{"id":"https://openalex.org/W4402660163","doi":"https://doi.org/10.1109/mwscas60917.2024.10658910","title":"Systematic Design of Ring VCO-Based SNN - Translating Training Parameters to Circuits -","display_name":"Systematic Design of Ring VCO-Based SNN - Translating Training Parameters to Circuits -","publication_year":2024,"publication_date":"2024-08-11","ids":{"openalex":"https://openalex.org/W4402660163","doi":"https://doi.org/10.1109/mwscas60917.2024.10658910"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas60917.2024.10658910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas60917.2024.10658910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046498370","display_name":"Sai Sanjeet","orcid":"https://orcid.org/0000-0002-0959-3944"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sai Sanjeet","raw_affiliation_strings":["University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA"],"affiliations":[{"raw_affiliation_string":"University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104267966","display_name":"Sanchari Das","orcid":"https://orcid.org/0000-0003-0497-4032"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanchari Das","raw_affiliation_strings":["University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA"],"affiliations":[{"raw_affiliation_string":"University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033562869","display_name":"Shiuh-Hua Wood Chiang","orcid":"https://orcid.org/0000-0001-8091-6569"},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shiuh-Hua Wood Chiang","raw_affiliation_strings":["Brigham Young University,Department of ECE,Provo,UT,USA,84602"],"affiliations":[{"raw_affiliation_string":"Brigham Young University,Department of ECE,Provo,UT,USA,84602","institution_ids":["https://openalex.org/I100005738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["System Design Research Center, University of Tokyo,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"System Design Research Center, University of Tokyo,Tokyo,Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075623958","display_name":"Bibhu Datta Sahoo","orcid":"https://orcid.org/0000-0002-3563-9096"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bibhu Datta Sahoo","raw_affiliation_strings":["University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA"],"affiliations":[{"raw_affiliation_string":"University at Buffalo,Dept. of Electrical Eng.,Buffalo,NY,USA","institution_ids":["https://openalex.org/I63190737"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5046498370"],"corresponding_institution_ids":["https://openalex.org/I63190737"],"apc_list":null,"apc_paid":null,"fwci":0.8878,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74503214,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1212","last_page":"1216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5527294874191284},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.5370361804962158},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.5290892124176025},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4932202696800232},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.48645731806755066},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4150891602039337},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2789612114429474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21751779317855835},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19570201635360718},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19225838780403137},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.14563941955566406},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09757056832313538}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5527294874191284},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.5370361804962158},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.5290892124176025},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4932202696800232},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.48645731806755066},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4150891602039337},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2789612114429474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21751779317855835},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19570201635360718},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19225838780403137},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.14563941955566406},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09757056832313538},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas60917.2024.10658910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas60917.2024.10658910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1498101568","https://openalex.org/W1944085573","https://openalex.org/W1985940938","https://openalex.org/W2006370340","https://openalex.org/W2076964542","https://openalex.org/W2101586548","https://openalex.org/W2112796928","https://openalex.org/W2150355110","https://openalex.org/W2164653071","https://openalex.org/W2759281356","https://openalex.org/W2798878556","https://openalex.org/W2898323475","https://openalex.org/W2984844508","https://openalex.org/W2990793844","https://openalex.org/W4238614602","https://openalex.org/W4295312788","https://openalex.org/W4384947637","https://openalex.org/W4385679733","https://openalex.org/W6766978945"],"related_works":["https://openalex.org/W2070109416","https://openalex.org/W1523213765","https://openalex.org/W2040399070","https://openalex.org/W2388316590","https://openalex.org/W4388486464","https://openalex.org/W2380576078","https://openalex.org/W4384502435","https://openalex.org/W4200332348","https://openalex.org/W1557347312","https://openalex.org/W4384129951"],"abstract_inverted_index":{"Spiking":[0],"Neural":[1],"Networks":[2],"(SNNs)":[3],"are":[4,15,126],"a":[5,69],"class":[6],"of":[7,29,37,54,83,116,136],"neural":[8,20],"networks":[9],"that":[10],"mimic":[11],"biological":[12],"neurons":[13],"and":[14,32,58,90],"more":[16],"energy-efficient":[17],"than":[18],"conventional":[19],"networks.":[21],"The":[22,65,81,103,118],"neuron":[23,39,56,63,72,87,92],"model":[24,40,57,93],"is":[25,88,94,106],"the":[26,38,49,52,55,62,76,84,91,97,110,124,134,137],"building":[27],"block":[28],"an":[30,114],"SNN,":[31],"many":[33],"efficient":[34],"hardware":[35],"implementations":[36],"have":[41],"been":[42],"proposed.":[43],"This":[44],"work":[45,66],"aims":[46],"to":[47,100,108,132],"bridge":[48],"gap":[50],"between":[51],"design":[53,82],"training":[59,123],"SNNs":[60],"with":[61,113],"model.":[64],"focuses":[67],"on":[68],"ring":[70,85,138],"oscillator-based":[71,86,139],"model,":[73],"which":[74,128],"realizes":[75],"leaky":[77],"integrate-and-fire":[78],"(LIF)":[79],"neuron.":[80,140],"discussed,":[89,127],"digitized":[95],"using":[96],"bilinear":[98],"transform":[99],"enable":[101],"training.":[102],"trained":[104],"network":[105,125],"used":[107,121,131],"classify":[109],"MNIST":[111],"dataset":[112],"accuracy":[115],"97.35%.":[117],"circuit":[119,135],"parameters":[120],"for":[122],"can":[129],"be":[130],"build":[133]},"counts_by_year":[{"year":2025,"cited_by_count":4}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}