acoustic microscopy","score":0.41877907514572144},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.41663601994514465},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33202415704727173},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22148993611335754}],"concepts":[{"id":"https://openalex.org/C74214498","wikidata":"https://www.wikidata.org/wiki/Q631739","display_name":"Nanowire","level":2,"score":0.7917776703834534},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.646446704864502},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.6077186465263367},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6059361100196838},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5211398601531982},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.44574418663978577},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.4277298152446747},{"id":"https://openalex.org/C43826995","wikidata":"https://www.wikidata.org/wiki/Q17014103","display_name":"Atomic force acoustic microscopy","level":5,"score":0.41877907514572144},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41663601994514465},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33202415704727173},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22148993611335754},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/nems.2012.6196729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2012.6196729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/ff8eaa57-ca9b-4ac8-826f-9de5cc7224ce","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/ff8eaa57-ca9b-4ac8-826f-9de5cc7224ce","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Burouni, N, Sarajlic, E, Siekman, M, Abelmann, L & Tas, N 2012, Pyramidal nanowire tip for atomic force microscopy and thermal imaging. in 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012. IEEE, Los Alamitos, NJ, pp. 86-89, 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012, Kyoto, Japan, 5/03/12. https://doi.org/10.1109/NEMS.2012.6196729","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334893","display_name":"Stichting voor de Technische Wetenschappen","ror":"https://ror.org/057tq3593"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1989072399","https://openalex.org/W2007054126","https://openalex.org/W2020845563","https://openalex.org/W2024800040","https://openalex.org/W2051858301","https://openalex.org/W2056777073","https://openalex.org/W2063066388","https://openalex.org/W2070944549"],"related_works":["https://openalex.org/W2244213177","https://openalex.org/W2247674939","https://openalex.org/W4394584065","https://openalex.org/W2069998703","https://openalex.org/W2117203629","https://openalex.org/W1991686333","https://openalex.org/W4242960362","https://openalex.org/W2082608198","https://openalex.org/W2107090442","https://openalex.org/W1019771430"],"abstract_inverted_index":{"We":[0,132],"present":[1],"a":[2,37,49],"novel":[3],"3D":[4],"nanowire":[5],"pyramid":[6],"as":[7],"scanning":[8,135],"microscopy":[9],"probe":[10,19,31,108,136],"for":[11],"thermal":[12,104],"imaging":[13],"and":[14,25,97,103],"atomic":[15,139],"force":[16,140],"microscopy.":[17],"This":[18],"is":[20],"fabricated":[21],"by":[22,63,125],"standard":[23],"micromachining":[24],"conventional":[26],"optical":[27],"contact":[28],"lithography.":[29],"The":[30,54,84,112],"features":[32],"an":[33,66,138],"AFM-type":[34],"cantilever":[35],"with":[36,48],"sharp":[38],"pyramidal":[39],"tip":[40,89],"composed":[41],"of":[42,51,59,73,106,129],"four":[43],"freestanding":[44],"silicon":[45,60],"nitride":[46,61],"nanowires":[47,117],"diameter":[50],"60":[52],"nm.":[53],"nanowires,":[55],"which":[56],"are":[57],"made":[58],"coated":[62],"metal,":[64],"form":[65],"electrical":[67],"cross":[68,85],"junction":[69,86],"at":[70],"the":[71,74,78,82,88,107,116,127,130,134],"apex":[72,90],"tip,":[75],"addressable":[76],"through":[77],"electrodes":[79],"integrated":[80],"on":[81,87],"cantilever.":[83],"can":[91,122],"be":[92,123],"utilized":[93],"to":[94,119],"produce":[95],"heat":[96],"detect":[98],"local":[99],"temperature":[100,113],"changes.":[101],"Electrical":[102],"properties":[105],"were":[109],"experimentally":[110],"determined.":[111],"changes":[114],"in":[115,137],"due":[118],"Joule":[120],"heating":[121],"sensed":[124],"measuring":[126],"resistance":[128],"nanowires.":[131],"employed":[133],"microscope.":[141]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}