{"id":"https://openalex.org/W3083736218","doi":"https://doi.org/10.1109/mwscas48704.2020.9184655","title":"Neural Networks for Authenticating Integrated Circuits Based on Intrinsic Nonlinearity","display_name":"Neural Networks for Authenticating Integrated Circuits Based on Intrinsic Nonlinearity","publication_year":2020,"publication_date":"2020-08-01","ids":{"openalex":"https://openalex.org/W3083736218","doi":"https://doi.org/10.1109/mwscas48704.2020.9184655","mag":"3083736218"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas48704.2020.9184655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas48704.2020.9184655","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043846253","display_name":"Sudarsan Sadasivuni","orcid":"https://orcid.org/0000-0002-9008-8426"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudarsan Sadasivuni","raw_affiliation_strings":["Electrical Engineering Department, University at Buffalo, Buffalo, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University at Buffalo, Buffalo, NY","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057502115","display_name":"Sanjeev Tannirkulam Chandrasekaran","orcid":"https://orcid.org/0000-0002-2162-7676"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanjeev Tannirkulam Chandrasekaran","raw_affiliation_strings":["Electrical Engineering Department, University at Buffalo, Buffalo, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University at Buffalo, Buffalo, NY","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086745874","display_name":"Akshay Jayaraj","orcid":"https://orcid.org/0000-0002-6571-6347"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Akshay Jayaraj","raw_affiliation_strings":["Intel Corporation, Folsom, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Folsom, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005496543","display_name":"Arindam Sanyal","orcid":"https://orcid.org/0000-0003-4045-6291"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arindam Sanyal","raw_affiliation_strings":["Electrical Engineering Department, University at Buffalo, Buffalo, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University at Buffalo, Buffalo, NY","institution_ids":["https://openalex.org/I63190737"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1062396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"253","last_page":"256"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.64396733045578},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.6342604160308838},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.621009111404419},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5932655334472656},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5794645547866821},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4873989224433899},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4528716802597046},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3527742624282837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18848863244056702},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1414029598236084},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1089637279510498}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.64396733045578},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.6342604160308838},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.621009111404419},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5932655334472656},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5794645547866821},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4873989224433899},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4528716802597046},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3527742624282837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18848863244056702},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1414029598236084},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1089637279510498},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas48704.2020.9184655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas48704.2020.9184655","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2095089117","https://openalex.org/W2116374153","https://openalex.org/W2149789327","https://openalex.org/W2151759197","https://openalex.org/W2166481425","https://openalex.org/W2295460135","https://openalex.org/W2475301434","https://openalex.org/W2745051470","https://openalex.org/W2903659608","https://openalex.org/W3015432021","https://openalex.org/W4255375128","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2042495646","https://openalex.org/W2610414734"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,33,42,66,72,113],"machine":[4,43],"learning":[5,44],"approach":[6],"to":[7,46],"identify":[8,104],"integrated":[9,30],"circuits":[10],"based":[11],"on":[12],"intrinsic":[13],"nonlinearity":[14,35,82],"arising":[15],"out":[16],"of":[17,60,117],"random":[18,25],"variations":[19,26],"introduced":[20],"during":[21],"device":[22],"fabrication.":[23],"The":[24,76],"ensure":[27],"that":[28],"each":[29,110],"circuit":[31],"has":[32],"distinct":[34],"signature":[36],"which":[37],"can":[38,103],"be":[39],"analyzed":[40,57],"by":[41],"model":[45],"distinguish":[47],"between":[48],"chips":[49,108],"fabricated":[50],"from":[51],"the":[52,88,95,105],"same":[53],"mask.":[54],"We":[55],"have":[56,79],"multiple":[58],"samples":[59],"two":[61,77],"analog-to-digital":[62],"converters":[63],"(ADCs)":[64],"-":[65,84],"continuous-time":[67],"\u0394\u03a3":[68],"oversampled":[69,89],"ADC":[70,90,111],"and":[71,91],"discrete-time":[73],"nyquist":[74,96],"ADC.":[75,97],"ADCs":[78],"different":[80,106],"dominant":[81],"contributors":[83],"inter-symbol":[85],"interference":[86],"for":[87,94,109],"static":[92],"mismatch":[93],"A":[98],"3-layer":[99],"artificial":[100],"neural":[101],"network":[102],"sample":[107],"with":[112],"worst-case":[114],"mean":[115],"accuracy":[116],"95.97%.":[118]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}