{"id":"https://openalex.org/W2765870038","doi":"https://doi.org/10.1109/nds.2017.8070626","title":"Image-driven, model-free control of repetitive processes based on machine learning","display_name":"Image-driven, model-free control of repetitive processes based on machine learning","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2765870038","doi":"https://doi.org/10.1109/nds.2017.8070626","mag":"2765870038"},"language":"en","primary_location":{"id":"doi:10.1109/nds.2017.8070626","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nds.2017.8070626","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 10th International Workshop on Multidimensional (nD) Systems (nDS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019629599","display_name":"Ewaryst Rafaj\u0142owicz","orcid":"https://orcid.org/0000-0001-8469-2910"},"institutions":[{"id":"https://openalex.org/I11923345","display_name":"Wroc\u0142aw University of Science and Technology","ror":"https://ror.org/008fyn775","country_code":"PL","type":"education","lineage":["https://openalex.org/I11923345"]},{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Ewaryst Rafaj\u0142owicz","raw_affiliation_strings":["Faculty of Electronics, Wroclaw University of Science and Technology, 50 370 Wroc\u0142aw, Wyb. Wyspianskiego 27, Poland"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics, Wroclaw University of Science and Technology, 50 370 Wroc\u0142aw, Wyb. Wyspianskiego 27, Poland","institution_ids":["https://openalex.org/I11923345","https://openalex.org/I686019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5019629599"],"corresponding_institution_ids":["https://openalex.org/I11923345","https://openalex.org/I686019"],"apc_list":null,"apc_paid":null,"fwci":0.9032,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.7991098,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9865000247955322,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9865000247955322,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5914736986160278},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.577700138092041},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5582305788993835},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5218566656112671},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.46605098247528076},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.46482139825820923},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.4197835922241211},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35721951723098755},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3489276170730591},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2521868944168091}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5914736986160278},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.577700138092041},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5582305788993835},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5218566656112671},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.46605098247528076},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.46482139825820923},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.4197835922241211},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35721951723098755},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3489276170730591},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2521868944168091},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nds.2017.8070626","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nds.2017.8070626","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 10th International Workshop on Multidimensional (nD) Systems (nDS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W29277268","https://openalex.org/W130632564","https://openalex.org/W1506975760","https://openalex.org/W1564947197","https://openalex.org/W1981289542","https://openalex.org/W2023284387","https://openalex.org/W2090135786","https://openalex.org/W2099454382","https://openalex.org/W2508040429","https://openalex.org/W2606274372","https://openalex.org/W2615831239","https://openalex.org/W2766351574","https://openalex.org/W2799061466","https://openalex.org/W2799148064"],"related_works":["https://openalex.org/W2804364458","https://openalex.org/W4298130764","https://openalex.org/W2049864679","https://openalex.org/W2548212430","https://openalex.org/W2065405787","https://openalex.org/W2638730922","https://openalex.org/W3155069932","https://openalex.org/W2169557669","https://openalex.org/W2138039361","https://openalex.org/W3004171367"],"abstract_inverted_index":{"An":[0],"image-driven,":[1],"model-free":[2],"approach":[3],"to":[4,88,111,124,162],"design":[5],"control":[6,81,121,144],"systems":[7],"for":[8,72],"a":[9,58,101,120,125,141,151],"large":[10],"class":[11,90,126],"of":[12,20,27,34,41,48,61,79,92,140,169,183],"industrial":[13],"process":[14,22,36,50,165,182],"is":[15,23,65,70,83,129,134,150,158,175],"proposed.":[16],"A":[17,77,154],"mathematical":[18],"model":[19],"the":[21,32,35,46,49,54,62,80,93,96,104,112,137,164,181],"replaced":[24],"by":[25,85,136],"sequences":[26,43],"subsequent":[28],"images":[29,99,179],"which":[30,149],"play":[31],"role":[33],"(plant)":[37],"states.":[38,76,94],"The":[39],"length":[40],"this":[42],"depends":[44],"on":[45,53,177],"speed":[47],"dynamics":[51],"and":[52,67,119],"frame":[55],"rate.":[56],"Firstly,":[57],"learning":[59],"sequence":[60],"system":[63,82,113],"states":[64],"collected":[66,107],"then,":[68],"it":[69],"used":[71],"classifying":[73],"(clustering)":[74],"its":[75],"decision":[78],"attached":[84],"an":[86,146],"expert":[87],"each":[89,167],"(cluster)":[91],"At":[95],"implementation":[97],"stage":[98],"from":[100,180],"camera":[102],"in":[103,145,160],"loop":[105],"are":[106,117],"into":[108],"subsequences":[109],"corresponding":[110,123],"states,":[114,166],"then":[115],"they":[116],"classified":[118],"action":[122],"at":[127],"hand":[128],"undertaken.":[130],"This":[131],"general":[132],"idea":[133],"exemplified":[135],"case":[138],"study":[139],"laser":[142,184],"power":[143],"additive":[147,186],"manufacturing,":[148],"repetitive":[152],"process.":[153],"tree-like,":[155],"hierarchical":[156],"classifier":[157],"proposed":[159],"order":[161],"recognize":[163],"consisting":[168],"three":[170],"consecutive":[171],"images.":[172],"Its":[173],"performance":[174],"tested":[176],"real-life":[178],"cladding":[185],"manufacturing.":[187]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}