{"id":"https://openalex.org/W2593551440","doi":"https://doi.org/10.1109/mwscas.2016.7869952","title":"FinFET MPSoC 32 Gb/s transceivers: Custom ESD protection and verification","display_name":"FinFET MPSoC 32 Gb/s transceivers: Custom ESD protection and verification","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2593551440","doi":"https://doi.org/10.1109/mwscas.2016.7869952","mag":"2593551440"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2016.7869952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869952","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027118984","display_name":"James Karp","orcid":"https://orcid.org/0000-0001-5712-0036"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"James Karp","raw_affiliation_strings":["Xilinx, Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102867053","display_name":"Michael Hart","orcid":"https://orcid.org/0000-0002-4423-7662"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael J. Hart","raw_affiliation_strings":["Xilinx, Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057420341","display_name":"Mohammed Fakhruddin","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed Fakhruddin","raw_affiliation_strings":["Xilinx, Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066067508","display_name":"Vassili Kireev","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vassili Kireev","raw_affiliation_strings":["Xilinx, Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx, Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068650445","display_name":"Horwitz Larry","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Larry Horwitz","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035245661","display_name":"Matthew Hogan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Hogan","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5027118984"],"corresponding_institution_ids":["https://openalex.org/I32923980"],"apc_list":null,"apc_paid":null,"fwci":0.1867,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.62141275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"2016","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mpsoc","display_name":"MPSoC","score":0.8439677357673645},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.6932491064071655},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.6873392462730408},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.645341694355011},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5325027704238892},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.46849948167800903},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44634976983070374},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4304893910884857},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42478829622268677},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.41611480712890625},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.4127296209335327},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3611336946487427},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3417434096336365},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.340034544467926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2970581650733948},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2084028720855713},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.190622478723526},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.18287000060081482}],"concepts":[{"id":"https://openalex.org/C2777187653","wikidata":"https://www.wikidata.org/wiki/Q975106","display_name":"MPSoC","level":3,"score":0.8439677357673645},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.6932491064071655},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.6873392462730408},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.645341694355011},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5325027704238892},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.46849948167800903},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44634976983070374},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4304893910884857},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42478829622268677},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.41611480712890625},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.4127296209335327},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3611336946487427},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3417434096336365},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.340034544467926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2970581650733948},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2084028720855713},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.190622478723526},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.18287000060081482},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mwscas.2016.7869952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2016.7869952","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},{"id":"mag:2745673578","is_oa":false,"landing_page_url":"http://jglobal.jst.go.jp/en/public/201702227389267227","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W307250689","https://openalex.org/W585256305","https://openalex.org/W1546925824","https://openalex.org/W1558253230","https://openalex.org/W1965229716","https://openalex.org/W2087260692","https://openalex.org/W2110169479","https://openalex.org/W2165790250","https://openalex.org/W2394949055","https://openalex.org/W6641612266","https://openalex.org/W6684110516"],"related_works":["https://openalex.org/W2502691491","https://openalex.org/W1976012348","https://openalex.org/W2002682434","https://openalex.org/W2137671689","https://openalex.org/W4387782849","https://openalex.org/W2113449380","https://openalex.org/W2012131147","https://openalex.org/W2157008728","https://openalex.org/W2092587530","https://openalex.org/W2016942572"],"abstract_inverted_index":{"Custom":[0],"ESD":[1,43],"protection":[2],"without":[3],"increasing":[4],"loading":[5],"capacitance":[6],"is":[7],"demonstrated":[8],"for":[9,97],"transmitter":[10],"(TX)":[11],"and":[12,37,101],"receiver":[13],"(RX)":[14],"pins":[15],"of":[16,40,67],"the":[17,41,68,72,84,98,103,108],"Xilinx":[18],"Zynq":[19],"UltraScale+":[20],"Microprocessor":[21],"System-on-Chip":[22],"(MPSoC)":[23],"transceivers.":[24],"Optimized":[25],"T-coil":[26],"cancellation":[27],"was":[28,45],"applied":[29],"at":[30,71,83],"a":[31],"32":[32],"Gb/s":[33],"bit":[34],"rate.":[35],"Fast":[36],"reliable":[38],"verification":[39],"custom":[42],"design":[44,57],"developed":[46],"based":[47],"on":[48,105],"Calibre":[49,55],"PERC":[50],"schematic":[51],"checking":[52],"combined":[53],"with":[54,107],"DRC":[56],"rule":[58],"checking.":[59],"Our":[60],"proposed":[61],"analytical":[62],"model":[63,94],"shows":[64],"~50%":[65],"increase":[66],"electric":[69,81],"field":[70,82],"FinFET":[73,99],"top":[74],"compared":[75],"to":[76],"planar":[77],"sidewalls.":[78],"A":[79],"higher":[80],"fin-top":[85],"decreases":[86],"gate":[87],"oxide":[88],"breakdown,":[89],"reduces":[90],"RX":[91,104],"charged":[92],"device":[93],"(CDM)":[95],"immunity":[96],"MPSoC,":[100],"brings":[102],"par":[106],"TX,":[109],"CDM-wise.":[110]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}