{"id":"https://openalex.org/W4253027919","doi":"https://doi.org/10.1109/nanoarch.2014.6880499","title":"Hysteresis-free carbon nanotube field-effect transistors without passivation","display_name":"Hysteresis-free carbon nanotube field-effect transistors without passivation","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W4253027919","doi":"https://doi.org/10.1109/nanoarch.2014.6880499"},"language":"en","primary_location":{"id":"doi:10.1109/nanoarch.2014.6880499","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nanoarch.2014.6880499","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085178315","display_name":"Jana Tittmann-Otto","orcid":"https://orcid.org/0000-0001-8909-6739"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"J. Tittmann","raw_affiliation_strings":["Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087482836","display_name":"Sascha Hermann","orcid":"https://orcid.org/0009-0001-0501-4589"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Hermann","raw_affiliation_strings":["Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047693293","display_name":"Stefan E. Schulz","orcid":"https://orcid.org/0000-0002-1221-4802"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. E. Schulz","raw_affiliation_strings":["Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Center for Microtechnologies Technische Universit\u00e4t Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050593788","display_name":"An\u00edbal Pacheco-S\u00e1nchez","orcid":"https://orcid.org/0000-0002-0897-0605"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Pacheco-Sanchez","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084366087","display_name":"Martin Claus","orcid":"https://orcid.org/0000-0001-8009-8463"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Claus","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035970449","display_name":"M. Schr\u00f6ter","orcid":"https://orcid.org/0000-0002-5432-716X"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Schroter","raw_affiliation_strings":["Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Electron Devices and Integrated Circuits Technical University Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5085178315"],"corresponding_institution_ids":["https://openalex.org/I2610724"],"apc_list":null,"apc_paid":null,"fwci":0.2781,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56705416,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"45","issue":null,"first_page":"137","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11272","display_name":"Nanowire Synthesis and Applications","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/passivation","display_name":"Passivation","score":0.8994078636169434},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8275890350341797},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.6607925891876221},{"id":"https://openalex.org/keywords/hysteresis","display_name":"Hysteresis","score":0.6520490646362305},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6178932189941406},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5183088183403015},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.5144250988960266},{"id":"https://openalex.org/keywords/etching","display_name":"Etching (microfabrication)","score":0.504196047782898},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46461498737335205},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.39413881301879883},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.24806144833564758},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16429030895233154},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.138269305229187},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.09415724873542786}],"concepts":[{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.8994078636169434},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8275890350341797},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.6607925891876221},{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.6520490646362305},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6178932189941406},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5183088183403015},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5144250988960266},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.504196047782898},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46461498737335205},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.39413881301879883},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.24806144833564758},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16429030895233154},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.138269305229187},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.09415724873542786},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/nanoarch.2014.6880499","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nanoarch.2014.6880499","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)","raw_type":"proceedings-article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/385867","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/385867","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2008451760","https://openalex.org/W2025586235","https://openalex.org/W2045958572","https://openalex.org/W2049142984","https://openalex.org/W2159563595"],"related_works":["https://openalex.org/W2893117232","https://openalex.org/W2368982584","https://openalex.org/W957405543","https://openalex.org/W2100154643","https://openalex.org/W81629128","https://openalex.org/W2326159057","https://openalex.org/W4362730893","https://openalex.org/W2357965514","https://openalex.org/W2588244836","https://openalex.org/W161822665"],"abstract_inverted_index":{"Back-gated":[0],"carbon":[1],"nanotube":[2],"field-effect":[3],"transistors":[4],"have":[5],"been":[6],"fabricated":[7],"using":[8],"a":[9,50,75],"wafer-level":[10],"technology.":[11],"Source":[12],"and":[13,20],"drain":[14],"electrodes":[15],"are":[16],"structured":[17],"by":[18,37],"lift-off":[19],"wet":[21],"etching.":[22],"AFM":[23],"measurements":[24],"reveal":[25],"residual":[26,67],"contaminations":[27],"originating":[28],"from":[29,81],"structuring":[30],"processes.":[31],"We":[32,62,85],"investigate":[33],"the":[34,44,64,82],"particle":[35],"removal":[36,65],"an":[38],"oxygen":[39],"plasma":[40],"treatment":[41],"depending":[42],"on":[43,59],"process":[45],"time.":[46],"I/V":[47],"characterization":[48],"reveals":[49],"strong":[51],"dependency":[52],"of":[53,66,94],"transistor":[54,83,88],"characteristics,":[55],"especially":[56],"hysteresis":[57],"behavior,":[58],"surface":[60],"cleanliness.":[61],"find":[63],"particles":[68],"to":[69,77],"be":[70],"much":[71],"more":[72],"important":[73],"than":[74],"passivation":[76],"keep":[78],"water":[79],"molecules":[80],"region.":[84],"show":[86],"hysteresis-free":[87],"behavior":[89],"even":[90],"after":[91],"9":[92],"weeks":[93],"storage":[95],"in":[96],"air":[97],"without":[98],"passivation.":[99]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}