{"id":"https://openalex.org/W2758449788","doi":"https://doi.org/10.1109/mwscas.2017.8052949","title":"High resolution, self-compensated, sense amplifier for FRAM technology","display_name":"High resolution, self-compensated, sense amplifier for FRAM technology","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2758449788","doi":"https://doi.org/10.1109/mwscas.2017.8052949","mag":"2758449788"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8052949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8052949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019057517","display_name":"Robert A. Glazewski","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Robert A. Glazewski","raw_affiliation_strings":["NVM Design, Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVM Design, Dallas, Texas, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110166851","display_name":"Stefano Poli","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stefano Poli","raw_affiliation_strings":["Modeling, Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Modeling, Dallas, Texas, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067018796","display_name":"K. Schwartz","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kurt Schwartz","raw_affiliation_strings":["NVM Design, Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVM Design, Dallas, Texas, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063075105","display_name":"Scott L. Leisen","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Scott L. Leisen","raw_affiliation_strings":["Test Texas Instruments, Inc., Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Test Texas Instruments, Inc., Dallas, Texas, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019264217","display_name":"Bill Kraus","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bill Kraus","raw_affiliation_strings":["NVM Design, Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVM Design, Dallas, Texas, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023786512","display_name":"Stephen K. Heinrich-Barna","orcid":"https://orcid.org/0000-0002-5767-0166"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stephen K. Heinrich-Barna","raw_affiliation_strings":["NVM Design, Dallas, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVM Design, Dallas, Texas, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12488387,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"33","issue":null,"first_page":"417","last_page":"421"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7594029903411865},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.616981565952301},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6089697480201721},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5810818672180176},{"id":"https://openalex.org/keywords/ferroelectric-ram","display_name":"Ferroelectric RAM","score":0.5213342905044556},{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.5019371509552002},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.4722042977809906},{"id":"https://openalex.org/keywords/high-resolution","display_name":"High resolution","score":0.47191980481147766},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44300663471221924},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40884459018707275},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.22698891162872314},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19921624660491943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19593673944473267},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.1794402301311493},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16660097241401672},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.15777486562728882}],"concepts":[{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7594029903411865},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.616981565952301},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6089697480201721},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5810818672180176},{"id":"https://openalex.org/C161164327","wikidata":"https://www.wikidata.org/wiki/Q703656","display_name":"Ferroelectric RAM","level":4,"score":0.5213342905044556},{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.5019371509552002},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.4722042977809906},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.47191980481147766},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44300663471221924},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40884459018707275},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22698891162872314},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19921624660491943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19593673944473267},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.1794402301311493},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16660097241401672},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.15777486562728882},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.0},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2017.8052949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8052949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1529696635","https://openalex.org/W1625089944","https://openalex.org/W1998594322","https://openalex.org/W2004643603","https://openalex.org/W2029526102","https://openalex.org/W2095825059","https://openalex.org/W2132459527","https://openalex.org/W2132846136","https://openalex.org/W2152571680","https://openalex.org/W2165716336","https://openalex.org/W2185105041","https://openalex.org/W2441252030"],"related_works":["https://openalex.org/W2029990318","https://openalex.org/W2601845499","https://openalex.org/W2117344730","https://openalex.org/W4231592364","https://openalex.org/W2125441476","https://openalex.org/W2261845001","https://openalex.org/W1801034736","https://openalex.org/W2097965268","https://openalex.org/W1989206638","https://openalex.org/W4391216560"],"abstract_inverted_index":{"Ferroelectric":[0],"RAM":[1],"(FRAM)":[2],"is":[3],"a":[4,41,89,102],"non-volatile":[5],"memory":[6],"with":[7,46,58,78],"fast,":[8],"low":[9],"power,":[10],"high":[11,92],"endurance,":[12],"read":[13],"and":[14,91,105],"write":[15],"operations.":[16],"Hence,":[17],"this":[18,29,59,85],"technology":[19],"remains":[20],"an":[21],"attractive":[22],"choice":[23],"for":[24],"embedded":[25],"system":[26],"solutions.":[27],"In":[28,84],"paper,":[30],"we":[31,67,87],"analyze":[32],"Si":[33],"data":[34],"that":[35],"initiated":[36],"the":[37,52,74,82],"effort":[38],"to":[39,63],"design":[40,69],"compensated":[42],"Sense":[43],"Amplifier":[44],"(SA)":[45],"improved":[47],"input":[48],"offset-sigma.":[49],"We":[50],"evaluate":[51],"cost":[53],"vs":[54],"benefit":[55],"tradeoffs":[56],"associated":[57],"metal-cap":[60],"based":[61],"approach":[62],"offset":[64],"compensation.":[65],"Lastly,":[66],"present":[68],"improvements,":[70],"which":[71,99],"will":[72,100],"preserve":[73],"benefits":[75],"of":[76,108],"SA":[77],"compensation":[79],"while":[80],"reducing":[81],"cost.":[83],"work":[86],"propose":[88],"self-compensated":[90],"resolution":[93],"SA,":[94],"in":[95],"130nm":[96],"FRAM":[97],"technology,":[98],"enable":[101],"more":[103],"accurate":[104],"consistent":[106],"delineation":[107],"smaller":[109],"signal":[110],"margins.":[111]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}