{"id":"https://openalex.org/W2070921693","doi":"https://doi.org/10.1109/nems.2010.5592197","title":"TbDyFe deposition experiments by evaporation on optical fiber","display_name":"TbDyFe deposition experiments by evaporation on optical fiber","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W2070921693","doi":"https://doi.org/10.1109/nems.2010.5592197","mag":"2070921693"},"language":"en","primary_location":{"id":"doi:10.1109/nems.2010.5592197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2010.5592197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045844648","display_name":"Peitao Dong","orcid":"https://orcid.org/0000-0002-8173-0819"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peitao Dong","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115589204","display_name":"Haoxu Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoxu Wang","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102865361","display_name":"Liqiang Xie","orcid":"https://orcid.org/0000-0002-7766-8098"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liqiang Xie","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100360430","display_name":"Qi Zhang","orcid":"https://orcid.org/0000-0003-2519-5580"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Zhang","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100861826","display_name":"Xuezhong Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuezhong Wu","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101867306","display_name":"Mengchun Pan","orcid":"https://orcid.org/0009-0004-4796-9799"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengchun Pan","raw_affiliation_strings":["School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"[School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China]","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13270416,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":null,"first_page":"237","last_page":"240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9611999988555908,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/deposition","display_name":"Deposition (geology)","score":0.8261313438415527},{"id":"https://openalex.org/keywords/evaporation","display_name":"Evaporation","score":0.7029838562011719},{"id":"https://openalex.org/keywords/electron-beam-physical-vapor-deposition","display_name":"Electron beam physical vapor deposition","score":0.5982200503349304},{"id":"https://openalex.org/keywords/electron-beam-induced-deposition","display_name":"Electron beam-induced deposition","score":0.5668345093727112},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.5530593395233154},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5490760803222656},{"id":"https://openalex.org/keywords/fiber","display_name":"Fiber","score":0.5125072002410889},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.4783993661403656},{"id":"https://openalex.org/keywords/coating","display_name":"Coating","score":0.45158275961875916},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.4514920711517334},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.29653072357177734},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.24564936757087708},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.24424326419830322},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.23189812898635864},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2121461033821106},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20730561017990112},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07174593210220337}],"concepts":[{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.8261313438415527},{"id":"https://openalex.org/C61441594","wikidata":"https://www.wikidata.org/wiki/Q132814","display_name":"Evaporation","level":2,"score":0.7029838562011719},{"id":"https://openalex.org/C7770020","wikidata":"https://www.wikidata.org/wiki/Q460616","display_name":"Electron beam physical vapor deposition","level":3,"score":0.5982200503349304},{"id":"https://openalex.org/C109486029","wikidata":"https://www.wikidata.org/wiki/Q5358152","display_name":"Electron beam-induced deposition","level":4,"score":0.5668345093727112},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5530593395233154},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5490760803222656},{"id":"https://openalex.org/C519885992","wikidata":"https://www.wikidata.org/wiki/Q161","display_name":"Fiber","level":2,"score":0.5125072002410889},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.4783993661403656},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.45158275961875916},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4514920711517334},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.29653072357177734},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.24564936757087708},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.24424326419830322},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.23189812898635864},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2121461033821106},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20730561017990112},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07174593210220337},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nems.2010.5592197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nems.2010.5592197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W652169801","https://openalex.org/W1990101349","https://openalex.org/W2065306245","https://openalex.org/W2099226239","https://openalex.org/W2134194426","https://openalex.org/W2371525246"],"related_works":["https://openalex.org/W1879518981","https://openalex.org/W2384883631","https://openalex.org/W2317453044","https://openalex.org/W1998443898","https://openalex.org/W2074541900","https://openalex.org/W2512436904","https://openalex.org/W2374359349","https://openalex.org/W2393243837","https://openalex.org/W2313377185","https://openalex.org/W2360381519"],"abstract_inverted_index":{"Schematic":[0],"of":[1,5,26,73],"a":[2],"new":[3],"type":[4],"Mach-Zehnder":[6],"interferential":[7],"magnetic":[8],"sensor":[9],"is":[10,13,20,65],"illustrated.":[11],"TbDyFe":[12,53,63,74],"used":[14],"as":[15],"the":[16,23,27,52],"magnetostrictive":[17],"material":[18],"which":[19,50],"coated":[21],"on":[22],"round":[24],"surface":[25],"sensing":[28],"optical":[29],"fiber.":[30],"The":[31,61,70],"deposition":[32,48,54,80,94],"experiments":[33],"are":[34,57,82],"done":[35],"using":[36,67],"electron":[37,68,77],"beam":[38,78],"evaporation":[39,79],"system.":[40],"Three":[41],"main":[42],"process":[43],"parameters,":[44],"temperature,":[45],"vacuum":[46,86],"and":[47,93],"rate,":[49],"affect":[51],"quality":[55],"seriously,":[56],"analyzed":[58],"by":[59],"experiments.":[60],"deposited":[62],"film":[64],"observed":[66],"microscope.":[69],"optimized":[71],"parameters":[72],"coating":[75],"with":[76],"method":[81],"acquired:":[83],"temperature":[84],"350\u00b0C,":[85],"degree":[87],"9.6\u00d710":[88],"<sup":[89],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[90],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-5</sup>":[91],"Pa":[92],"rate":[95],"1\u00c5/s.":[96]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}