{"id":"https://openalex.org/W2757071212","doi":"https://doi.org/10.1109/mwscas.2017.8053064","title":"Self-powered continuous time-temperature monitoring for cold-chain management","display_name":"Self-powered continuous time-temperature monitoring for cold-chain management","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2757071212","doi":"https://doi.org/10.1109/mwscas.2017.8053064","mag":"2757071212"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8053064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091548065","display_name":"Liang Zhou","orcid":"https://orcid.org/0000-0001-9939-4502"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Liang Zhou","raw_affiliation_strings":["Department of Electrical and Systems Engineering, Washington University in St. Louis, St. Louis, MO, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Systems Engineering, Washington University in St. Louis, St. Louis, MO, U.S.A","institution_ids":["https://openalex.org/I204465549"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034498144","display_name":"Shantanu Chakrabartty","orcid":"https://orcid.org/0000-0002-1688-6286"},"institutions":[{"id":"https://openalex.org/I204465549","display_name":"Washington University in St. Louis","ror":"https://ror.org/01yc7t268","country_code":"US","type":"education","lineage":["https://openalex.org/I204465549"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shantanu Chakrabartty","raw_affiliation_strings":["Department of Electrical and Systems Engineering, Washington University in St. Louis, St. Louis, MO, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Systems Engineering, Washington University in St. Louis, St. Louis, MO, U.S.A","institution_ids":["https://openalex.org/I204465549"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091548065"],"corresponding_institution_ids":["https://openalex.org/I204465549"],"apc_list":null,"apc_paid":null,"fwci":0.43,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.65566535,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"879","last_page":"882"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9706000089645386,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9706000089645386,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9501000046730042,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cold-chain","display_name":"Cold chain","score":0.6318132877349854},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6149214506149292},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5948401689529419},{"id":"https://openalex.org/keywords/response-time","display_name":"Response time","score":0.5717633366584778},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5261428356170654},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.5066984295845032},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.4561658501625061},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4300634264945984},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42560896277427673},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39480647444725037},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.35177934169769287},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34727293252944946},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2892579436302185},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2831377387046814},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22507724165916443},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1670442521572113},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1431351900100708},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11838316917419434}],"concepts":[{"id":"https://openalex.org/C2780114722","wikidata":"https://www.wikidata.org/wiki/Q592197","display_name":"Cold chain","level":2,"score":0.6318132877349854},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6149214506149292},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5948401689529419},{"id":"https://openalex.org/C19012869","wikidata":"https://www.wikidata.org/wiki/Q578372","display_name":"Response time","level":2,"score":0.5717633366584778},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5261428356170654},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.5066984295845032},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.4561658501625061},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4300634264945984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42560896277427673},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39480647444725037},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35177934169769287},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34727293252944946},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2892579436302185},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2831377387046814},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22507724165916443},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1670442521572113},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1431351900100708},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11838316917419434},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2017.8053064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8053064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W656433898","https://openalex.org/W1980584607","https://openalex.org/W2070131979","https://openalex.org/W2082002035","https://openalex.org/W2090336762","https://openalex.org/W2104944176","https://openalex.org/W2164839440","https://openalex.org/W2313414454","https://openalex.org/W2511744977","https://openalex.org/W2574984493"],"related_works":["https://openalex.org/W4312138033","https://openalex.org/W2235546141","https://openalex.org/W2789825376","https://openalex.org/W4249545720","https://openalex.org/W3126954492","https://openalex.org/W2370001102","https://openalex.org/W4318294007","https://openalex.org/W2362469848","https://openalex.org/W2580431360","https://openalex.org/W4289778149"],"abstract_inverted_index":{"Temperature":[0],"management":[1],"of":[2,14,84,160,166],"the":[3,12,39,69,73,82,107,125,131,143],"food":[4,54],"supply-chain":[5],"is":[6,36,116],"important":[7],"for":[8,75],"ensuring":[9],"compliance":[10],"and":[11,19,48,93,109],"quality":[13],"perishable":[15],"products":[16],"like":[17],"vaccines":[18],"fish.":[20],"While":[21],"conventional":[22],"strategies":[23],"have":[24],"relied":[25],"on":[26,97,106],"using":[27],"monitors":[28],"attached":[29],"to":[30,111,118],"packaging":[31],"containers,":[32],"self-powered":[33,64],"time-temperature":[34,70],"monitoring":[35,164],"attractive":[37],"because":[38],"technology":[40],"can":[41,49,67,139],"be":[42,50,140],"embedded":[43],"with":[44,52],"passive":[45],"RFID":[46],"tags":[47],"integrated":[51,96],"every":[53],"or":[55],"medical":[56],"package.":[57],"In":[58],"this":[59],"paper":[60],"we":[61],"propose":[62],"a":[63,98,112,119,151,157,163],"sensor":[65,80],"that":[66,115],"monitor":[68],"information":[71],"without":[72],"need":[74],"any":[76],"external":[77],"powering.":[78],"The":[79,100],"exploits":[81],"physics":[83],"Fowler-Nordheim":[85],"(FN)":[86],"tunneling":[87],"where":[88],"electrons":[89],"are":[90,94],"thermally":[91],"excited":[92],"continuously":[95],"floating-gate.":[99],"steady-state":[101],"FN":[102],"integrator's":[103],"response":[104,136],"depends":[105],"temperature":[108,128,158],"corresponds":[110],"temporal":[113],"curve":[114,137],"unique":[117],"specific":[120],"ambient":[121,127],"temperature.":[122],"Deviation":[123],"from":[124,133,147],"set":[126],"results":[129,146],"in":[130,150],"deviation":[132],"its":[134],"reference":[135],"hence":[138],"captured":[141],"by":[142],"sensor.":[144],"Measured":[145],"sensors":[148],"prototyped":[149],"0.5":[152],"\u03bcm":[153],"CMOS":[154],"process":[155],"show":[156],"sensitivity":[159],"1.5mV/\u00b0C":[161],"over":[162],"duration":[165],"100":[167],"hours.":[168]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}