{"id":"https://openalex.org/W2594819930","doi":"https://doi.org/10.1109/mwscas.2016.7870068","title":"Using scattering parameters and the g <sub>m</sub> /I <sub>D</sub> MOST ratio for characterisation and design of RF circuits","display_name":"Using scattering parameters and the g <sub>m</sub> /I <sub>D</sub> MOST ratio for characterisation and design of RF circuits","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2594819930","doi":"https://doi.org/10.1109/mwscas.2016.7870068","mag":"2594819930"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2016.7870068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7870068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076657338","display_name":"Juan Luis Castagnola","orcid":"https://orcid.org/0000-0002-0140-2074"},"institutions":[{"id":"https://openalex.org/I130054616","display_name":"Universidad Cat\u00f3lica de C\u00f3rdoba","ror":"https://ror.org/04hehwn14","country_code":"AR","type":"education","lineage":["https://openalex.org/I130054616"]}],"countries":["AR"],"is_corresponding":true,"raw_author_name":"Juan Luis Castagnola","raw_affiliation_strings":["Laboratorio de Comunicaciones y Redes de Sensores, Universidad Cat&#x00F3;lica de C&#x00F3;rdoba (UCC), C&#x00F3;rdoba, Argentina","Laboratorio de Comunicaciones y Redes de Sensores, Universidad Cat\u00f3lica de C\u00f3rdoba (UCC), C\u00f3rdoba, Argentina"],"affiliations":[{"raw_affiliation_string":"Laboratorio de Comunicaciones y Redes de Sensores, Universidad Cat&#x00F3;lica de C&#x00F3;rdoba (UCC), C&#x00F3;rdoba, Argentina","institution_ids":["https://openalex.org/I130054616"]},{"raw_affiliation_string":"Laboratorio de Comunicaciones y Redes de Sensores, Universidad Cat\u00f3lica de C\u00f3rdoba (UCC), C\u00f3rdoba, Argentina","institution_ids":["https://openalex.org/I130054616"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007049793","display_name":"Fortunato Carlos Dualibe","orcid":"https://orcid.org/0000-0002-2889-315X"},"institutions":[{"id":"https://openalex.org/I130929987","display_name":"University of Mons","ror":"https://ror.org/02qnnz951","country_code":"BE","type":"education","lineage":["https://openalex.org/I130929987"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Fortunato Carlos Dualibe","raw_affiliation_strings":["Service d'&#x00E9;lectronique et micro&#x00E9;lectronique, Universit&#x00E9; de Mons (UMONS), Mons, Belgique","Service d'\u00e9lectronique et micro\u00e9lectronique, Universit\u00e9 de Mons (UMONS), Mons, Belgique"],"affiliations":[{"raw_affiliation_string":"Service d'&#x00E9;lectronique et micro&#x00E9;lectronique, Universit&#x00E9; de Mons (UMONS), Mons, Belgique","institution_ids":["https://openalex.org/I130929987"]},{"raw_affiliation_string":"Service d'\u00e9lectronique et micro\u00e9lectronique, Universit\u00e9 de Mons (UMONS), Mons, Belgique","institution_ids":["https://openalex.org/I130929987"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004843872","display_name":"Hugo Garc\u00eda\u2010V\u00e1zquez","orcid":"https://orcid.org/0000-0003-0942-5761"},"institutions":[{"id":"https://openalex.org/I130929987","display_name":"University of Mons","ror":"https://ror.org/02qnnz951","country_code":"BE","type":"education","lineage":["https://openalex.org/I130929987"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Hugo Garc\u00eda-V\u00e1zquez","raw_affiliation_strings":["Service d'&#x00E9;lectronique et micro&#x00E9;lectronique, Universit&#x00E9; de Mons (UMONS), Mons, Belgique","Service d'\u00e9lectronique et micro\u00e9lectronique, Universit\u00e9 de Mons (UMONS), Mons, Belgique"],"affiliations":[{"raw_affiliation_string":"Service d'&#x00E9;lectronique et micro&#x00E9;lectronique, Universit&#x00E9; de Mons (UMONS), Mons, Belgique","institution_ids":["https://openalex.org/I130929987"]},{"raw_affiliation_string":"Service d'\u00e9lectronique et micro\u00e9lectronique, Universit\u00e9 de Mons (UMONS), Mons, Belgique","institution_ids":["https://openalex.org/I130929987"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5076657338"],"corresponding_institution_ids":["https://openalex.org/I130054616"],"apc_list":null,"apc_paid":null,"fwci":0.1838,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61578099,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.6092231273651123},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.540510356426239},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5298333764076233},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.49205464124679565},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4852854907512665},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4061855375766754},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3742295503616333},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3669818043708801},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3539062738418579},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.32629114389419556},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.30386433005332947},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16461309790611267},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.08723834156990051}],"concepts":[{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.6092231273651123},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.540510356426239},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5298333764076233},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.49205464124679565},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4852854907512665},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4061855375766754},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3742295503616333},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3669818043708801},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3539062738418579},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32629114389419556},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.30386433005332947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16461309790611267},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.08723834156990051},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mwscas.2016.7870068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7870068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:accedacris.ulpgc.es:10553/45454","is_oa":false,"landing_page_url":"http://hdl.handle.net/10553/45454","pdf_url":null,"source":{"id":"https://openalex.org/S4306400136","display_name":"Acceda (Universidad de Las Palmas de Gran Canaria)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Midwest Symposium on Circuits and Systems[ISSN 1548-3746] (7870068)","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1967723628","https://openalex.org/W2041727263","https://openalex.org/W2087202572","https://openalex.org/W2120212583","https://openalex.org/W2149924371","https://openalex.org/W2167034725"],"related_works":["https://openalex.org/W2051058708","https://openalex.org/W2548900738","https://openalex.org/W1494268238","https://openalex.org/W154868527","https://openalex.org/W1983207144","https://openalex.org/W2490706771","https://openalex.org/W2366149815","https://openalex.org/W2480116122","https://openalex.org/W4255576661","https://openalex.org/W1544954528"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,118],"design":[4],"methodology":[5],"for":[6,111],"RF":[7],"circuits.":[8],"It":[9],"is":[10],"based":[11],"on":[12],"the":[13,18,25,35,51,55,62,77,90,100,113],"transistor":[14,83],"physics,":[15],"provided":[16],"by":[17,59],"MOS":[19,48],"advanced":[20],"compact":[21],"model":[22],"(ACM)":[23],"and":[24,85],"scattering":[26,52,101],"parameters,":[27],"which":[28,93],"have":[29],"been":[30,109],"expressed":[31],"in":[32,79,97],"function":[33],"of":[34,47,54,61,72,99,117],"transconductance-to-current":[36],"ratio":[37],"(g":[38],"<sub":[39,43,64,68],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40,44,65,69],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">m</sub>":[41,66],"/I":[42,67],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">D</sub>":[45,70],")":[46],"transistors.":[49],"Since":[50],"parameters":[53],"circuits":[56],"are":[57,94],"parameterized":[58],"means":[60],"g":[63],"ratios":[71],"MOST,":[73],"designers":[74],"can":[75],"choose":[76],"latter":[78],"order":[80],"to":[81,87],"optimise":[82],"size":[84],"bias":[86],"comply":[88],"with":[89],"circuit":[91],"specs,":[92],"normally":[95],"given":[96],"terms":[98],"parameters.":[102],"As":[103],"an":[104],"example,":[105],"this":[106],"method":[107],"has":[108],"applied":[110],"designing":[112],"common":[114],"source":[115],"stage":[116],"low":[119],"noise":[120],"amplifier":[121],"(LNA).":[122]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-15T23:13:30.683059","created_date":"2017-03-16T00:00:00"}