{"id":"https://openalex.org/W2326183276","doi":"https://doi.org/10.1109/mwscas.2014.6908541","title":"Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process","display_name":"Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2326183276","doi":"https://doi.org/10.1109/mwscas.2014.6908541","mag":"2326183276"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2014.6908541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023352317","display_name":"Joseph S. Chang","orcid":"https://orcid.org/0000-0003-0991-8339"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Joseph S. Chang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073268696","display_name":"Kwen\u2010Siong Chong","orcid":"https://orcid.org/0000-0003-1512-2003"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kwen-Siong Chong","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101786512","display_name":"Wei Shu","orcid":"https://orcid.org/0009-0008-7619-4610"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wei Shu","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101677729","display_name":"Tong Lin","orcid":"https://orcid.org/0000-0002-8112-0439"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Tong Lin","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101651491","display_name":"Jize Jiang","orcid":"https://orcid.org/0000-0002-8889-3784"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jize Jiang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088626085","display_name":"Ne Kyaw Zwa Lwin","orcid":"https://orcid.org/0000-0001-7506-0380"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ne Kyaw Zwa Lwin","raw_affiliation_strings":["Nanyang Technological University, Singapore, Singapore, SG"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore, Singapore, SG","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108453372","display_name":"Yang Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yang Kang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5023352317"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.628,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.75171051,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"8","issue":null,"first_page":"821","last_page":"824"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6308519244194031},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.505158007144928},{"id":"https://openalex.org/keywords/absorbed-dose","display_name":"Absorbed dose","score":0.5021626949310303},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.49192237854003906},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.46063435077667236},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.4437468349933624},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4059332311153412},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.37220656871795654},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3581921458244324},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34829288721084595},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3105134665966034},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2920529842376709},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17525240778923035},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1215391755104065},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06807777285575867}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6308519244194031},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.505158007144928},{"id":"https://openalex.org/C151337348","wikidata":"https://www.wikidata.org/wiki/Q215313","display_name":"Absorbed dose","level":3,"score":0.5021626949310303},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.49192237854003906},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.46063435077667236},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.4437468349933624},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4059332311153412},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.37220656871795654},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3581921458244324},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34829288721084595},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3105134665966034},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2920529842376709},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17525240778923035},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1215391755104065},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06807777285575867},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2014.6908541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2059214545","https://openalex.org/W2073126994","https://openalex.org/W2103902557","https://openalex.org/W2109665871","https://openalex.org/W2114790701","https://openalex.org/W2148538186","https://openalex.org/W2154691889","https://openalex.org/W2157024459","https://openalex.org/W2160639967","https://openalex.org/W6681991465"],"related_works":["https://openalex.org/W1629214335","https://openalex.org/W2070522760","https://openalex.org/W1979972974","https://openalex.org/W2095856099","https://openalex.org/W2333137665","https://openalex.org/W4296887773","https://openalex.org/W1939000505","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W98108296"],"abstract_inverted_index":{"We":[0,62],"propose":[1],"a":[2,9,17,47,65],"radiation-hardened":[3],"library":[4,21,30,70,93,134],"cell":[5,20,31,39,126],"template":[6,32,76,127],"based":[7,72],"on":[8,73],"65nm":[10],"CMOS":[11],"process":[12],"for":[13,22,77,136],"the":[14,35,53,59,74,85,120,129],"development":[15],"of":[16,49,122],"radiation-hardened-by-design":[18],"(RHBD)":[19],"space":[23],"and":[24,41,55,128],"satellite":[25],"(S&S)":[26],"applications.":[27],"The":[28,111],"proposed":[29,124],"adheres":[33],"to":[34,44,57,103],"fixed-height":[36],"variable-width":[37],"standard":[38],"approach,":[40],"is":[42],"designed":[43],"inherently":[45],"embody":[46],"number":[48],"RHBD":[50,75,92,125],"techniques":[51],"at":[52,99],"device-":[54],"layout-level":[56],"mitigate":[58],"radiation":[60],"effects.":[61],"further":[63],"design":[64,131],"test":[66,86],"circuitry":[67],"embodying":[68],"several":[69],"cells":[71,94],"total":[78],"ionizing":[79],"dose":[80],"(TID)":[81],"irradiation":[82],"testing.":[83],"With":[84],"circuitry,":[87],"we":[88],"show":[89],"that":[90,118],"our":[91,123],"experience":[95],"insignificant":[96],"delay":[97],"effects":[98],"TID":[100],"dosage":[101],"up":[102],"500Krad,":[104],"V":[105],"<sub":[106],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[107],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[108],"=":[109],"0.9V-1.4V.":[110],"irradiating":[112],"tests":[113],"provide":[114],"concrete":[115],"experimental":[116],"data":[117],"verify":[119],"robustness":[121],"ensuing":[130],"methodologies":[132],"(including":[133],"development)":[135],"S&S":[137],"electronics.":[138]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2016,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}