{"id":"https://openalex.org/W4292862436","doi":"https://doi.org/10.1109/mwscas54063.2022.9859464","title":"Enhanced laser trimming of thin film resistors dedicated to snubber for high power IGBT modules","display_name":"Enhanced laser trimming of thin film resistors dedicated to snubber for high power IGBT modules","publication_year":2022,"publication_date":"2022-08-07","ids":{"openalex":"https://openalex.org/W4292862436","doi":"https://doi.org/10.1109/mwscas54063.2022.9859464"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas54063.2022.9859464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas54063.2022.9859464","pdf_url":null,"source":{"id":"https://openalex.org/S4363606568","display_name":"2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044949131","display_name":"Ryosuke Watanabe","orcid":"https://orcid.org/0000-0003-4083-6876"},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryosuke Watanabe","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017268413","display_name":"Shigeru Hidaka","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shigeru Hidaka","raw_affiliation_strings":["Nikkohm.co.,Ltd"],"affiliations":[{"raw_affiliation_string":"Nikkohm.co.,Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021093813","display_name":"Tomoya Akasaka","orcid":null},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoya Akasaka","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064284448","display_name":"Shota Kajiya","orcid":null},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shota Kajiya","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056234625","display_name":"Taisei Arima","orcid":null},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taisei Arima","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108528404","display_name":"Atsushi Kurokawa","orcid":null},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Kurokawa","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067005883","display_name":"Toshiki Kanamoto","orcid":"https://orcid.org/0000-0002-6326-6960"},"institutions":[{"id":"https://openalex.org/I146516829","display_name":"Hirosaki University","ror":"https://ror.org/02syg0q74","country_code":"JP","type":"education","lineage":["https://openalex.org/I146516829"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiki Kanamoto","raw_affiliation_strings":["Hirosaki University,Aomori,Japan","Hirosaki University, Aomori, Japan"],"affiliations":[{"raw_affiliation_string":"Hirosaki University,Aomori,Japan","institution_ids":["https://openalex.org/I146516829"]},{"raw_affiliation_string":"Hirosaki University, Aomori, Japan","institution_ids":["https://openalex.org/I146516829"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5044949131"],"corresponding_institution_ids":["https://openalex.org/I146516829"],"apc_list":null,"apc_paid":null,"fwci":0.3219,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.38699853,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.9221086502075195},{"id":"https://openalex.org/keywords/trimming","display_name":"Trimming","score":0.7831668853759766},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.6787009835243225},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6383589506149292},{"id":"https://openalex.org/keywords/snubber","display_name":"Snubber","score":0.5138635635375977},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.47286462783813477},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46351635456085205},{"id":"https://openalex.org/keywords/thermal-resistance","display_name":"Thermal resistance","score":0.43830546736717224},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39482080936431885},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.38681524991989136},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.38541194796562195},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3362274169921875},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.25005966424942017},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2234111726284027},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.17539677023887634},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09567588567733765}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.9221086502075195},{"id":"https://openalex.org/C56951928","wikidata":"https://www.wikidata.org/wiki/Q3539213","display_name":"Trimming","level":2,"score":0.7831668853759766},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.6787009835243225},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6383589506149292},{"id":"https://openalex.org/C58018660","wikidata":"https://www.wikidata.org/wiki/Q1975192","display_name":"Snubber","level":4,"score":0.5138635635375977},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47286462783813477},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46351635456085205},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.43830546736717224},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39482080936431885},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.38681524991989136},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38541194796562195},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3362274169921875},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.25005966424942017},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2234111726284027},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.17539677023887634},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09567588567733765},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas54063.2022.9859464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas54063.2022.9859464","pdf_url":null,"source":{"id":"https://openalex.org/S4363606568","display_name":"2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.47999998927116394,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1603741466","https://openalex.org/W1892607062","https://openalex.org/W1963815418","https://openalex.org/W1965132430","https://openalex.org/W1985537067","https://openalex.org/W2096412144","https://openalex.org/W2100867759","https://openalex.org/W2126223796","https://openalex.org/W2128678913","https://openalex.org/W2129515555","https://openalex.org/W2165643028","https://openalex.org/W2170558092","https://openalex.org/W2480920908","https://openalex.org/W2564252964","https://openalex.org/W2579125710","https://openalex.org/W2775131437","https://openalex.org/W2899767770","https://openalex.org/W2982351671","https://openalex.org/W3014379575","https://openalex.org/W3088661771","https://openalex.org/W3184336217"],"related_works":["https://openalex.org/W1963782900","https://openalex.org/W757300213","https://openalex.org/W2107130353","https://openalex.org/W2095021519","https://openalex.org/W2350318811","https://openalex.org/W2122185700","https://openalex.org/W3038120056","https://openalex.org/W1908815677","https://openalex.org/W2155601168","https://openalex.org/W4292862436"],"abstract_inverted_index":{"This":[0],"paper":[1,60],"reveals":[2],"a":[3,12],"durable":[4],"trimming":[5,70],"condition":[6],"of":[7,14,43,67,84,92],"thin":[8],"film":[9],"resistors":[10,37,45],"as":[11],"part":[13],"snubber":[15],"circuits":[16],"in":[17],"high":[18],"power":[19,50],"electronic":[20],"modules":[21],"including":[22],"IGBT":[23],"converters.":[24],"Our":[25],"previous":[26],"study":[27],"clarified":[28],"that":[29,65,80],"the":[30,36,44,48,68,73,81,85,93,103],"maximum":[31],"voltage":[32],"to":[33,35,47,98,102],"apply":[34],"is":[38],"limited":[39],"by":[40],"thermal":[41,74],"destruction":[42],"due":[46],"pulsed":[49],"injection.":[51],"With":[52],"careful":[53],"failure":[54],"analysis":[55,77],"and":[56],"surface":[57],"observations,":[58],"this":[59],"provides":[61],"an":[62],"additional":[63],"insight":[64],"dimensions":[66,83],"indispensable":[69],"patterns":[71],"affect":[72],"destruction.":[75],"Electro-thermal":[76],"results":[78],"show":[79],"optimized":[82],"trimmed":[86],"shapes":[87],"can":[88],"suppress":[89],"temperature":[90],"rise":[91],"most":[94,104],"critical":[95],"area":[96],"up":[97],"one":[99],"sixth":[100],"compared":[101],"pessimistic":[105],"shape.":[106]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}