{"id":"https://openalex.org/W3046509355","doi":"https://doi.org/10.1109/natw49237.2020.9153078","title":"A Built In Test circuit for waveform classification at high frequencies","display_name":"A Built In Test circuit for waveform classification at high frequencies","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3046509355","doi":"https://doi.org/10.1109/natw49237.2020.9153078","mag":"3046509355"},"language":"en","primary_location":{"id":"doi:10.1109/natw49237.2020.9153078","is_oa":false,"landing_page_url":"https://doi.org/10.1109/natw49237.2020.9153078","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 29th North Atlantic Test Workshop (NATW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043820503","display_name":"Konstantinos Poulos","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Konstantinos Poulos","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, U.S.A","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108640776","display_name":"Themistoklis Haniotakis","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Themistoklis Haniotakis","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, U.S.A","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043820503"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10133566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"55","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7454383969306946},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.6013441681861877},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5955368876457214},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5489790439605713},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5356540083885193},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5305379033088684},{"id":"https://openalex.org/keywords/rectifier","display_name":"Rectifier (neural networks)","score":0.47464901208877563},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4568134546279907},{"id":"https://openalex.org/keywords/discrete-circuit","display_name":"Discrete circuit","score":0.4487461447715759},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4274914860725403},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4245079755783081},{"id":"https://openalex.org/keywords/electronic-filter","display_name":"Electronic filter","score":0.41939088702201843},{"id":"https://openalex.org/keywords/circuit-extraction","display_name":"Circuit extraction","score":0.4118041694164276},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3991687595844269},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2915179133415222},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.28762340545654297},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.15596649050712585},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11158764362335205},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10442236065864563}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7454383969306946},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.6013441681861877},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5955368876457214},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5489790439605713},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5356540083885193},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5305379033088684},{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.47464901208877563},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4568134546279907},{"id":"https://openalex.org/C188058453","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Discrete circuit","level":4,"score":0.4487461447715759},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4274914860725403},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4245079755783081},{"id":"https://openalex.org/C132237922","wikidata":"https://www.wikidata.org/wiki/Q327754","display_name":"Electronic filter","level":3,"score":0.41939088702201843},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.4118041694164276},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3991687595844269},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2915179133415222},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.28762340545654297},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.15596649050712585},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11158764362335205},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10442236065864563},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/natw49237.2020.9153078","is_oa":false,"landing_page_url":"https://doi.org/10.1109/natw49237.2020.9153078","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 29th North Atlantic Test Workshop (NATW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6399999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1551597150","https://openalex.org/W1905804396","https://openalex.org/W1982201597","https://openalex.org/W2027025585","https://openalex.org/W2044365476","https://openalex.org/W2093766895","https://openalex.org/W2102921002","https://openalex.org/W2151949659","https://openalex.org/W2162341298","https://openalex.org/W2268245425","https://openalex.org/W2545439053","https://openalex.org/W2546276976","https://openalex.org/W3142565327","https://openalex.org/W4297685165","https://openalex.org/W6633181547"],"related_works":["https://openalex.org/W2355158303","https://openalex.org/W2390607226","https://openalex.org/W3034130800","https://openalex.org/W2012618683","https://openalex.org/W3166836537","https://openalex.org/W2129446522","https://openalex.org/W2370566445","https://openalex.org/W2514330007","https://openalex.org/W2151684844","https://openalex.org/W1961251444"],"abstract_inverted_index":{"We":[0],"introduce":[1],"a":[2,24,44],"new":[3],"Build":[4],"In":[5,100],"Test":[6,55],"(BIT)":[7],"signature":[8,79],"generator":[9],"for":[10],"functional":[11],"verification":[12],"and":[13,32,87,98],"output":[14,65,71,92],"classification":[15],"of":[16,66,116,130],"RF":[17],"integrated":[18],"circuits.":[19],"The":[20,48,70],"proposed":[21,49,74,104],"circuit":[22,75,119],"is":[23,76,127],"single":[25],"rectifier-based":[26],"MOS":[27,132],"transistor,":[28],"with":[29,58,94],"the":[30,52,59,64,67,73,84,90,103,110,114,117,123,128,131],"substrate":[31],"gate":[33],"independently":[34],"biased":[35],"to":[36,96,135],"control":[37],"source":[38,129],"terminal":[39],"voltage":[40,61],"range,":[41],"followed":[42],"by":[43],"passive":[45],"RC":[46],"filter.":[47],"technique":[50],"correlates":[51],"Circuit":[53],"Under":[54],"(CUT)":[56],"characteristics":[57],"dc":[60],"provided":[62],"at":[63,113],"BIT":[68],"circuit.":[69],"from":[72,80],"used":[77],"as":[78],"which":[81],"we":[82],"verify":[83],"performance":[85,115],"specifications":[86],"also":[88],"characterize":[89],"CUT":[91],"waveform":[93],"respect":[95],"amplitude":[97],"shape.":[99],"normal":[101],"operation":[102],"low":[105],"cost":[106],"test":[107,121],"scheme":[108],"ensures":[109],"minimum":[111],"effect":[112],"measured":[118],"under":[120],"since":[122],"only":[124],"additional":[125],"load":[126],"transistor":[133],"attached":[134],"it.":[136]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}