{"id":"https://openalex.org/W2594195877","doi":"https://doi.org/10.1109/mwscas.2016.7869953","title":"A Survey on the power and robustness of FinFET SRAM","display_name":"A Survey on the power and robustness of FinFET SRAM","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2594195877","doi":"https://doi.org/10.1109/mwscas.2016.7869953","mag":"2594195877"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2016.7869953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036502044","display_name":"Mahmoud Darwich","orcid":"https://orcid.org/0000-0001-6337-5596"},"institutions":[{"id":"https://openalex.org/I79516672","display_name":"University of Louisiana at Lafayette","ror":"https://ror.org/01x8rc503","country_code":"US","type":"education","lineage":["https://openalex.org/I2799628689","https://openalex.org/I79516672"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mahmoud Darwich","raw_affiliation_strings":["The Center Advanced for Computer Studies, University of Louisiana at Lafayette, Lafayette, LA"],"affiliations":[{"raw_affiliation_string":"The Center Advanced for Computer Studies, University of Louisiana at Lafayette, Lafayette, LA","institution_ids":["https://openalex.org/I79516672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037514714","display_name":"Ahmed Abdelgawad","orcid":"https://orcid.org/0000-0002-6655-2065"},"institutions":[{"id":"https://openalex.org/I1629065","display_name":"Central Michigan University","ror":"https://ror.org/02xawj266","country_code":"US","type":"education","lineage":["https://openalex.org/I1629065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Abdelgawad","raw_affiliation_strings":["School of Engineering and Technology, Central Michigan University, Mount Pleasant, MI"],"affiliations":[{"raw_affiliation_string":"School of Engineering and Technology, Central Michigan University, Mount Pleasant, MI","institution_ids":["https://openalex.org/I1629065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010023744","display_name":"Magdy Bayoumi","orcid":"https://orcid.org/0000-0002-0630-5273"},"institutions":[{"id":"https://openalex.org/I79516672","display_name":"University of Louisiana at Lafayette","ror":"https://ror.org/01x8rc503","country_code":"US","type":"education","lineage":["https://openalex.org/I2799628689","https://openalex.org/I79516672"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Magdy Bayoumi","raw_affiliation_strings":["The Center Advanced for Computer Studies, University of Louisiana at Lafayette, Lafayette, LA"],"affiliations":[{"raw_affiliation_string":"The Center Advanced for Computer Studies, University of Louisiana at Lafayette, Lafayette, LA","institution_ids":["https://openalex.org/I79516672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036502044"],"corresponding_institution_ids":["https://openalex.org/I79516672"],"apc_list":null,"apc_paid":null,"fwci":0.3675,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.68336528,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9604566097259521},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7783193588256836},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6710342764854431},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5836122035980225},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.46717438101768494},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4610779285430908},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.4171527624130249},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3608226478099823},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3443431258201599},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2567635774612427},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07660603523254395}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9604566097259521},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7783193588256836},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6710342764854431},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5836122035980225},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.46717438101768494},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4610779285430908},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.4171527624130249},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3608226478099823},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3443431258201599},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2567635774612427},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07660603523254395},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2016.7869953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1489111899","https://openalex.org/W1538116008","https://openalex.org/W1565505009","https://openalex.org/W1753784006","https://openalex.org/W2000967300","https://openalex.org/W2002038549","https://openalex.org/W2042536271","https://openalex.org/W2042548063","https://openalex.org/W2071003649","https://openalex.org/W2103126659","https://openalex.org/W2105358807","https://openalex.org/W2109458212","https://openalex.org/W2119327444","https://openalex.org/W2124825934","https://openalex.org/W2126809390","https://openalex.org/W2129919086","https://openalex.org/W2144223789","https://openalex.org/W2144289559","https://openalex.org/W2160948307","https://openalex.org/W2161555441","https://openalex.org/W2540969135","https://openalex.org/W4243164749","https://openalex.org/W6676534250"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W2770593030","https://openalex.org/W2118008391"],"abstract_inverted_index":{"For":[0],"the":[1,40,46,73,77,92,98,106],"last":[2],"decade,":[3],"SRAM":[4,58,103,125,138],"has":[5,23,88],"been":[6,24],"used":[7],"for":[8,83,136],"high":[9,11,51],"density,":[10],"performance,":[12],"and":[13,19,36,54,96,124,130],"ultra-low":[14],"power":[15],"consumption":[16],"system-on-chip":[17],"(SoC)":[18],"mobile":[20],"applications.":[21],"That":[22],"achieved":[25],"by":[26,45],"an":[27],"aggressive":[28],"feature":[29,67],"size":[30],"scaling,":[31],"which":[32],"resulted":[33],"in":[34,39,75],"severe":[35],"non-tolerant":[37],"degradation":[38],"device":[41,99,122],"physical":[42],"characteristics":[43],"represented":[44],"Short":[47],"Channel":[48],"Effect":[49],"(SCE),":[50],"leakage":[52],"current":[53],"robustness":[55],"problems.":[56],"Moreover,":[57],"stability":[59],"became":[60],"a":[61,79],"critical":[62],"design":[63,133],"parameter":[64],"under":[65],"deep-scaled":[66],"technology.":[68],"Since":[69],"planar":[70],"CMOS":[71,86],"reached":[72],"limits":[74],"shrinking":[76],"device,":[78],"new":[80],"promising":[81],"candidate":[82],"extreme":[84],"scaled":[85],"devices":[87],"emerged":[89],"to":[90,108],"overcome":[91],"previous":[93],"mentioned":[94],"problems":[95],"enhance":[97],"performance.":[100],"Thus,":[101],"FinFET":[102,117,137],"comes":[104],"as":[105],"alternative":[107],"substitute":[109],"Si-bulk":[110],"SRAM.":[111],"In":[112],"this":[113],"survey":[114],"paper,":[115],"different":[116],"schemes":[118],"based":[119],"on":[120],"both":[121],"level":[123,127],"circuit":[126],"are":[128,139],"addressed":[129],"compared.":[131],"Also,":[132],"challenges":[134],"issues":[135],"addressed.":[140]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}