{"id":"https://openalex.org/W2593202577","doi":"https://doi.org/10.1109/mwscas.2016.7870124","title":"Automated characterization of reverse recovery parameters in high speed LDMOS devices","display_name":"Automated characterization of reverse recovery parameters in high speed LDMOS devices","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2593202577","doi":"https://doi.org/10.1109/mwscas.2016.7870124","mag":"2593202577"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2016.7870124","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7870124","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111984564","display_name":"Carlos Bernal","orcid":null},"institutions":[{"id":"https://openalex.org/I60388903","display_name":"University of Puerto Rico-Mayaguez","ror":"https://ror.org/00wek6x04","country_code":"PR","type":"education","lineage":["https://openalex.org/I200399037","https://openalex.org/I60388903"]}],"countries":["PR"],"is_corresponding":true,"raw_author_name":"Carlos Bernal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Puerto Rico Mayag\u00fcez, Mayag\u00fcez, Puerto Rico"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Puerto Rico Mayag\u00fcez, Mayag\u00fcez, Puerto Rico","institution_ids":["https://openalex.org/I60388903"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100599698","display_name":"Manuel Jim\u00e9nez","orcid":"https://orcid.org/0000-0003-0497-1480"},"institutions":[{"id":"https://openalex.org/I60388903","display_name":"University of Puerto Rico-Mayaguez","ror":"https://ror.org/00wek6x04","country_code":"PR","type":"education","lineage":["https://openalex.org/I200399037","https://openalex.org/I60388903"]}],"countries":["PR"],"is_corresponding":false,"raw_author_name":"Manuel Jimenez","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Puerto Rico Mayag\u00fcez, Mayag\u00fcez, Puerto Rico"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Puerto Rico Mayag\u00fcez, Mayag\u00fcez, Puerto Rico","institution_ids":["https://openalex.org/I60388903"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111984564"],"corresponding_institution_ids":["https://openalex.org/I60388903"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17436468,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ldmos","display_name":"LDMOS","score":0.7119858264923096},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.711491584777832},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.6184669733047485},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5987886190414429},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.46870917081832886},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.4490901231765747},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4484623670578003},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4140256345272064},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3385079503059387},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33283984661102295},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2925996780395508},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.269214928150177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21979346871376038},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1837967038154602},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.16423377394676208},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.1567913293838501},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.10285627841949463}],"concepts":[{"id":"https://openalex.org/C31672976","wikidata":"https://www.wikidata.org/wiki/Q4042432","display_name":"LDMOS","level":4,"score":0.7119858264923096},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.711491584777832},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.6184669733047485},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5987886190414429},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.46870917081832886},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.4490901231765747},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4484623670578003},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4140256345272064},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3385079503059387},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33283984661102295},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2925996780395508},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.269214928150177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21979346871376038},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1837967038154602},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.16423377394676208},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.1567913293838501},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.10285627841949463},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2016.7870124","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7870124","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1870164369","https://openalex.org/W2011026891","https://openalex.org/W2077677740","https://openalex.org/W2103306695","https://openalex.org/W2103430940","https://openalex.org/W2103820978","https://openalex.org/W2138265118","https://openalex.org/W2147986031","https://openalex.org/W2514879906","https://openalex.org/W2533337270","https://openalex.org/W6670052145"],"related_works":["https://openalex.org/W2058965144","https://openalex.org/W2164382479","https://openalex.org/W2146343568","https://openalex.org/W98480971","https://openalex.org/W2150291671","https://openalex.org/W2013643406","https://openalex.org/W2027972911","https://openalex.org/W2157978810","https://openalex.org/W2597809628","https://openalex.org/W2129971868"],"abstract_inverted_index":{"Measuring":[0],"and":[1,31,96,104],"quantifying":[2],"reverse":[3,28,32],"recovery":[4,26,29],"parameters":[5],"in":[6,14,50],"high-speed":[7,54],"LDMOS":[8],"devices":[9,106],"is":[10,87],"an":[11],"important":[12],"task":[13],"their":[15,109],"characterization.":[16],"Multiple":[17],"topologies":[18,37],"have":[19,38],"been":[20],"proposed":[21],"to":[22,60,73,107],"quantify":[23],"the":[24,51,61,74,84,94],"revere":[25],"time,":[27],"charge,":[30],"peak":[33],"current.":[34],"Although":[35],"such":[36],"achieved":[39],"different":[40],"levels":[41],"of":[42,53,93],"performance,":[43],"still":[44],"they":[45],"offer":[46],"opportunities":[47],"for":[48,83],"improving":[49],"handling":[52],"devices.":[55],"This":[56],"paper":[57],"proposes":[58],"modifications":[59],"JEDEC":[62],"standard":[63],"test":[64,97],"setup":[65,98],"that":[66],"enable":[67],"a":[68],"5X":[69],"speedup":[70],"when":[71],"compared":[72],"original":[75],"circuit.":[76],"A":[77],"virtual":[78],"user":[79],"interface":[80],"(VI)":[81],"developed":[82],"modified":[85],"circuit":[86],"also":[88],"presented.":[89],"The":[90],"combined":[91],"operation":[92],"VI":[95],"are":[99],"evaluated":[100],"on":[101],"commercial":[102],"off-the-shelf":[103],"wafer-level":[105],"demonstrate":[108],"functionality.":[110]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}