{"id":"https://openalex.org/W2757094238","doi":"https://doi.org/10.1109/mwscas.2017.8053080","title":"Analysis of a novel stage configurable ROPUF design","display_name":"Analysis of a novel stage configurable ROPUF design","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2757094238","doi":"https://doi.org/10.1109/mwscas.2017.8053080","mag":"2757094238"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8053080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053080","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017985970","display_name":"Muhtadi Choudhury","orcid":null},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Muhtadi Choudhury","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of Toledo"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of Toledo","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074761519","display_name":"Nitin Pundir","orcid":"https://orcid.org/0000-0001-5687-6237"},"institutions":[{"id":"https://openalex.org/I65079550","display_name":"Universiti Malaysia Perlis","ror":"https://ror.org/00xmkb790","country_code":"MY","type":"education","lineage":["https://openalex.org/I65079550"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nitin Pundir","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Universiti Malaysia, Perlis"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Universiti Malaysia, Perlis","institution_ids":["https://openalex.org/I65079550"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014613583","display_name":"Mohammed Niamat","orcid":"https://orcid.org/0000-0002-1896-1569"},"institutions":[{"id":"https://openalex.org/I90871651","display_name":"University of Toledo","ror":"https://ror.org/01pbdzh19","country_code":"US","type":"education","lineage":["https://openalex.org/I90871651"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed Niamat","raw_affiliation_strings":["University of Toledo, Toledo, OH, US"],"affiliations":[{"raw_affiliation_string":"University of Toledo, Toledo, OH, US","institution_ids":["https://openalex.org/I90871651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058941262","display_name":"Muslim Mustapa","orcid":null},"institutions":[{"id":"https://openalex.org/I65079550","display_name":"Universiti Malaysia Perlis","ror":"https://ror.org/00xmkb790","country_code":"MY","type":"education","lineage":["https://openalex.org/I65079550"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Muslim Mustapa","raw_affiliation_strings":["Universiti Malaysia Perlis, Arau, Perlis, MY"],"affiliations":[{"raw_affiliation_string":"Universiti Malaysia Perlis, Arau, Perlis, MY","institution_ids":["https://openalex.org/I65079550"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5017985970"],"corresponding_institution_ids":["https://openalex.org/I90871651"],"apc_list":null,"apc_paid":null,"fwci":1.3519,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.8258126,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"942","last_page":"945"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.7610579133033752},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6722898483276367},{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.647307813167572},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6205214262008667},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5715781450271606},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5222633481025696},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.49163395166397095},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.45806485414505005},{"id":"https://openalex.org/keywords/aliasing","display_name":"Aliasing","score":0.4199938476085663},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36801058053970337},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36628466844558716},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3377534747123718},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2497633993625641},{"id":"https://openalex.org/keywords/arbiter","display_name":"Arbiter","score":0.2229900062084198},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18984389305114746},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13572993874549866}],"concepts":[{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.7610579133033752},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6722898483276367},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.647307813167572},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6205214262008667},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5715781450271606},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5222633481025696},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.49163395166397095},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.45806485414505005},{"id":"https://openalex.org/C4069607","wikidata":"https://www.wikidata.org/wiki/Q868732","display_name":"Aliasing","level":3,"score":0.4199938476085663},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36801058053970337},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36628466844558716},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3377534747123718},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2497633993625641},{"id":"https://openalex.org/C2779971761","wikidata":"https://www.wikidata.org/wiki/Q629872","display_name":"Arbiter","level":2,"score":0.2229900062084198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18984389305114746},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13572993874549866},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2017.8053080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053080","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4000000059604645,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1662485564","https://openalex.org/W1680600764","https://openalex.org/W1968261083","https://openalex.org/W1990512559","https://openalex.org/W2060967598","https://openalex.org/W2070196900","https://openalex.org/W2116374153","https://openalex.org/W2126460857","https://openalex.org/W2135064681","https://openalex.org/W2141682861","https://openalex.org/W2167232152","https://openalex.org/W2188861796","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W2093731983","https://openalex.org/W4389544506","https://openalex.org/W2128735154","https://openalex.org/W2333684670","https://openalex.org/W4391377915","https://openalex.org/W2525030438","https://openalex.org/W2126460857","https://openalex.org/W2135064681","https://openalex.org/W2004058644","https://openalex.org/W2901002898"],"abstract_inverted_index":{"Silicon":[0],"based":[1,33,59],"Physical":[2],"Unclonable":[3],"Function":[4],"(SPUF),":[5],"a":[6,64],"chip":[7],"level":[8],"identifier":[9],"that":[10],"utilizes":[11],"the":[12,70,87,99,109,116,127,134],"inherent":[13],"irregular":[14],"manufacturing":[15],"process":[16],"variations,":[17],"can":[18],"be":[19,124],"extended":[20],"to":[21,98,123],"Ring":[22],"Oscillator":[23],"PUFs":[24],"(ROPUFs).":[25],"The":[26,75],"ROPUF":[27,56],"structure,":[28],"although":[29],"promising":[30],"for":[31,113],"FPGA":[32],"platforms,":[34],"is":[35,77,94,121],"not":[36],"area":[37,52],"efficient":[38,53],"in":[39],"terms":[40],"of":[41,133],"response":[42],"bit":[43],"per":[44],"RO":[45],"circuit":[46],"implementation.":[47],"This":[48],"paper":[49],"introduces":[50],"an":[51],"Stage":[54],"Configurable":[55],"(SCROPUF)":[57],"design":[58,76],"on":[60,79],"XOR":[61],"gates":[62],"and":[63,105],"functional":[65],"block":[66],"which":[67],"significantly":[68],"increases":[69],"output":[71,88],"frequency":[72,89],"comparison":[73],"pairs.":[74],"implemented":[78],"six":[80],"Xilinx":[81],"Artix-7":[82],"FPGAs.":[83],"In":[84],"this":[85],"work,":[86],"data":[90],"from":[91],"125":[92],"SCROs":[93],"evaluated":[95],"with":[96,108],"regard":[97],"following":[100],"quality":[101],"factors:":[102],"uniqueness,":[103],"uniformity,":[104],"bit-aliasing":[106],"along":[107],"NIST":[110],"statistical":[111],"tests":[112],"randomness.":[114],"Also,":[115],"average":[117],"static":[118],"intra-chip":[119],"variation":[120],"shown":[122],"higher":[125,131],"than":[126],"noise":[128],"component":[129],"signifying":[130],"reliability":[132],"design.":[135]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2026-02-02T03:55:41.653505","created_date":"2025-10-10T00:00:00"}