{"id":"https://openalex.org/W2043769126","doi":"https://doi.org/10.1109/mwscas.2013.6674839","title":"SAT-based reversible gate/wire replacement fault testing","display_name":"SAT-based reversible gate/wire replacement fault testing","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W2043769126","doi":"https://doi.org/10.1109/mwscas.2013.6674839","mag":"2043769126"},"language":"en","primary_location":{"id":"doi:10.1109/mwscas.2013.6674839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082958373","display_name":"Sayeeda Sultana","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Sayeeda Sultana","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022513583","display_name":"Atena Roshan Fekr","orcid":"https://orcid.org/0000-0001-7658-520X"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Atena Roshan Fekr","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111982137","display_name":"Katarzyna Radecka","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Katarzyna Radecka","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McGill University, Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada","institution_ids":["https://openalex.org/I5023651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5082958373"],"corresponding_institution_ids":["https://openalex.org/I5023651"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.10918668,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"28","issue":null,"first_page":"1075","last_page":"1078"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/backtracking","display_name":"Backtracking","score":0.7493221759796143},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.598698079586029},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5119439363479614},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.5041583776473999},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.49773600697517395},{"id":"https://openalex.org/keywords/satisfiability","display_name":"Satisfiability","score":0.48072150349617004},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4803372621536255},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4780626595020294},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4676988124847412},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46191003918647766},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.45582354068756104},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.43278899788856506},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4274401366710663},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.408268004655838},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21176886558532715},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2104702591896057},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15073442459106445},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1021127998828888},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08074459433555603},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07498010993003845}],"concepts":[{"id":"https://openalex.org/C156884757","wikidata":"https://www.wikidata.org/wiki/Q798554","display_name":"Backtracking","level":2,"score":0.7493221759796143},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.598698079586029},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5119439363479614},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.5041583776473999},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.49773600697517395},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.48072150349617004},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4803372621536255},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4780626595020294},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4676988124847412},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46191003918647766},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45582354068756104},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.43278899788856506},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4274401366710663},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.408268004655838},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21176886558532715},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2104702591896057},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15073442459106445},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1021127998828888},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08074459433555603},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07498010993003845},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mwscas.2013.6674839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mwscas.2013.6674839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2063781796","https://openalex.org/W2106215532","https://openalex.org/W2109676928","https://openalex.org/W2114638353","https://openalex.org/W2124236732","https://openalex.org/W2137760991","https://openalex.org/W2145633150","https://openalex.org/W2160444875","https://openalex.org/W2162972716","https://openalex.org/W2163011756","https://openalex.org/W3147059544","https://openalex.org/W4237418815","https://openalex.org/W6677366832"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1558180718"],"abstract_inverted_index":{"Recently":[0],"reversible":[1,112],"circuit":[2],"testing":[3,37,68],"has":[4],"become":[5],"an":[6],"important":[7],"issue":[8],"for":[9],"researchers.":[10],"In":[11,32,80],"the":[12,84,111],"process":[13],"of":[14,30,86,120],"design,":[15],"synthesis":[16],"or":[17,27,62],"template":[18],"matching,":[19],"failures":[20],"can":[21,48,95,107],"happen":[22],"due":[23],"to":[24],"erroneous":[25],"replacements":[26],"incorrect":[28],"cascading":[29],"gates.":[31],"this":[33],"paper,":[34],"we":[35,65,82],"present":[36,83],"such":[38,98],"errors":[39,54],"modeled":[40],"as":[41],"gate":[42,57],"and":[43,58,76,118],"wire":[44],"replacement":[45],"faults,":[46],"which":[47],"also":[49],"handle":[50],"most":[51],"frequently":[52],"addressed":[53],"like":[55],"missing":[56],"control":[59],"points":[60],"appearance":[61],"disappearance.":[63],"Here,":[64],"propose":[66],"three":[67],"schemes":[69],"based":[70],"on":[71],"Boolean":[72],"Satisfiability":[73],"(SAT)":[74],"formulation":[75],"compare":[77],"their":[78],"efficiencies.":[79],"particular,":[81],"design":[85],"a":[87,103],"Reversible":[88],"Test":[89],"Miter,":[90],"which,":[91],"along":[92],"with":[93],"backtracking,":[94],"easily":[96],"detect":[97],"faults.":[99],"We":[100],"show":[101],"that":[102],"smaller":[104],"test":[105,113],"set":[106],"be":[108],"derived":[109],"from":[110],"miter,":[114],"increasing":[115],"fault":[116],"coverage":[117],"speed":[119],"testing.":[121]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}