{"id":"https://openalex.org/W2324273874","doi":"https://doi.org/10.1109/mwscas.2014.6908406","title":"Comparison of MOSFET mismatch models with random physical and random model variables","display_name":"Comparison of MOSFET mismatch models with random physical and random model variables","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2324273874","doi":"https://doi.org/10.1109/mwscas.2014.6908406","mag":"2324273874"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2014.6908406","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908406","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033707939","display_name":"Srijita Patra","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srijita Patra","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108357375","display_name":"R.L. Geiger","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randall Geiger","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.26188269,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"278","last_page":"281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/uncorrelated","display_name":"Uncorrelated","score":0.7789661884307861},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.5937061309814453},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5456070303916931},{"id":"https://openalex.org/keywords/sum-of-normally-distributed-random-variables","display_name":"Sum of normally distributed random variables","score":0.48536956310272217},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.47797366976737976},{"id":"https://openalex.org/keywords/random-effects-model","display_name":"Random effects model","score":0.47401174902915955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4520662724971771},{"id":"https://openalex.org/keywords/random-error","display_name":"Random error","score":0.4441162049770355},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.44219115376472473},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4255380928516388},{"id":"https://openalex.org/keywords/multivariate-random-variable","display_name":"Multivariate random variable","score":0.40627479553222656},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3936777114868164},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3790844976902008},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.29041868448257446},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09020787477493286}],"concepts":[{"id":"https://openalex.org/C169345407","wikidata":"https://www.wikidata.org/wiki/Q8216221","display_name":"Uncorrelated","level":2,"score":0.7789661884307861},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.5937061309814453},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5456070303916931},{"id":"https://openalex.org/C182514268","wikidata":"https://www.wikidata.org/wiki/Q7636889","display_name":"Sum of normally distributed random variables","level":4,"score":0.48536956310272217},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.47797366976737976},{"id":"https://openalex.org/C168743327","wikidata":"https://www.wikidata.org/wiki/Q1826427","display_name":"Random effects model","level":3,"score":0.47401174902915955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4520662724971771},{"id":"https://openalex.org/C73782692","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Random error","level":2,"score":0.4441162049770355},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.44219115376472473},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4255380928516388},{"id":"https://openalex.org/C138405894","wikidata":"https://www.wikidata.org/wiki/Q3179949","display_name":"Multivariate random variable","level":3,"score":0.40627479553222656},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3936777114868164},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3790844976902008},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.29041868448257446},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09020787477493286},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C95190672","wikidata":"https://www.wikidata.org/wiki/Q815382","display_name":"Meta-analysis","level":2,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2014.6908406","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2014.6908406","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1984597642","https://openalex.org/W2140281076","https://openalex.org/W2140823559","https://openalex.org/W2161604954","https://openalex.org/W2536505949","https://openalex.org/W2540724732","https://openalex.org/W2566193534"],"related_works":["https://openalex.org/W2389966714","https://openalex.org/W1556690683","https://openalex.org/W2259932122","https://openalex.org/W3195391652","https://openalex.org/W2380848024","https://openalex.org/W4206406539","https://openalex.org/W3089993361","https://openalex.org/W4238695833","https://openalex.org/W2390727196","https://openalex.org/W66664637"],"abstract_inverted_index":{"A":[0],"comparison":[1],"between":[2],"two":[3],"established":[4],"MOSFET":[5],"mismatch":[6],"modeling":[7],"approaches,":[8],"one":[9,20],"based":[10,21],"upon":[11,22],"the":[12,23,31,44,49,59,69,78,82,91,102,109,114],"use":[13,24],"of":[14,25,68,90],"uncorrelated":[15,70],"random":[16,27,62,83],"physical":[17,71],"variables":[18,29,85],"and":[19],"correlated":[26,115],"model":[28,63,84,116],"where":[30],"correlation":[32,79],"is":[33,35,40,74],"ignored,":[34],"presented.":[36],"An":[37],"analytical":[38],"formulation":[39],"introduced":[41,111],"that":[42,55,76],"enables":[43],"designer":[45],"to":[46],"easily":[47],"predict":[48],"relative":[50],"errors":[51,110],"in":[52,81,88,101,106],"matching":[53],"performance":[54],"will":[56,86],"occur":[57],"if":[58],"more":[60],"popular":[61],"parameters":[64,117],"are":[65,118],"used":[66],"instead":[67],"parameters.":[72],"It":[73],"shown":[75],"neglecting":[77],"inherent":[80],"result":[87],"under-estimate":[89],"area":[92],"required":[93],"for":[94],"meeting":[95],"a":[96],"fixed":[97],"yield":[98],"target":[99],"but":[100],"example":[103],"process":[104],"considered":[105],"this":[107],"paper,":[108],"by":[112],"using":[113],"small.":[119]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}