{"id":"https://openalex.org/W4391410263","doi":"https://doi.org/10.1109/mwscas57524.2023.10406100","title":"A Non-Linearity Digital Background Calibration Algorithm with Piece-Wise Linear Functions","display_name":"A Non-Linearity Digital Background Calibration Algorithm with Piece-Wise Linear Functions","publication_year":2023,"publication_date":"2023-08-06","ids":{"openalex":"https://openalex.org/W4391410263","doi":"https://doi.org/10.1109/mwscas57524.2023.10406100"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas57524.2023.10406100","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/mwscas57524.2023.10406100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101935544","display_name":"Ke Wu","orcid":"https://orcid.org/0000-0002-0190-3725"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ke Wu","raw_affiliation_strings":["Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112685090","display_name":"Yuekang Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuekang Guo","raw_affiliation_strings":["Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100409053","display_name":"Xiaoming Liu","orcid":"https://orcid.org/0000-0003-3467-5607"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Liu","raw_affiliation_strings":["Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","SJTU-Montage IC Design Frontier Technology Joint Lab"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"SJTU-Montage IC Design Frontier Technology Joint Lab","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052970732","display_name":"Jing Jin","orcid":"https://orcid.org/0000-0003-3584-5559"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Jin","raw_affiliation_strings":["Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","SJTU-Montage IC Design Frontier Technology Joint Lab"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"SJTU-Montage IC Design Frontier Technology Joint Lab","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052452787","display_name":"Howard C. Yang","orcid":"https://orcid.org/0009-0007-5572-4224"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Howard C. Yang","raw_affiliation_strings":["Montage Technology Co., Ltd.,Shanghai,China,200233","SJTU-Montage IC Design Frontier Technology Joint Lab"],"affiliations":[{"raw_affiliation_string":"Montage Technology Co., Ltd.,Shanghai,China,200233","institution_ids":[]},{"raw_affiliation_string":"SJTU-Montage IC Design Frontier Technology Joint Lab","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091076746","display_name":"Jianjun Zhou","orcid":"https://orcid.org/0000-0001-9898-7285"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianjun Zhou","raw_affiliation_strings":["Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","SJTU-Montage IC Design Frontier Technology Joint Lab"],"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,Center for Analog/RF Integrated Circuits (CARFIC),Department of Micro/Nano Electronics,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"SJTU-Montage IC Design Frontier Technology Joint Lab","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101935544"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18969942,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"609","last_page":"613"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8796466588973999},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.6199328899383545},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6051385998725891},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5937316417694092},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.47137200832366943},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4549694359302521},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.43547219038009644},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.43472516536712646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2938721179962158},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15853175520896912},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1453658640384674},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13487112522125244},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11711588501930237},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.10357600450515747},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09089559316635132}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8796466588973999},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.6199328899383545},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6051385998725891},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5937316417694092},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.47137200832366943},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4549694359302521},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.43547219038009644},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.43472516536712646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2938721179962158},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15853175520896912},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1453658640384674},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13487112522125244},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11711588501930237},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.10357600450515747},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09089559316635132}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas57524.2023.10406100","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/mwscas57524.2023.10406100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2032567604","https://openalex.org/W2101468035","https://openalex.org/W2104035023","https://openalex.org/W2118524348","https://openalex.org/W2136036096","https://openalex.org/W3090442715"],"related_works":["https://openalex.org/W2001787190","https://openalex.org/W3215377656","https://openalex.org/W4283744382","https://openalex.org/W2611248581","https://openalex.org/W72125279","https://openalex.org/W2786151210","https://openalex.org/W2157802116","https://openalex.org/W3047813805","https://openalex.org/W2544509054","https://openalex.org/W1977430766"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3],"novel":[4],"background":[5],"calibration":[6],"algorithm":[7,14,42],"for":[8],"amplifier":[9,47,80],"non-linearity":[10,49],"is":[11,28,43,50,64],"proposed.":[12],"This":[13],"utilizes":[15],"piece-wise":[16],"linear":[17,83],"function":[18],"(PWL)":[19],"to":[20,45,87],"compensate":[21],"gain":[22],"compression":[23],"caused":[24],"by":[25,30],"non-linearity.":[26],"Non-linearity":[27],"extracted":[29,51],"distribution":[31],"based":[32],"method":[33],"with":[34,66],"no":[35],"restriction":[36],"on":[37],"the":[38],"input's":[39],"distribution.":[40],"The":[41,70],"employed":[44],"an":[46],"whose":[48],"from":[52],"circuitry":[53],"simulation.":[54],"A":[55],"total":[56],"harmonic":[57],"distortion":[58],"(THD)":[59],"reduction":[60],"of":[61,96],"24.98":[62],"dB":[63],"observed":[65],"half":[67],"full-scale":[68],"input.":[69],"maximum":[71],"and":[72,81,89,94],"root":[73],"mean":[74],"square":[75],"(RMS)":[76],"error":[77],"between":[78],"calibrated":[79],"ideal":[82],"system":[84],"are":[85,92],"reduced":[86],"3.76e-04":[88],"2.04e-04,":[90],"which":[91],"3.31%":[93],"4.79%":[95],"their":[97],"uncalibrated":[98],"value.":[99]},"counts_by_year":[],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}