{"id":"https://openalex.org/W2759075313","doi":"https://doi.org/10.1109/mwscas.2017.8052890","title":"FPGA implementation of a support vector machine classifier for Ultrasonic flaw detection","display_name":"FPGA implementation of a support vector machine classifier for Ultrasonic flaw detection","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2759075313","doi":"https://doi.org/10.1109/mwscas.2017.8052890","mag":"2759075313"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2017.8052890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8052890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101741856","display_name":"Yiyue Jiang","orcid":"https://orcid.org/0009-0006-7011-5737"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yiyue Jiang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054798152","display_name":"Kushal Virupakshappa","orcid":null},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kushal Virupakshappa","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002920793","display_name":"Erdal Oruklu","orcid":"https://orcid.org/0000-0002-2376-8325"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Erdal Oruklu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101741856"],"corresponding_institution_ids":["https://openalex.org/I180949307"],"apc_list":null,"apc_paid":null,"fwci":1.6093,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.84663379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"180","last_page":"183"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.9048477411270142},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.8870277404785156},{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.7150444388389587},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7087067365646362},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.7052938342094421},{"id":"https://openalex.org/keywords/structured-support-vector-machine","display_name":"Structured support vector machine","score":0.4640248417854309},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42900437116622925},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4156741499900818},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37100088596343994},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32587873935699463},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.08073684573173523}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.9048477411270142},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.8870277404785156},{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.7150444388389587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7087067365646362},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.7052938342094421},{"id":"https://openalex.org/C125168437","wikidata":"https://www.wikidata.org/wiki/Q7625184","display_name":"Structured support vector machine","level":3,"score":0.4640248417854309},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42900437116622925},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4156741499900818},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37100088596343994},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32587873935699463},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.08073684573173523},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2017.8052890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2017.8052890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1637570796","https://openalex.org/W1969817138","https://openalex.org/W2063860487","https://openalex.org/W2111395542","https://openalex.org/W2119821739","https://openalex.org/W2129101332","https://openalex.org/W2547670507","https://openalex.org/W4239510810"],"related_works":["https://openalex.org/W1948992892","https://openalex.org/W2186666570","https://openalex.org/W2683383161","https://openalex.org/W2104936869","https://openalex.org/W2143867687","https://openalex.org/W4253128984","https://openalex.org/W2384390720","https://openalex.org/W2122277321","https://openalex.org/W2565312173","https://openalex.org/W2364362706"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"investigate":[4],"the":[5,46,50,58],"hardware":[6,82],"implementation":[7],"of":[8,49],"Support":[9],"Vector":[10],"Machine":[11],"(SVM)":[12],"prediction":[13,60],"on":[14,80],"an":[15],"FPGA":[16,44],"platform":[17],"for":[18,28,77],"industrial":[19],"ultrasound":[20],"applications.":[21],"Specifically,":[22],"SVM":[23,59,73],"is":[24,45,61,75],"used":[25,55],"as":[26,33,84],"classifier":[27],"identifying":[29],"ultrasonic":[30],"A-scan":[31],"signals":[32,34,38],"with":[35],"flaw":[36,70],"or":[37],"without":[39],"flaw.":[40],"Hardware":[41],"acceleration":[42],"using":[43,72],"main":[47],"theme":[48],"presented":[51],"work.":[52],"The":[53],"architecture":[54],"to":[56],"implement":[57],"discussed":[62],"in":[63],"detail.":[64],"Synthesis":[65],"results":[66],"indicate":[67],"that":[68],"Ultrasonic":[69],"detection":[71],"algorithm":[74],"feasible":[76],"real-time":[78],"applications":[79],"programmable":[81],"such":[83],"FPGAs.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}