{"id":"https://openalex.org/W2098040425","doi":"https://doi.org/10.1109/nems.2011.6017486","title":"A capacitance level sensor design and sensor signal enhancement","display_name":"A capacitance level sensor design and sensor signal enhancement","publication_year":2011,"publication_date":"2011-02-01","ids":{"openalex":"https://openalex.org/W2098040425","doi":"https://doi.org/10.1109/nems.2011.6017486","mag":"2098040425"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2011.6017486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2011.6017486","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100377775","display_name":"Yuting Li","orcid":"https://orcid.org/0000-0003-2236-6612"},"institutions":[{"id":"https://openalex.org/I70522481","display_name":"National Changhua University of Education","ror":"https://ror.org/005gkfa10","country_code":"TW","type":"education","lineage":["https://openalex.org/I70522481"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Yu-Ting Li","raw_affiliation_strings":["Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","institution_ids":["https://openalex.org/I70522481"]},{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN","institution_ids":["https://openalex.org/I70522481"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027578610","display_name":"Chih-Ming Chao","orcid":null},"institutions":[{"id":"https://openalex.org/I70522481","display_name":"National Changhua University of Education","ror":"https://ror.org/005gkfa10","country_code":"TW","type":"education","lineage":["https://openalex.org/I70522481"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Ming Chao","raw_affiliation_strings":["Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","institution_ids":["https://openalex.org/I70522481"]},{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN","institution_ids":["https://openalex.org/I70522481"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027017542","display_name":"Kerwin Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I70522481","display_name":"National Changhua University of Education","ror":"https://ror.org/005gkfa10","country_code":"TW","type":"education","lineage":["https://openalex.org/I70522481"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kerwin Wang","raw_affiliation_strings":["Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN"],"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, Taiwan","institution_ids":["https://openalex.org/I70522481"]},{"raw_affiliation_string":"Department of Mechatronics Engineering, National Changhua University of Education, TAIWAN","institution_ids":["https://openalex.org/I70522481"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100377775"],"corresponding_institution_ids":["https://openalex.org/I70522481"],"apc_list":null,"apc_paid":null,"fwci":0.9721,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.7631498,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"847","last_page":"850"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.8424767255783081},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8144249320030212},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6626553535461426},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6461857557296753},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6079093813896179},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6061018705368042},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5072826743125916},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.48370176553726196},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.47987452149391174},{"id":"https://openalex.org/keywords/level-sensor","display_name":"Level sensor","score":0.47574469447135925},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4739629924297333},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.47370263934135437},{"id":"https://openalex.org/keywords/potentiometric-sensor","display_name":"Potentiometric sensor","score":0.440665066242218},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4259769320487976},{"id":"https://openalex.org/keywords/surface-modification","display_name":"Surface modification","score":0.42308205366134644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.371957004070282},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31942319869995117},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19697731733322144},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1731891632080078},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09994786977767944}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.8424767255783081},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8144249320030212},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6626553535461426},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6461857557296753},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6079093813896179},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6061018705368042},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5072826743125916},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.48370176553726196},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.47987452149391174},{"id":"https://openalex.org/C164004088","wikidata":"https://www.wikidata.org/wiki/Q1481440","display_name":"Level sensor","level":2,"score":0.47574469447135925},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4739629924297333},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47370263934135437},{"id":"https://openalex.org/C195767000","wikidata":"https://www.wikidata.org/wiki/Q17105334","display_name":"Potentiometric sensor","level":4,"score":0.440665066242218},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4259769320487976},{"id":"https://openalex.org/C115537861","wikidata":"https://www.wikidata.org/wiki/Q7645993","display_name":"Surface modification","level":2,"score":0.42308205366134644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.371957004070282},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31942319869995117},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19697731733322144},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1731891632080078},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09994786977767944},{"id":"https://openalex.org/C124614425","wikidata":"https://www.wikidata.org/wiki/Q1813495","display_name":"Potentiometric titration","level":3,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2011.6017486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2011.6017486","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Clean water and sanitation","id":"https://metadata.un.org/sdg/6","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1591300912","https://openalex.org/W1974416081","https://openalex.org/W1975312651","https://openalex.org/W1975803999","https://openalex.org/W2026281817","https://openalex.org/W2046927790","https://openalex.org/W2097464479","https://openalex.org/W2098451801","https://openalex.org/W2101764299","https://openalex.org/W2102110355","https://openalex.org/W2120412321","https://openalex.org/W2137424487","https://openalex.org/W2161748785","https://openalex.org/W2539888526"],"related_works":["https://openalex.org/W2348740411","https://openalex.org/W2051563071","https://openalex.org/W1966596465","https://openalex.org/W2337947459","https://openalex.org/W4386858602","https://openalex.org/W2505169246","https://openalex.org/W2118205267","https://openalex.org/W2126912594","https://openalex.org/W1988444705","https://openalex.org/W4292622326"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,20,76],"novel":[4],"fringe":[5],"field":[6,52,56],"capacitive":[7],"sensor.":[8],"To":[9],"enhance":[10],"the":[11,42,55,59,62,70,89],"sensor":[12,15,43,53],"signal,":[13],"various":[14],"electrode":[16],"design":[17],"strategies":[18],"and":[19,27,36],"surface":[21,85],"modification":[22,86],"method":[23],"are":[24,31],"introduced,":[25],"discussed":[26],"compared.":[28],"The":[29,38,78],"sensors":[30],"characterized":[32],"by":[33,61],"both":[34],"simulations":[35],"experiments.":[37],"experiment":[39,79],"results":[40,80],"demonstrate":[41],"capability":[44],"of":[45,54,75],"water":[46],"level":[47],"measuring.":[48],"In":[49],"addition,":[50],"fringing":[51],"strength":[57,64],"across":[58],"target":[60],"dielectric":[63,71],"can":[65,87],"be":[66],"used":[67],"to":[68,93],"measure":[69],"constant":[72],"or":[73],"component":[74],"solution.":[77],"show":[81],"that":[82],"nitrogen":[83],"plasma":[84],"improve":[88],"sensitivity":[90],"from":[91],"69pF/mm":[92],"97pF/mm.":[94]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}