{"id":"https://openalex.org/W2756922823","doi":"https://doi.org/10.1109/mwscas.2017.8053150","title":"Design techniques for in-field memristor forming circuits","display_name":"Design techniques for in-field memristor forming circuits","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2756922823","doi":"https://doi.org/10.1109/mwscas.2017.8053150","mag":"2756922823"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8053150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053150","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073702088","display_name":"Sherif Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]},{"id":"https://openalex.org/I2802706902","display_name":"Knoxville College","ror":"https://ror.org/02bxrp522","country_code":"US","type":"education","lineage":["https://openalex.org/I2802706902"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sherif Amer","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, Knoxville, Tennessee, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, Knoxville, Tennessee, USA","institution_ids":["https://openalex.org/I2802706902","https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047248181","display_name":"Garrett S. Rose","orcid":"https://orcid.org/0000-0003-3070-4087"},"institutions":[{"id":"https://openalex.org/I2802706902","display_name":"Knoxville College","ror":"https://ror.org/02bxrp522","country_code":"US","type":"education","lineage":["https://openalex.org/I2802706902"]},{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Garrett S. Rose","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, Knoxville, Tennessee, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, Knoxville, Tennessee, USA","institution_ids":["https://openalex.org/I2802706902","https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057893866","display_name":"Karsten Beckmann","orcid":"https://orcid.org/0000-0001-6592-7825"},"institutions":[{"id":"https://openalex.org/I90965887","display_name":"SUNY Polytechnic Institute","ror":"https://ror.org/000fxgx19","country_code":"US","type":"education","lineage":["https://openalex.org/I90965887"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karsten Beckmann","raw_affiliation_strings":["Colleges of Nanoscale Science & Engineering, SUNY Polytechnic Institute, Albany, New York"],"affiliations":[{"raw_affiliation_string":"Colleges of Nanoscale Science & Engineering, SUNY Polytechnic Institute, Albany, New York","institution_ids":["https://openalex.org/I90965887"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046312510","display_name":"Nathaniel C. Cady","orcid":"https://orcid.org/0000-0003-4345-3627"},"institutions":[{"id":"https://openalex.org/I90965887","display_name":"SUNY Polytechnic Institute","ror":"https://ror.org/000fxgx19","country_code":"US","type":"education","lineage":["https://openalex.org/I90965887"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathaniel C. Cady","raw_affiliation_strings":["Colleges of Nanoscale Science & Engineering, SUNY Polytechnic Institute, Albany, New York"],"affiliations":[{"raw_affiliation_string":"Colleges of Nanoscale Science & Engineering, SUNY Polytechnic Institute, Albany, New York","institution_ids":["https://openalex.org/I90965887"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5073702088"],"corresponding_institution_ids":["https://openalex.org/I2802706902","https://openalex.org/I75027704"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.59749384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1224","last_page":"1227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.8003304600715637},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7179061770439148},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5789071321487427},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5313267111778259},{"id":"https://openalex.org/keywords/forming-processes","display_name":"Forming processes","score":0.49635154008865356},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4945978820323944},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.4717565178871155},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46457183361053467},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.46087294816970825},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42428433895111084},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.42015576362609863},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3596533536911011},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33547520637512207},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.17739075422286987}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.8003304600715637},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7179061770439148},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5789071321487427},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5313267111778259},{"id":"https://openalex.org/C139321929","wikidata":"https://www.wikidata.org/wiki/Q1363994","display_name":"Forming processes","level":2,"score":0.49635154008865356},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4945978820323944},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.4717565178871155},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46457183361053467},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.46087294816970825},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42428433895111084},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.42015576362609863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3596533536911011},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33547520637512207},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.17739075422286987},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2017.8053150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053150","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1980591704","https://openalex.org/W2004823737","https://openalex.org/W2112181056","https://openalex.org/W2400475751","https://openalex.org/W2536013505","https://openalex.org/W2581659390","https://openalex.org/W2760384882","https://openalex.org/W6732743503"],"related_works":["https://openalex.org/W1976724132","https://openalex.org/W4200202288","https://openalex.org/W2018547716","https://openalex.org/W2145001846","https://openalex.org/W2170642797","https://openalex.org/W962052505","https://openalex.org/W2941936807","https://openalex.org/W2756922823","https://openalex.org/W1967188269","https://openalex.org/W3022845349"],"abstract_inverted_index":{"This":[0],"work":[1,73,171],"presents":[2],"circuit":[3,37,75,119],"design":[4,109,120],"techniques":[5],"for":[6,49,82,110,123,156,162],"infield":[7],"forming":[8,18,36,51,56,65,84,130,139,163,175,184],"of":[9,28,34,63,103,114,126,183],"metal-oxide":[10],"memristor-based":[11,40],"systems.":[12],"While":[13],"several":[14],"works":[15],"have":[16],"addressed":[17,70],"from":[19],"a":[20,35,39,111,118,158],"device":[21,105,168],"characterization":[22],"stand":[23],"point,":[24],"to":[25,98,131,152,179],"the":[26,29,32,54,64,92,100,104,108,145,154,174,181],"best":[27],"authors'":[30],"knowledge,":[31],"integration":[33,182],"in":[38,71,85,164,177,186],"application":[41],"hasn't":[42],"been":[43],"thoroughly":[44],"studied.":[45],"Two":[46],"challenges":[47,68],"exist":[48],"in-field":[50],"which":[52],"are":[53,69,78],"high":[55,93],"voltages":[57],"required":[58],"and":[59,74,106],"SPICE":[60,165],"level":[61,76],"modeling":[62],"process.":[66],"Both":[67],"this":[72],"solutions":[77],"provided.":[79],"A":[80],"method":[81],"incorporating":[83],"memristor":[86,187],"models":[87],"is":[88,121,136,140,150],"proposed":[89],"via":[90],"increasing":[91],"resistance":[94,102],"state":[95],"(HRS)":[96],"value":[97],"mimic":[99],"pre-forming":[101,115],"simulating":[107],"wide":[112],"range":[113],"resistances.":[116],"Also,":[117,167],"presented":[122],"proper":[124],"isolation":[125],"peripheral":[127,147],"circuitry":[128],"during":[129],"avoid":[132],"any":[133],"malfunction.":[134],"It":[135,149],"shown":[137],"that":[138],"executed":[141],"successfully":[142],"without":[143],"disrupting":[144],"CMOS":[146],"circuitry.":[148],"important":[151],"highlight":[153],"need":[155],"developing":[157],"concise":[159],"physical":[160],"model":[161],"environment.":[166],"designers":[169],"should":[170],"on":[172],"lowering":[173],"voltage":[176],"order":[178],"ease":[180],"circuits":[185],"based":[188],"applications.":[189]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}