{"id":"https://openalex.org/W2758349999","doi":"https://doi.org/10.1109/mwscas.2017.8053081","title":"The effect of power supply ramp time on SRAM PUFs","display_name":"The effect of power supply ramp time on SRAM PUFs","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2758349999","doi":"https://doi.org/10.1109/mwscas.2017.8053081","mag":"2758349999"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8053081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046324977","display_name":"Abdelrahman Tarief Elshafiey","orcid":"https://orcid.org/0000-0002-7416-4468"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Abdelrahman T. Elshafiey","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018095974","display_name":"Payman Zarkesh-Ha","orcid":"https://orcid.org/0000-0002-0571-9212"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Payman Zarkesh-Ha","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081435365","display_name":"Joshua Trujillo","orcid":null},"institutions":[{"id":"https://openalex.org/I82514191","display_name":"Honeywell (United States)","ror":"https://ror.org/02t71h845","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joshua Trujillo","raw_affiliation_strings":["Department of Energy's National Security Campus, Managed by Honeywell, Kansas City, MO, USA"],"affiliations":[{"raw_affiliation_string":"Department of Energy's National Security Campus, Managed by Honeywell, Kansas City, MO, USA","institution_ids":["https://openalex.org/I82514191"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5046324977"],"corresponding_institution_ids":["https://openalex.org/I169521973"],"apc_list":null,"apc_paid":null,"fwci":0.9264,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.75665399,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"946","last_page":"949"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9072476625442505},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5478808283805847},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.5380181074142456},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5033356547355652},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4849698543548584},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4835788607597351},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4453165829181671},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4305431544780731},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35933035612106323},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.332475483417511},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.33183491230010986},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2441813051700592},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11591553688049316}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9072476625442505},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5478808283805847},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.5380181074142456},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5033356547355652},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4849698543548584},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4835788607597351},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4453165829181671},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4305431544780731},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35933035612106323},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.332475483417511},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.33183491230010986},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2441813051700592},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11591553688049316},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mwscas.2017.8053081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalrepository.unm.edu:ece_etds-1338","is_oa":false,"landing_page_url":"https://digitalrepository.unm.edu/ece_etds/342","pdf_url":null,"source":{"id":"https://openalex.org/S4377196368","display_name":"UNM\u2019s Digital Repository (University of New Mexico)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I169521973","host_organization_name":"University of New Mexico","host_organization_lineage":["https://openalex.org/I169521973"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical and Computer Engineering ETDs","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.75,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1605172130","https://openalex.org/W2002734120","https://openalex.org/W2003763828","https://openalex.org/W2088455835","https://openalex.org/W2113322447","https://openalex.org/W2116374153","https://openalex.org/W2123482651","https://openalex.org/W2149648080","https://openalex.org/W2169212403","https://openalex.org/W2289458927","https://openalex.org/W2483049553","https://openalex.org/W3151293064","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2172029144","https://openalex.org/W2136081556","https://openalex.org/W2168341847","https://openalex.org/W1879217782","https://openalex.org/W2463150728","https://openalex.org/W2012536985","https://openalex.org/W2155160465","https://openalex.org/W2119025037"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"for":[3,39],"the":[4,11,23,37,40,47,66,103,109,122],"first":[5],"time,":[6],"it":[7],"is":[8],"demonstrated":[9],"that":[10,45,56],"start-up":[12,50],"value":[13],"of":[14,61,111],"an":[15],"SRAM":[16,24,48,79],"PUF":[17,49],"could":[18,69],"be":[19,71],"different":[20,72],"depending":[21],"on":[22,98],"power":[25,41],"supply":[26,42],"rising":[27,105],"time.":[28],"An":[29,78],"analytical":[30,123],"model":[31],"has":[32,53],"been":[33,54],"developed":[34],"to":[35,76],"determine":[36],"range":[38],"ramp":[43],"time":[44,106],"affects":[46],"value.":[51],"It":[52],"found":[55],"there":[57],"are":[58],"two":[59],"regions":[60],"operation.":[62],"As":[63],"a":[64],"result,":[65],"generated":[67],"key":[68],"possibly":[70],"from":[73],"one":[74],"region":[75],"another.":[77],"test":[80],"chip":[81],"was":[82],"designed":[83],"and":[84,118],"fabricated":[85],"using":[86,102],"Tower":[87],"Jazz's":[88],"180":[89],"nanometer":[90],"Silicon":[91],"Germanium":[92],"(SiGe)":[93],"Bipolar/CMOS":[94],"(BiCMOS)":[95],"process.":[96],"Based":[97],"our":[99],"measured":[100],"data,":[101],"appropriate":[104],"can":[107],"decrease":[108],"number":[110],"flipping":[112],"bits":[113],"by":[114],"5%.":[115],"Both":[116],"simulation":[117],"silicon":[119],"results":[120],"confirms":[121],"model.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}