{"id":"https://openalex.org/W3083141821","doi":"https://doi.org/10.1109/mwscas48704.2020.9184536","title":"Gem5Panalyzer: A Light-weight tool for Early-stage Architectural Reliability Evaluation & Prediction","display_name":"Gem5Panalyzer: A Light-weight tool for Early-stage Architectural Reliability Evaluation & Prediction","publication_year":2020,"publication_date":"2020-08-01","ids":{"openalex":"https://openalex.org/W3083141821","doi":"https://doi.org/10.1109/mwscas48704.2020.9184536","mag":"3083141821"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas48704.2020.9184536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas48704.2020.9184536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036693137","display_name":"Hao Qiu","orcid":"https://orcid.org/0000-0002-3944-9740"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hao Qiu","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004128038","display_name":"Xiaoxing Qiu","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoxing Qiu","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053897101","display_name":"Semiu A. Olowogemo","orcid":"https://orcid.org/0000-0002-4788-956X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Semiu A. Olowogemo","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025491346","display_name":"Bor-Tyng Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bor-Tyng Lin","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106128999","display_name":"William H. Robinson","orcid":"https://orcid.org/0000-0001-9291-689X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William H. Robinson","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060550690","display_name":"Daniel B. Limbrick","orcid":null},"institutions":[{"id":"https://openalex.org/I35777872","display_name":"North Carolina Agricultural and Technical State University","ror":"https://ror.org/02aze4h65","country_code":"US","type":"education","lineage":["https://openalex.org/I35777872"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel B. Limbrick","raw_affiliation_strings":["Department of Electrical and Computer Engineering, North Carolina A&T State University, Greensboro, NC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, North Carolina A&T State University, Greensboro, NC","institution_ids":["https://openalex.org/I35777872"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3578,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45604499,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"482","last_page":"485"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8047375679016113},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6203647255897522},{"id":"https://openalex.org/keywords/extensibility","display_name":"Extensibility","score":0.5134811997413635},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5111344456672668},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.508236825466156},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4615902900695801},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4406789243221283},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.41566166281700134},{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.4116727113723755},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.38937556743621826},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.35387271642684937},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.27362120151519775},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14427727460861206},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13596314191818237},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.09025424718856812},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08902925252914429}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8047375679016113},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6203647255897522},{"id":"https://openalex.org/C32833848","wikidata":"https://www.wikidata.org/wiki/Q4115054","display_name":"Extensibility","level":2,"score":0.5134811997413635},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5111344456672668},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.508236825466156},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4615902900695801},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4406789243221283},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.41566166281700134},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.4116727113723755},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38937556743621826},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.35387271642684937},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.27362120151519775},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14427727460861206},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13596314191818237},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.09025424718856812},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08902925252914429},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas48704.2020.9184536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas48704.2020.9184536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1970633569","https://openalex.org/W1978401104","https://openalex.org/W2062623691","https://openalex.org/W2122224409","https://openalex.org/W2123907700","https://openalex.org/W2144512449","https://openalex.org/W2147657366","https://openalex.org/W2522581075","https://openalex.org/W2529578574","https://openalex.org/W2626574314","https://openalex.org/W2757265493","https://openalex.org/W2902078285","https://openalex.org/W2982579275","https://openalex.org/W4233440120","https://openalex.org/W4249144718","https://openalex.org/W6637151178"],"related_works":["https://openalex.org/W1948607442","https://openalex.org/W3004004161","https://openalex.org/W2044615423","https://openalex.org/W4247766898","https://openalex.org/W4244765761","https://openalex.org/W2361584951","https://openalex.org/W2365327041","https://openalex.org/W4225348249","https://openalex.org/W31122515","https://openalex.org/W2466086502"],"abstract_inverted_index":{"Aggressive":[0],"technology":[1],"scaling":[2],"boosts":[3],"the":[4,10,37,46,72,84,105,108,115,124],"embedded":[5],"processor":[6],"performance":[7,110],"but":[8],"deteriorates":[9],"system":[11],"resilience":[12],"to":[13,99],"soft":[14],"errors.":[15],"To":[16],"balance":[17],"trade-offs":[18],"between":[19],"reliability":[20,30,75],"and":[21,52,64,76,97],"design":[22],"overheads,":[23],"we":[24],"developed":[25],"Gem5Panalyzer:":[26],"a":[27,54,92,137],"novel":[28],"light-weight":[29],"evaluation":[31],"tool":[32,70],"built":[33],"on":[34,49,136],"top":[35],"of":[36,45,68,74,86,130,141],"gem5":[38],"simulator.":[39],"It":[40],"computes":[41],"vulnerability":[42],"factors":[43],"(VFs)":[44],"programs":[47],"running":[48],"ARMv7-like":[50],"CPUs":[51],"constructs":[53],"dataset":[55],"for":[56,104],"machine":[57,77],"learning":[58],"studies.":[59],"Gem5Panalyzer":[60,81],"features":[61],"satisfactory":[62],"compatibility":[63],"extensibility.":[65],"Another":[66],"highlight":[67],"our":[69],"is":[71,133],"integration":[73],"learning.":[78],"We":[79],"validated":[80],"by":[82],"evaluating":[83],"behavior":[85],"selected":[87],"MiBench":[88],"programs'":[89],"VFs.":[90],"Additionally,":[91],"study":[93],"using":[94],"Neural":[95],"Network":[96],"Gem5Panalyer":[98],"predict":[100],"VFs":[101,129],"shows":[102],"that":[103,126],"qsort":[106],"application,":[107],"predictor":[109],"has":[111],"become":[112],"saturated":[113],"when":[114],"training":[116],"set":[117],"size":[118],"reaches":[119],"43%.":[120],"This":[121],"finding":[122],"attests":[123],"idea":[125],"predicting":[127],"future":[128],"large":[131],"applications":[132],"possible":[134],"based":[135],"limited":[138],"prior":[139],"knowledge":[140],"vulnerability.":[142]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}