{"id":"https://openalex.org/W2323693865","doi":"https://doi.org/10.1109/mwscas.2014.6908500","title":"Bulk and FDSOI SRAM resiliency to radiation effects","display_name":"Bulk and FDSOI SRAM resiliency to radiation effects","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2323693865","doi":"https://doi.org/10.1109/mwscas.2014.6908500","mag":"2323693865"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2014.6908500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908500","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112345184","display_name":"Walter Calienes","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Walter Calienes","raw_affiliation_strings":["Porto Alegre \u2014 RS, PGMicro/PPGC-Instituto de Inform\u00e1tica, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Porto Alegre \u2014 RS, PGMicro/PPGC-Instituto de Inform\u00e1tica, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["Porto Alegre \u2014 RS, PGMicro/PPGC-Instituto de Inform\u00e1tica, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Porto Alegre \u2014 RS, PGMicro/PPGC-Instituto de Inform\u00e1tica, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113772129","display_name":"Costin Anghel","orcid":null},"institutions":[{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Costin Anghel","raw_affiliation_strings":["Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, Paris, France","Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, Paris, France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, France","institution_ids":["https://openalex.org/I122941322"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053190499","display_name":"Andrei Vladimirescu","orcid":null},"institutions":[{"id":"https://openalex.org/I122941322","display_name":"Institut Sup\u00e9rieur d'\u00c9lectronique de Paris","ror":"https://ror.org/00yw34h52","country_code":"FR","type":"education","lineage":["https://openalex.org/I122941322"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Andrei Vladimirescu","raw_affiliation_strings":["Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, Paris, France","Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, Paris, France","institution_ids":["https://openalex.org/I122941322"]},{"raw_affiliation_string":"Institut Sup\u00e9rieur d'Electronique de Paris, Microelectronics Laboratory, France","institution_ids":["https://openalex.org/I122941322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0395,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87516302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"655","last_page":"658"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7855150699615479},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43609291315078735},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.43167099356651306},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36292773485183716},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.32855385541915894},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3269936442375183},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30682408809661865},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16624629497528076},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13436183333396912},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10270214080810547}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7855150699615479},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43609291315078735},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.43167099356651306},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36292773485183716},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32855385541915894},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3269936442375183},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30682408809661865},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16624629497528076},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13436183333396912},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10270214080810547}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2014.6908500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908500","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1887624250","https://openalex.org/W1981425209","https://openalex.org/W2005725420","https://openalex.org/W2030501553","https://openalex.org/W2106865643","https://openalex.org/W6645715873"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W2967161359","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3211992815"],"abstract_inverted_index":{"With":[0],"the":[1,10,17,25,51,81],"increasing":[2],"density":[3],"of":[4,19,28,45],"transistors":[5],"in":[6],"advanced":[7],"technology":[8],"nodes,":[9],"radiation":[11,29],"is":[12,62,69],"an":[13],"ongoing":[14],"problem":[15],"affecting":[16],"contents":[18],"memory":[20,34],"cells.":[21],"This":[22],"paper":[23],"presents":[24],"simulation":[26],"results":[27],"immunity":[30],"for":[31],"two":[32],"different":[33,56],"cell":[35,68],"technologies:":[36],"32nm":[37,65],"Bulk":[38],"CMOS":[39],"and":[40],"28nm":[41,82],"FDSOI.":[42],"The":[43],"effect":[44],"Single-Event":[46],"Upset":[47],"(SEU)":[48],"caused":[49],"by":[50],"heavy":[52,77],"ion":[53,78],"impact":[54],"with":[55],"Linear":[57],"Energy":[58],"Transfer":[59],"characteristic":[60],"(LET)":[61],"analyzed.":[63],"A":[64],"bulk":[66],"6T-SRAM":[67],"at":[70],"least":[71],"6":[72],"times":[73],"less":[74],"resilient":[75],"to":[76],"strikes":[79],"than":[80],"FDSOI":[83],"one.":[84]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}