{"id":"https://openalex.org/W2006128689","doi":"https://doi.org/10.1109/mwscas.2014.6908454","title":"Effects of non-ideal characteristics of substrate BJT on bandgap reference circuits","display_name":"Effects of non-ideal characteristics of substrate BJT on bandgap reference circuits","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2006128689","doi":"https://doi.org/10.1109/mwscas.2014.6908454","mag":"2006128689"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2014.6908454","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908454","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084507752","display_name":"Rui Bai","orcid":"https://orcid.org/0000-0002-4682-908X"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rui Bai","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108421094","display_name":"Geiger L. Randall","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Geiger L. Randall","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, US","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.10103926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"471","last_page":"474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.9118801355361938},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6414133310317993},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5966890454292297},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.5564433336257935},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5173346400260925},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.45387521386146545},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4433669447898865},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.43649348616600037},{"id":"https://openalex.org/keywords/inflection-point","display_name":"Inflection point","score":0.4334486126899719},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4007115960121155},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3759313225746155},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.3734388053417206},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33553773164749146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33394429087638855},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1970823109149933},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14697280526161194},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1425013542175293}],"concepts":[{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.9118801355361938},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6414133310317993},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5966890454292297},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5564433336257935},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5173346400260925},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.45387521386146545},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4433669447898865},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.43649348616600037},{"id":"https://openalex.org/C74545648","wikidata":"https://www.wikidata.org/wiki/Q212794","display_name":"Inflection point","level":2,"score":0.4334486126899719},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4007115960121155},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3759313225746155},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.3734388053417206},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33553773164749146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33394429087638855},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1970823109149933},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14697280526161194},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1425013542175293},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2014.6908454","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908454","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1495093102","https://openalex.org/W1581767252","https://openalex.org/W1860683259","https://openalex.org/W2003950364","https://openalex.org/W2022722828","https://openalex.org/W2056015146","https://openalex.org/W2098944725","https://openalex.org/W2103453845","https://openalex.org/W2109526415","https://openalex.org/W2116320387","https://openalex.org/W2135903234","https://openalex.org/W2148392146","https://openalex.org/W2534998135","https://openalex.org/W3147616483"],"related_works":["https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W2347289947","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2907906161","https://openalex.org/W2372270451","https://openalex.org/W1970992322","https://openalex.org/W2404318024","https://openalex.org/W2542178378"],"abstract_inverted_index":{"The":[0],"non-ideal":[1],"characteristics":[2],"of":[3,11,27,44,80,93],"bipolar":[4],"junction":[5],"transistors":[6],"(BJT)":[7],"on":[8,41],"the":[9,22,42,51,71,77,84,99],"performance":[10,43],"band":[12],"gap":[13],"reference":[14,60,78],"circuits":[15],"is":[16,19,48],"investigated.":[17],"It":[18,47],"shown":[20,49],"that":[21,50],"base":[23],"spreading":[24],"resistance":[25],"(BSR)":[26],"a":[28,37,63,67],"substrate":[29],"BJT":[30],"along":[31],"with":[32],"its":[33],"temperature":[34,85],"dependence":[35],"has":[36],"significant":[38],"negative":[39],"impact":[40],"voltage":[45],"references.":[46],"temperature-dependent":[52],"forward":[53],"current":[54],"gain":[55],"(\u03b2)":[56],"also":[57],"adversely":[58],"affects":[59],"performance.":[61],"In":[62],"typical":[64],"application":[65],"in":[66,76],"bulk":[68],"CMOS":[69],"process,":[70],"BSR":[72],"causes":[73],"an":[74,89],"increase":[75],"output":[79],"about":[81],"1%":[82],"and":[83],"dependent":[86],"\u03b2":[87],"introduces":[88],"inflection":[90],"point":[91],"shift":[92],"around":[94],"30":[95],"\u00b0C.":[96],"After":[97],"calibration":[98],"sensitivity":[100],"changes":[101],"by":[102],"25":[103],"ppm/\u00b0C.":[104]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}