{"id":"https://openalex.org/W2062709761","doi":"https://doi.org/10.1109/nanoarch.2009.5226360","title":"Challenges in scalable fault tolerance","display_name":"Challenges in scalable fault tolerance","publication_year":2009,"publication_date":"2009-07-01","ids":{"openalex":"https://openalex.org/W2062709761","doi":"https://doi.org/10.1109/nanoarch.2009.5226360","mag":"2062709761"},"language":"en","primary_location":{"id":"doi:10.1109/nanoarch.2009.5226360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nanoarch.2009.5226360","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE/ACM International Symposium on Nanoscale Architectures","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003908930","display_name":"Patrick Lincoln","orcid":null},"institutions":[{"id":"https://openalex.org/I1298353152","display_name":"SRI International","ror":"https://ror.org/05s570m15","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I1298353152"]},{"id":"https://openalex.org/I4210099336","display_name":"Menlo School","ror":"https://ror.org/01240pn49","country_code":"US","type":"education","lineage":["https://openalex.org/I4210099336"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Patrick Lincoln","raw_affiliation_strings":["Computer Science Laboratory, SRI International, Inc., Menlo Park, CA, USA","Computer Science Laboratory, SRI International, Menlo Park, CA 94025, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science Laboratory, SRI International, Inc., Menlo Park, CA, USA","institution_ids":["https://openalex.org/I1298353152","https://openalex.org/I4210099336"]},{"raw_affiliation_string":"Computer Science Laboratory, SRI International, Menlo Park, CA 94025, USA#TAB#","institution_ids":["https://openalex.org/I1298353152"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5003908930"],"corresponding_institution_ids":["https://openalex.org/I1298353152","https://openalex.org/I4210099336"],"apc_list":null,"apc_paid":null,"fwci":2.9125,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.90467956,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"80","issue":null,"first_page":"13","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11948","display_name":"Machine Learning in Materials Science","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.8628059029579163},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7396511435508728},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7002996802330017},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6554544568061829},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5930526256561279},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5654435753822327},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5647673606872559},{"id":"https://openalex.org/keywords/dopant","display_name":"Dopant","score":0.48706796765327454},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.45888859033584595},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4193149209022522},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37386268377304077},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.34464505314826965},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.22812747955322266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14791467785835266},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.12290993332862854}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.8628059029579163},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7396511435508728},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7002996802330017},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6554544568061829},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5930526256561279},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5654435753822327},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5647673606872559},{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.48706796765327454},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.45888859033584595},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4193149209022522},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37386268377304077},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.34464505314826965},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.22812747955322266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14791467785835266},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12290993332862854},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/nanoarch.2009.5226360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/nanoarch.2009.5226360","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE/ACM International Symposium on Nanoscale Architectures","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W10024309","https://openalex.org/W2001992992","https://openalex.org/W2047507725","https://openalex.org/W2059139747","https://openalex.org/W2072104361","https://openalex.org/W2091844454","https://openalex.org/W2141174295","https://openalex.org/W3190058962"],"related_works":["https://openalex.org/W2130594209","https://openalex.org/W1950809481","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W2085988155","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2036953450","https://openalex.org/W4300955944"],"abstract_inverted_index":{"The":[0],"continued":[1],"scaling":[2],"of":[3,14,31,33,69,85,90,121,159],"device":[4,53,67],"dimensions":[5],"is":[6],"leading":[7],"toward":[8],"devices":[9,82],"where":[10],"only":[11],"a":[12,24,27,66,118],"handful":[13],"dopant":[15,48],"atoms":[16],"or":[17,38,52,62,114,140],"charges":[18],"can":[19,64,125],"make":[20],"the":[21,30],"difference":[22],"between":[23],"one":[25,157],"and":[26,55,71,88,101,129,134,143,147],"zero":[28],"in":[29,47,93,156],"state":[32],"represented":[34],"bit,":[35],"by":[36],"enhancing":[37],"depleting":[39],"channel":[40],"conduction.":[41],"Thus":[42,75],"very":[43,94],"minor":[44],"static":[45,86,99],"imperfections":[46],"distribution,":[49],"dielectric":[50],"properties,":[51],"geometry,":[54],"dynamic":[56,102],"conditions":[57],"associated":[58],"with":[59,83],"heat,":[60],"radiation,":[61],"aging":[63],"perturb":[65],"out":[68],"specification":[70],"cause":[72],"electrical":[73],"errors.":[74],"we":[76],"might":[77],"expect":[78],"to":[79,132,161,165],"soon":[80],"see":[81],"millions":[84],"defects":[87,100],"thousands":[89],"soft":[91],"errors":[92],"short":[95],"time":[96],"periods.":[97],"Both":[98],"faults":[103],"at":[104,117,169],"these":[105],"scales":[106],"present":[107],"huge":[108],"challenges.":[109],"Classical":[110],"methods":[111],"for":[112],"fault":[113],"defect":[115],"tolerance":[116],"higher":[119],"level":[120],"architecture":[122,160],"(eg.":[123],"N-modular-redundancy)":[124],"be":[126],"impractically":[127],"expensive,":[128],"some":[130],"approaches":[131],"diagnosis":[133],"reconfiguration":[135,144],"require":[136],"immense":[137],"reliable":[138,167],"memories":[139],"impractical":[141],"test":[142],"times.":[145],"Efficient":[146],"effective":[148],"means":[149],"are":[150],"needed":[151],"that":[152],"exploit":[153],"structure":[154],"inherent":[155],"layer":[158],"provide":[162],"key":[163],"properties":[164],"enable":[166],"execution":[168],"other":[170],"levels.":[171]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}