{"id":"https://openalex.org/W2594358881","doi":"https://doi.org/10.1109/mwscas.2016.7869991","title":"A current-mirror technique used for high-order curvature compensated bandgap reference in automotive application","display_name":"A current-mirror technique used for high-order curvature compensated bandgap reference in automotive application","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2594358881","doi":"https://doi.org/10.1109/mwscas.2016.7869991","mag":"2594358881"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2016.7869991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111582755","display_name":"Dong-Woo Ha","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Dongwoo Ha","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100759787","display_name":"Yujin Park","orcid":"https://orcid.org/0000-0002-7936-9307"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yujin Park","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080332152","display_name":"Suhwan Kim","orcid":"https://orcid.org/0000-0001-9107-2963"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Suhwan Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111582755"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.2895,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67256435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/curvature","display_name":"Curvature","score":0.5979385375976562},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.597686767578125},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5402002930641174},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4115546941757202},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3831322491168976},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3648003339767456},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33326077461242676},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25098899006843567},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21997258067131042},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2001062035560608},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08828875422477722},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.0759701132774353},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.07230985164642334}],"concepts":[{"id":"https://openalex.org/C195065555","wikidata":"https://www.wikidata.org/wiki/Q214881","display_name":"Curvature","level":2,"score":0.5979385375976562},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.597686767578125},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5402002930641174},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4115546941757202},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3831322491168976},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3648003339767456},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33326077461242676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25098899006843567},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21997258067131042},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2001062035560608},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08828875422477722},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0759701132774353},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.07230985164642334}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2016.7869991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1566916904","https://openalex.org/W2067699299","https://openalex.org/W2070033800","https://openalex.org/W2101246913","https://openalex.org/W2128134737","https://openalex.org/W2133201500","https://openalex.org/W2141958731","https://openalex.org/W2171702041","https://openalex.org/W2211711576","https://openalex.org/W2540006809","https://openalex.org/W6729038176"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2351672553","https://openalex.org/W2373392303","https://openalex.org/W2765894405","https://openalex.org/W1884735063","https://openalex.org/W2372668238","https://openalex.org/W4226126548","https://openalex.org/W2560421750"],"abstract_inverted_index":{"A":[0],"high-order":[1],"temperature":[2,48,65,92],"compensated":[3,32],"current-mode":[4],"bandgap":[5,80],"reference":[6,81],"is":[7,54,100],"proposed":[8,13],"for":[9,57],"automotive":[10,58,110],"applications.":[11],"The":[12,52,97],"circuit":[14,53],"uses":[15,40],"one":[16],"BGR":[17],"core":[18],"to":[19,30,46,70],"produce":[20],"concave":[21,24],"upward":[22],"and":[23,33,89],"downward":[25],"curvatures":[26],"which":[27,60],"are":[28],"combined":[29],"be":[31],"have":[34],"highly":[35],"precise":[36],"current.":[37],"It":[38],"also":[39],"two":[41],"different":[42],"types":[43],"of":[44,86,94],"resistors":[45],"compensate":[47],"coefficients":[49],"in":[50,62],"resistors.":[51],"designed":[55],"specifically":[56],"application":[59],"operates":[61],"a":[63,84,91,107],"wide":[64],"range,":[66],"from":[67],"-40":[68],"C":[69],"150":[71],"C.":[72],"With":[73],"3.3-V":[74],"supply":[75],"voltage,":[76],"the":[77],"simulated":[78],"output":[79],"voltage":[82,85],"provides":[83],"861":[87],"mV":[88],"has":[90],"coefficient":[93],"75":[95],"ppm/\u00b0C.":[96],"silicon":[98],"area":[99],"0.0249":[101],"mm":[102],"<sup":[103],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[104],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[105],"with":[106],"0.18-\u03bcm":[108],"BCDMOS":[109],"technology.":[111]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}